The morphologies of the samples were determined by using a Nova Nanosem 450 field emission scanning electron microscopy (FE-SEM) and a Tecnai F20 S-TWIN micro-scope transmission electron microscope operating at 200 kV (TEM). Powder X-ray diffraction patterns were measured on a Rigaku D/MAX-2400 diffractometer with Cu-Kα radiation. FT-IR spectra of the samples were characterized using the FT-IR method (NICOLET 6700, Thermo SCIENTIFIC). The XPS patterns were acquired by X-ray Photoelectron Spectrometer (ESCALAB™ 250Xi, Thermo Fisher). UV-Vis spectra were obtained from aqueous suspensions using an UV-Vis spectrophotometer (JASCO UV-550). Fluorescence decay traces of perovskite NCs were recorded in the Time Correlated Single Photon Counting (TCSPC) mode using the FLS920 Spectrofluorometer (Edinburgh Instruments, UK). The PL spectra of the perovskite NCs were obtained by using F-7000 Fluorescence Spectrophotometer (Hitachi, Japan). The optical properties of WLEDs were obtained using Keithley 2400 and KONICA MINOLTA CS200. The quantum yield (PLQYs) measurements were recorded using an integrating sphere, recorded on an Edinburgh Instruments FLS920 spectrophotometer. 1H NMR measurements were recorded on a Bruker Avance III 500 MHz spectrometer.
Minolta cs200
Manufactured by Konica Minolta
The MINOLTA CS200 is a high-performance spectrophotometer designed for accurate color measurement. It provides precise color data and analysis for various applications.
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Lab products found in correlation
Nicolet 6700, by Thermo Fisher Scientific (3 mentions)
Escalab 250xi, by Thermo Fisher Scientific (2 mentions)
Fls920 spectrofluorometer, by Edinburgh Instruments (1 mentions)
D max 2400, by Rigaku (1 mentions)
Fls920 spectrophotometer, by Edinburgh Instruments (1 mentions)
Uv 550, by Jasco (1 mentions)
Avance 3 500 mhz spectrometer, by Bruker (1 mentions)
F 7000 fluorescence spectrophotometer, by Hitachi (1 mentions)
Pma 11, by Hamamatsu Photonics (1 mentions)
2 protocols using minolta cs200
1
Comprehensive Characterization of Perovskite Nanocrystals
2
Efficiency Enhanced Solution-Processed OLED
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A solution processed OLED was fabricated with a structure of [ITO (130 nm)/PEDOT:PSS (40 nm)/3a (1 and 5 wt%) doped CBP (30 nm)/B4PYMPM (50 nm)/Liq (3 nm)/Al (100 nm)]. A 40 nm of PEDOT:PSS (CH8000) film as a hole injection layer (HIL) was spin-coated on an ITO substrate and annealed at 200°C in air. Then, a 30 nm of 1 or 5 wt% 3a -doped CBP film as an emitting layer (EML) was spin-coated from a THF solution (5 mg ml−1) and annealed at 60°C for 10 min B4PYMPM as an electron-transporting layer (ETL) and Liq/Al as a cathode were thermally evaporated under vacuum. The current density (J) – luminance (L) – voltage (V) characteristics of the OLEDs were measured by a Keithley source meter 2,400 and a Konica Minolta CS-200, respectively. Electroluminescence (EL) spectra were taken by an optical multichannel analyzer, Hamamatsu PMA 11. The angular dependence of luminous intensity was measured using a Keithley source measure unit 2,400 and a Minolta CS2000. External quantum efficiencies were calculated from the front luminance, current density and EL spectrum.
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