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Cypher afm instrument

Manufactured by Oxford Instruments
Sourced in United States

The Cypher AFM instrument is a high-resolution atomic force microscope designed for nanoscale imaging and characterization. It provides precise topographical and material property measurements with nanometer-scale resolution.

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4 protocols using cypher afm instrument

1

Characterizing Peptide-AuNP Complexes by AFM

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For AFM analyses, drops (20
μL) of the various peptide/AuNP samples were allowed to adsorb
at room temperature on freshly cleaved muscovite mica (Ted Pella,
Inc.). After 5 min, the mica surface was briefly washed with 100 μL
of ultrapure water, dried under a gentle nitrogen stream, and immediately
imaged. A Cypher AFM instrument (Asylum Research, Oxford
Instruments, Santa Barbara, CA) operating in tapping or AC mode and
equipped with a scanner at an XY scan range of 30/40 μm (closed/open
loop) was used. Silicon tetrahedral tips mounted on 30 μm long
rectangular cantilevers were purchased from Olympus (AT240TS; Oxford
Instruments). The probes had a nominal spring constant of 2 N/m and
a driving frequency of 70 kHz. A number of images covering 1–5
μm2 surfaces were scanned, and the lengths of particles
were measured using a freehand tool in the MFP-3DTM offline section
analysis software. The same tool was used to measure the cross sections
of particles.
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2

Atomic Force Microscopy Imaging of Nanoparticles

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AFM images were acquired using a Cypher AFM instrument (Asylum Research, Oxford Instruments, Santa Barbara, CA, USA) equipped with an XY scanner with a scan range of 30/40 μm (closed/open loop) and operating in AC-mode imaging in air. Aluminum reflex one-side coated silicon rectangular 30 μm long cantilevers, with tetrahedral tips, were purchased from Olympus (AC240TS, Oxford Instruments, Abingdon, UK). The probes had nominal driving frequency and spring constant values of 70 kHz and 2 N/m, respectively. Samples were prepared by dropping 10 μL of an aqueous dispersion of the NP on freshly-cleaved muscovite mica (Ted Pella, Inc., Redding, CA, USA). After 5 min of incubation, samples were washed with ultrapure Milli-Q water and dried under gentle N2 flow. Images were acquired at scale sizes of 2 and 1 μm2 and then analyzed by using a free tool in the Asylum Research offline section analysis software (version 16).
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3

Atomic Force Microscopy Imaging of Samples

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To perform AFM imaging, a drop of the sample was put on freshly cleaved muscovite mica (Ted Pella, Inc.; Redding, CA, USA) and incubated at room temperature for 5 min. After that, samples were washed with 1 mL of ultrapure water, dried under a gentle nitrogen stream and immediately imaged. A Cypher AFM instrument (Asylum Research, Oxford Instruments, Santa Barbara, CA, USA) operating in tapping AC-mode was used. Tetrahedral tips made of silicon and mounted on rectangular 30-μm long cantilevers were purchased from Olympus (AT240TS, Oxford Instruments, Abingdon, UK). The probes had nominal spring constants of 2 N/m and driving frequencies of 70 kHz. Images, with a surface from 1 μm2, were scanned and the sizes of particles were measured using a free tool in the Asylum Research offline section analysis software.
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4

Atomic Force Microscopy of Nanoparticle Aging

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Ten microliters of the 10–3 M solutions were put on freshly cleaved muscovite mica (Ted Pella, Inc.) and incubated at room temperature for 5 min. After that, the mica surface was washed with 1 mL of Millipore water, dried under a gentle nitrogen stream, and imaged. Scans were recorded using a Cypher AFM instrument (Asylum Research, Oxford Instruments, Santa Barbara, CA, United States), operating in tapping-mode and furnished with a scanner at an XY scan range of 30/40 μm (closed/open loop). Tetrahedral tips, made of silicon and mounted on rectangular 30 μm long cantilevers, were purchased from Olympus (AT240T S, Oxford Instruments). The probes had nominal spring constants of 2 N/m and driving frequencies of 70 kHz. Images with an area of 2 × 2 μm and 5 × 5 μm were scanned, and the sizes of particles were measured using a free tool in the MFP-3DTM offline section analysis software. AFM images were acquired at different aging time, namely 18, 42, 66, 120, and 240 h.
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