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23 protocols using jsm 6480

1

Characterization of As-Prepared Products

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The crystal
structures of the as-prepared products were determined by X-ray diffraction
(XRD, XRD-6000) using the Cu Ka radiation (0.15406 nm). The microstructures
and morphologies of the products were characterized using scanning
electron microscopy (SEM, JEOL, JSM 6480) and transmission electron
microscopy (TEM, Philips Tecnai 12) with energy-dispersive X-ray analysis
(EDX). The Raman spectra of the as-prepared products were obtained
by a Renishaw Raman spectrometer.
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2

Optical and Electron Microscopy of Microelectrodes

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Optical imaging of the microelectrodes was performed in BX51M microscope (Olympus, Center Valley, PA, USA). Scanning electron microscope (SEM) imaging and EDS analysis of the printed devices and the electrolessly deposited Pt. were performed using JSM 6480 (JEOL, Peabody, MA, USA).
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3

Microstructural Analysis of Al and Mg Alloys

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The joint appearances were captured by a Nikon D7200 digital camera (Bangkok, Thailand). The cross-sectional samples were cut into proper sizes by an electro-discharge machine and mechanically polished to mirror-like surfaces. The etching solutions were 20 g of NaOH with 100 mL of distilled water for Al alloy and 4% HNO3 ethanol for Mg alloy. The macroscopic morphologies were observed by the optical microscopy (OM, DSX-510, Olympus, Tokyo, Japan). The microstructures and chemical compositions were investigated via scanning electron microscopy (SEM, JSM 6480, JEOL, Tokyo, Japan) and energy dispersive X-ray spectrometer (EDS, Oxford Instruments, Abingdon, UK) in the secondary electron mode.
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4

Characterization of Polymer and Carbon Fiber Composites

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The proton NMR spectra were measured at 400 MHz on an NMR spectrometer equipped with Bruker Top Spin 3.2 software (AscendTM 400, Bruker, Madison, WI, USA) using DMSO-d6 as a solvent at room temperature. FTIR spectra in the range from 600 to 4000 cm−1 were measured on a Fourier transform infrared spectrophotometer (IRAffinity-1S, SHIMADZU, Kyoto, Japan), by placing samples on the surface of a ZnSe crystal using the attenuated total reflectance method. Surface profiles were measured by laser confocal microscopy (VK-9710K, Keyence, Osaka, Japan). The surfaces of the fractured samples were observed by scanning electron microscopy (SEM; JSM-6480, JEOL Ltd., Tokyo, Japan). Thermal stability of polymers, TH-treated CFs, and CF-reinforced composites were evaluated under N2 atmosphere by elevating the temperature from 23 to 400 °C at the rate of 10 °C/min using a differential thermal thermogravimetry analyzer (DTG-60H, Shimadzu, Japan). The molecular weight was obtained on an ACQUITY APC (Waters Corporation, Milford, MA, USA) equipped with a column (ACQUITY APC XT 2002.5 µm) by flowing a THF solution of a sample at the rate of 0.7 mL/min. After calibrating the column set using polystyrenes with molecular weights ranging from 1220 to 264,000 g/mol, the molecular weight of the sample was measured.
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5

Comprehensive Characterization of AgNPs

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The AgNPs were characterized through UV-Visible spectroscopy, X-ray diffraction (XRD), and scanning electron microscopy (SEM) as described by Zhang et al. [12 (link)]. For UV-Vis spectroscopy, AgNP concentration (5 mg/20 ml) was prepared by diluting nanoparticles in deionized water and their absorbance was measured in a wavelength range 300-700 nm to find the wavelength for maximum absorbance. The crystalline size of the AgNPs was measured with an analytical X'Pert, X-ray diffractometer using CuKα1 radiations (λ = 1.540598 Å), at 40 kV and 30 mA. The 2θ range was acquired from 30° to 80°, and JCPDS Cards were used as standards to find the respective phases of the particles. The crystallite size was calculated by using the Debye-Scherrer equation. For SEM images, dried particles were mounted on an aluminum stub and coated with gold to get better contrast. SEM analysis was performed with a scanning electron microscope (JEOL JSM-6480).
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6

