Xpert pro 3050 60
The Xpert-PRO 3050/60 is a high-performance X-ray diffraction (XRD) system designed for materials analysis. It provides accurate phase identification and quantification of crystalline materials. The system is equipped with advanced features for efficient data collection and analysis.
Lab products found in correlation
3 protocols using xpert pro 3050 60
Characterization of Nanoparticles: A Comprehensive Approach
Physicochemical Characterization of Nanoparticles
bio-distribution, safety, and efficacy. Characterization is performed using a
variety of analytical techniques, including Scanning Electron Microscopy (SEM
– JEOL JSM-7600F) for surface morphology and size of the nanoparticles.The
X-ray diffraction (XRD – D8 ADVANCE) measurement was performed on X-ray
diffractometer (Panalytical Xpert-PRO 3050/60) operated at 30 kV and 100 mA and
spectrum was recorded by CuKα radiation with wavelength of 1.5406 Å in
the 2θ range of 20°-80° andiron content determination was done
using Atomic Absorption Spectroscopy (AAS – PEAnalyst800) [6 (link)
Phytosynthesized Silver Nanoparticles Characterization
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