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27 protocols using lambda 900 spectrophotometer

1

Spectroelectrochemical Characterization of Spiro-OMeTAD

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Scanning electron microscopic images were recorded with a Hitachi S-4800 Instrument (Japan). UV-vis absorption spectra were recorded on a Perkin Elmer Lambda 900 spectrophotometer. For the spectroelectrochemical measurements, CHI660C electrochemical workstation was used to supply the potential bias, and the spectra were recorded on a Perkin Elmer Lambda 900 spectrophotometer. The measurements were conducted as follows: First, the ground state Spiro-OMeTAD film was taken as the background. Then, a small positive potential bias was applied to the film using chronoamperometry method to produce the oxidation state of Spiro-OMeTAD, and a spectrum was obtained after 1 min. The absorption change reflects the species change on the film after applying the potential bias.
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2

Spectrofluorimetric Analysis of Compounds 1-3

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Spectrofluorimetric-grade solvents
were used for the photophysical investigations. The buffer solution
(pH 7.4) was prepared by dissolving one phosphate buffer saline table
in 200 mL of water. Compounds 13 were dissolved in DMSO and then diluted to reach a final concentration
of 1 × 10–5 M in DMSO as well as DMSO/buffer
0.5% v/v. A PerkinElmer Lambda 900 spectrophotometer was employed
to obtain the UV–visible absorption spectra, using 10 mm path-length
quartz cuvettes.
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3

Comprehensive Analytical Characterization of Thin Films

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UV/Vis absorption spectra were obtained from reflectance and transmittance spectra, via A(λ)=1‐R(λ)‐T(λ). Reflectance and transmittance spectra of films were measured using a PerkinElmer LAMBDA 900 spectrophotometer. XRD measurements were carried out via a Siemens D5000 goniometer with CuKα radiation (λ=1.54051 Å). XPS was performed using PHI Quantum 2000 Scanning ESCA Microprobe spectrometer using AlKα (photon energy=1486.6 eV). The composition ratios were analyzed by Multipak software. The steady‐state PL spectra were recorded using a Fluorolog spectrophotometer (HORIBA JOBIN YNON) with an excitation at 365 nm. SEM measurements were performed using a LEO 1550 FEG instrument and a secondary electron detector operating at 3 kV (10 KV for mapping). The photoluminescence quantum yield (PLQY) was measured using FLS 1000 photoluminescence spectrometer from Edinburgh Instruments, attached with a barium sulfate‐coated integrating sphere.
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4

Comprehensive Material Characterization Protocol

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Powder X-Ray diffraction patterns were recorded using Bruker-AXS D5005 with Co- radiation.
N2-physisorption experiments were carried out at 77 K in a TriStar II unit gas adsorption analyser (Micromeritics). Prior to the measurements the samples were degassed at 423 K under vacuum for 16 h. The BET areas were calculated using intervals allowing positive BET constants38 . The total pore volumes were calculated at 0.9 relative pressure.
Scanning electron microscopy (SEM) was carried out using a JEOL JSM-6010LA InTouchScope microscope.
Thermogravimetric analysis was performed by means of Mettler Toledo TGA/SDTA851e, under an air flow of 60 ml min−1 at a heating rate of 10 K min−1 up to 1073 K.
Diffuse reflectance UV/Vis spectra were collected using a Perkin–Elmer Lambda 900 spectrophotometer equipped with an integrating sphere (“Labsphere”) in the 200–800 nm range. BaSO4 was used as a white standard.
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5

Surface Reflectance Measurement Protocol

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The optical reflection from a surface will change when the surface is irradiated with a high-intensity laser beam, and the surface reflectance at a given fluence is crucial for our study. Therefore, we also measure the surface reflectance at different fluences by using a hemiellipsoidal reflector to collect both the specular and diffuse light reflection20 . The studied sample is placed at the internal focal point of the reflector. The reflected light is collected at the external focal point of the reflector, and its energy ER is measured using a joulemeter. The sample is tilted at the same incidence angle as in our imaging setup with respect to the pump beam (36°). A second joulemeter is used to measure the incident pulse energy, EI. The reflectance R=ER/EI is obtained from the measured ER and EI. To calibrate our reflectance measurements, we compare the reflectance under low-intensity laser light (below the damage threshold) with that measured at 800 nm using a Perkin–Elmer Lambda 900 spectrophotometer with an integrating sphere.
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6

