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Tecnai g2 field emission transmission electron microscope

Manufactured by Thermo Fisher Scientific
Sourced in China, United States

The Tecnai G2 is a field emission transmission electron microscope (TEM) designed for high-resolution imaging and elemental analysis of materials at the atomic scale. It features a cold field emission gun, high-brightness electron source, and advanced electron optics to achieve resolutions down to 0.24 nm. The instrument is capable of performing imaging, diffraction, and spectroscopic techniques for comprehensive characterization of a wide range of samples.

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2 protocols using tecnai g2 field emission transmission electron microscope

1

Comprehensive Characterization of LDH Photocatalysts

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X-ray powder diffraction (XRD) patterns were recorded using a D8 ADVANCE X-ray diffractometer (Karlsruhe, Germany) with Cu Kα radiation (λ = 0.15406 nm). The scanning electron microscopy (SEM) images were recorded on a FEI-Sirion 200 F field emission scanning electron microscope (Hongkong, China). The transmission electron microscopy (TEM) images, high-resolution transmission electron microscopy (HRTEM) images, and the energy dispersive spectroscopy (EDS) spectra were taken with a FEI-Tecnai G2 field emission transmission electron microscope (Hongkong, China). The samples were obtained by peeling off LDH films from the substrate. Photocatalytic reactions were carried out using a 300 W Xe lamp as the light source and the light intensity in the visible region was about 85 mW·cm−2. The UV–Vis diffuse reflectance spectra were recorded by a UV–Vis spectrophotometer (UV-3900H, Hitachi, Tokyo, Japan). Fourier transform infrared (FTIR) spectra were recorded by a Thermo Nicolet 5700 (Waltham, MA, USA). The chemical state of LDHs was investigated by X-ray photoelectron spectroscopy (XPS) on a ESCALAB 250Xi photoelectron spectrometer (Waltham, MA, USA) with Al K (1486 Ev) as the excitation light source. The N2 adsorption/desorption tests were measured by Brunauer–Emmett–Teller (BET) measurements using a NOVA2200e surface area analyzer (Boynton Beach, FL, USA).
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2

Comprehensive Characterization of Carbon Spheres

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Transmission electron microscopy (TEM) measurements were carried out with a TECNAI G 2 field-emission transmission electron microscope (FEI Company, USA). X-ray photoelectron spectroscopy (XPS) measurements were carried with a PHI-5702 multifunctional spectrometer (Escalab 250Xi, ThermoFisher Scientific Company, USA).
The Fourier transform infrared (FT-IR) spectra of dried carbon spheres was obtained on a Model FTS-3000 spectrometer (Digilabgon, USA). The X-ray diffraction (XRD) patterns were obtained on a D8 advance X-ray diffractometer (Bruker, Germany). The ultraviolet-visible (UV-Vis) absorption spectra were gained on a UV-vis 3000 spectrometer (Shimadzu Company, Japan). The fluorescence spectra were recorded on a HORIBA Jobin Yvon FluoroMax-4 spectrofluorometer (HORIBA Instruments Inc Edison, NJ, USA). Both the silts of excitation and emission were fixed at 4 nm.
All pH measurements were made with a PHS-3C pH meter (Shanghai INESA & Scientific Instrument Co. Ltd, China).
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