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Ccd detector

Manufactured by Agilent Technologies

The CCD (Charge-Coupled Device) detector is a core component in various analytical instruments and imaging systems. It functions as a light-sensitive sensor, converting incoming photons into electrical signals. The CCD detector captures and records data, enabling precise measurements and high-resolution imaging across a wide range of applications.

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4 protocols using ccd detector

1

Single-crystal XRD analysis of compound 6

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Crystals of 6 suitable for the single-crystal X-ray diffraction study were grown from DCM/hexane. The X-ray intensity data were measured on an Agilent Supernova 4 circle diffractometer system equipped with a copper (CuKα) microsource and an Atlas CCD detector. The data were collected and integrated with CrysAlis171 software (version 1.171.38.43d). Data were corrected for absorption effects using the multi-scan method CrysAlis171 software (version 1.171.38.43d) Agilent Technologies, Oxfordshire, UK.
The sample’s low temperature was maintained by keeping it in the cold nitrogen stream, using Oxford Cryosystems cooling devices.
The structure was solved by direct methods using SXELXS [42 (link)] and refined by the full-matrix least squares procedure with SHELXL [40 (link)] within an OLEX2 [43 (link)] graphical interface. Figures were produced with Mercury_3.10 [44 (link)] software.
All H atoms were visible in the residual density map, but were added geometrically and refined mostly in riding approximation.
Detailed information about the data processing, structure solution, and refinement is presented in Table S1.
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2

Elemental Composition Analysis of Samples

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The elemental composition of the samples was analyzed by inductively coupled plasma (ICP) mass spectrometry for the determination of the metal contents and by combustion analysis (CHNS) for the sulfur content. For the ICP analysis the samples were dissolved in aqua regia in closed Ni-capsules to avoid extrusion of volatile Sn species. The capsules were heated in a microwave (CEM) at 180°C for 35 min. The ICP analysis was carried out using an ICP-OES spectrometer (Vista Pro) equipped with an axial plasma source, an Echelle-polychromator and a CCD detector (Agilent Technologies). For the analysis, the following emission lines were used: Cu 327.395 nm, Sn 283.998 nm and Zn: 206.200 nm. The analysis of the sulfur content was carried out using a Vario Micro Cube analyser (Elementar).
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3

Single Crystal X-ray Diffraction Protocol

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The X-ray intensity data were measured on an Agilent Supernova 4 circle diffractometer system equipped with a copper (CuKα) microsource and an Atlas CCD detector. The data were collected and integrated with CrysAlis171 software (version 1.171.38.43d). The data were corrected for absorption effects using the multi-scan method CrysAlis171 software (version 1.171.38.43d).
The low temperature of the sample was maintained by keeping it in a cold nitrogen stream, using Oxford Cryosystems cooling devices.
The structure was solved by direct methods using SXELXS [35 (link)] and refined by full-matrix least squares procedure with SHELXL [35 (link)] within an OLEX2 [36 (link)] graphical interface. Figures were produced with Mercury_3.10 [37 (link)] software.
All H atoms were visible in the residual density map, but were added geometrically and refined mostly in riding approximation.
Detailed information about the data processing, structure solution and refinement are presented in Table S1.
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4

X-ray Diffraction Analysis of Synthesized Compounds

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X-ray diffraction data for the synthesized compounds were collected on an Agilent Technologies SuperNova diffractometer with an Atlas CCD detector, using CuK radiation (λ = 1.54184 Å) from multilayer X-ray optics. The crystals were coated with a perfluoropolyether, picked up with a glass fiber, and mounted in the nitrogen cold gas stream of the diffractometer. The obtained data were processed with CrysAlisPro. [35] An absorption correction based on multiple-scanned reflections was carried out with ABSPACK in CrysAlisPro. The crystal structure was solved by direct methods using SHELXS-97 and refined with SHELXL-2013. [36] In case of Mn(hfa)2•TMEDA, two of the CF3 groups showed rotational disorder. Disordered parts were modeled with appropriate restraints and constraints on geometry and atomic displacement parameters (ADPs). Anisotropic ADPs were introduced for all non-hydrogen atoms. Hydrogen atoms were placed in geometrically calculated positions and refined with the appropriate riding model.
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