Comprehensive Characterization of Optical Materials

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X-ray diffraction (XRD) pattern of the samples were obtained on an X’Pert PRO X-ray diffractometer (PANalytical, Netherland) using Cu Kα (λ = 1.5418 Å) radiation, as shown in Fig. S1. A Lambda 900 spectrophotometer (PerkinElmer, USA) was employed to record the absorption spectra of the samples depicted in Fig. 2(d,e) and Fig. S2. The microstructures of the samples were analyzed by utilizing a high-resolution transmission electron microscope (HRTEM) 2100 F (JEOL, Japan), as illustrated in Figs S3 and S4. The optical loss of the GCs were measured by home-built optical setup with optical power meter PM320E (THORLABS, USA), as sketched in Fig. S5 and Table S1. The UC fluorescence spectra were recorded by a spectrometer HR4000 (Ocean Optics, USA).
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7

Irradiation of Cells with Hyperpolarized Polychromatic Light

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For the irradiation of cells, a Bioptron® 2 device (Bioptron AG, Wollerau, Switzerland) equipped with a nanophotonic fullerene filter was used. This filter, 2 mm thick, was made from polymethyl methacrylate (PMMA) glass with the addition of 0.3% fullerene [35 (link),36 ]. It allows the production of incoherent, out-of-phase unsynchronized hyperpolarized polychromatic light (HPL) ranging from 400 to 1100 nm. Additionally, the nanophotonic filter material emits low vibrato-rotation energy (0.07–0.20 eV) in the infrared part of spectra (from 5000 to 15,000 nm) with three characteristic peaks at 5811 nm, 8732 nm and 13,300 nm. The light source was adjusted at a distance of 10 cm from the cell dish to provide a uniform spot of 16 cm in diameter with a power intensity of 60 mW/cm2 as measured with a spectrophotometer (ILT-350, International Light Technologies, Peabody, MA, USA). The used doses of HPL were: 12 J/cm2, 36 J/cm2 or 72 J/cm2 (after 5, 15 or 30 min treatment).
In order to determine if irradiation with HPL leads to physical or chemical changes in 3HFWC, the compound was exposed to HPL for 5, 10 and 15 min, and absorption spectra in the UV–visible–infrared (UV–Vis–NIR) (200–900 nm) and Fourier transform infrared (FTIR) domains (2700–3300 nm) (Lambda 900 spectrophotometer, PerkinElmer, Waltham, Massachusetts, MA, USA) were determined.
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8

Isolation and Characterization of Hypocrellin Compounds

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Standards of hypocrellin A and hypocrellin B were purchased from Shanghai Tauto Biotech CO., Ltd. (http://www.tautobiotech.com) and used as received. Their purity is ≥ 98% (HPLC) and their structures are redrawn based on references (Wan and Chen 1981 ; Morakotkarn et al. 2008 (link)) and shown in Figure 1. The dry powder of ascostromata of S.bambusicola (HKAS102266) and “Zhuhongjun” (HKAS102270) was extracted followed the methods described by Stadler et al. (2001) and accurately weighed to 0.5 g and added to 25 ml of methanol and sonicated for 30 min. Semi-preparative HPLC was performed on an Agilent 1260 apparatus equipped with a UV detector and a CAPCELL PAK C18 (Agilent, 4.6 mm × 25 cm, 5 µm) column, with 38% solvent A: H2O + 0.5% formic acid; 62% solvent B: acetonitrile, isocratic elution, UV/Vis the detection in the range of 265 nm (Table 3). The UV-Vis spectra were recorded at room temperature on a Perkin-Elmer Lambda 900 spectrophotometer (Fig. 5).
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9

Spectroscopic Analysis of Arundo donax Leaf

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The total and diffused reflectance, total transmittance, and absorbance of light on the adaxial and abaxial surfaces of a green mature A. donax leaf were measured using a Perkin-Elmer Lambda 900 spectrophotometer in combination with a 150 mm integrating sphere. Details of the experimental setup employed in the experiments were described in detail elsewhere (Rodríguez et al., 2021 (link)). Angle resolved measurements were also performed. To measure angle-dependent absorption, the leaf was mounted on a rotating stage and placed at the center of the integrating sphere. The total light inside the integrating sphere is a contribution from both reflectance and transmittance (R+T). In this way, the total absorbance is calculated as 100-(R+T) in %.
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10

Quantifying Leaf Chlorophyll Content

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For each leaf, Chl was extracted from the approximate location of leaf disc used for reflectance measurements. The disc was cut into small pieces and ground in the dark with a mortar and pestle in 95% (v/v) ethanol until the pulp turned white in colour and all pigments were extracted. Thereafter, the leaf pigment mixture was moved to a 50ml volumetric flask with 95% ethanol and one part of the mixture was centrifuged in plastic tubes with a rotational speed of 3200 r/min for 10min. The supernatant was decanted from the tubes and its absorbance immediately measured with a Lambda 900 spectrophotometer (Perkin-Elmer, Waltham, MA, USA). Chl content (μg/cm2) was calculated according to Wintermans and De Mots (1965) .
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