Nanoscale Compositional Analysis of Ti-Al-N

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Al/(Ti + Al) ratios were determined by energy dispersive X-ray spectroscopy (EDX) in a JEOL JSM-6480 scanning electron microscope with an EDAX Genesis 2000 detection system at 10 kV acceleration voltage.
Three dimensional compositional distributions on the nanometer scale were studied by atom probe tomography (APT) in a CAMECA LEAP 4000X HR. Laser-assisted field evaporation of Ti0.38Al0.62N was carried out with a laser energy of 30 pJ and a pulse frequency of 250 kHz. The tip temperature was kept at 60 K. APT specimens were prepared by focused ion beam (FIB) using a FEI HELIOS Nanolab 660 dual-beam microscope employing a standard lift-out procedure30 (link).
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7

Visualizing Carbonized Samples Using SEM

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The JEOL JSM-6480 scanning electron microscope made it possible to visualize the surface of the samples after the carbonization process. The operating parameters of the microscope were as follows:

Accelerating voltage: 20 kV;

Working distance: 10 mm;

Mode: SEI;

Magnification: 50×, 200×, 2000×.

SEM micrographs then enabled the determination of the morphology as well as the pore size distribution of the sample surface.
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8

SEM Sample Preparation Technique

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For SEM, the steel plates were briefly rinsed with 0.1 M Hepes buffer (Sigma-Aldrich) at pH 7.2, then fixed in 2.5% glutaraldehyde (Chemi-Teknik AS), 2% paraformaldehyde (VWR, Part of Avantor) and 0.075% Ruthenium Red (Sigma-Aldrich) in 0.1 M Hepes buffer for 4 h at room temperature. Afterwards, the specimens were rinsed in 0.1 M Hepes buffer and then dehydrated through a graded series of ethanol (Antibac AS), (10%, 25%, 50%, 70%), and 90%] for 7 min each and then 3 times in 100% ethanol for 10 min each. After dehydration, the specimens were dried using a chemical hexamethyldisilazane (HMDS) (Sigma-Aldrich), first exchange with 50% solution of HMDS diluted with 100% ethanol for 20 min, then three exchanges with 100% HMDS for 20 min each. Finally, HMDS were removed and the specimens were allowed to air-dry in a fume hood overnight. Dried samples were mounted on stubs using double-sided conductive adhesive carbon tape (both from Chemi-Teknik AS). Specimens were then coated with a 30-nm-thick layer of gold/palladium (Au/Pd) using a sputter coater (polaron) (2.5 kV, 20 mA, 3 min). Specimens were examined with a JSM 6480 (JEOL) scanning electron microscope with digital imaging capabilities. The secondary electron images were collected at an acceleration voltage of 20 kV and digitalized as TIFF computer files.
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9

SEM Imaging of Lyophilized Plant Tissues

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Scanning electron microscope (SEM) imaging of the µMMN array was performed using JSM 6480 (JEOL, Peabody, MA, USA). For plant tissue imaging, lyophilization of the samples was performed. To obtain a slow freezing rate, the stems were frozen at −12 °C for 24 hours. To prevent the samples from being disturbed when vacuum was introduced, the stems were placed in a freeze-drying container and covered with a polystyrene petri-dish with drilled holes to allow vapor to escape. The container was subsequently connected to a sample valve on the drying chamber of a 1 liter benchtop freeze-dry system (FreeZone, Labconco, Kansas City, Missouri). The samples were dried for 12 hours at a vacuum level of 0.033 mbar with a collector temperature of −40 °C. After 12 hours, the dried samples were removed and ready to be imaged.
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10

Characterization of Ceria Nanoparticles

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The characterization of CeO2 NPs provides a complete assessment of the morphology, crystalline size, stability, and most importantly functional groups liable to the bioreduction of the synthesized nanoparticles. The CeO2 NP, CS-CeO2 nanocomposite morphology was observed by SEM (JEOL, JSM-6480, Tokyo, Japan). The X-ray diffraction of CeO2 NPs was performed on PANalyticalX’Pert-PRO and interpreted using a matching software. A UV-visible spectrophotometer (Shimadzu, UV-2450, Tokyo, Japan) was utilized to acquire the absorption spectra of CeO2 NPs. CeO2 nanoparticles were also evaluated for the existence of biomolecules by Fourier transform infrared spectroscopy (FTIR, Thermo Fischer Scientific, Waltham, MA, USA).
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