Powders prepared by rapid addition of NaOH were characterized by Transmission Electron Microscopy (TEM). Sample preparation was done by dispersing 4 mg of the ZnO nanoparticles into 4 mL of methanol and ultrasonicating for five minutes. Immediately after ultrasonication, one drop of the ZnO nanoparticle suspension was placed on an ultrathin holey carbon grid (Ted Pella, product # 01824). Analysis of the ZnO nanoparticles was carried out using a Zeiss Libra 200 transmission electron microscope, and micrographs were acquired using a Gatan Orius CCD digital camera. Analytical TEM (ATEM) was employed by running scanning transmission electron microscopy (STEM) and performing X-ray energy dispersive spectroscopy (XEDS) to confirm the elemental composition of the nanoparticles. STEM images were acquired with a high angle annular dark field detector (HAADF). The Zeiss Libra 200 is equipped with a Noran XEDS system, with a Li drifted Si detector. All image acquisitions and XEDS measurements were carried out with an acceleration voltage of 200 kV and an emission current of 304 μA. XEDS measurements were made with a beam spot size of 20 nm. Average particle sizes and standard deviations were determined from measurements of 50–60 particles for each material.
Libra 200
Manufactured by Zeiss
Sourced in Germany
The Libra 200 is a transmission electron microscope (TEM) designed and produced by Zeiss. It is a versatile instrument capable of high-resolution imaging and analysis of a wide range of materials at the nanoscale level. The Libra 200 provides stable and reliable performance for research and industrial applications.
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Lab products found in correlation
Ultra 55, by Zeiss (3 mentions)
1500stes gemini sem, by Zeiss (2 mentions)
Escalab 250xi, by Thermo Fisher Scientific (2 mentions)
Cary 100 uv vis spectrophotometer, by Agilent Technologies (2 mentions)
Alpha300m, by WITec (1 mentions)
Axis ultra dld, by Shimadzu (1 mentions)
Sta 449c, by Netzsch (1 mentions)
Uv 3150, by Shimadzu (1 mentions)
90 plus, by Brookhaven Instruments (1 mentions)
Tcs sp8, by Leica (1 mentions)
X pert pro, by Malvern Panalytical (1 mentions)
Dm2000, by Leica (1 mentions)
Laser doppler velocimetry, by Malvern Panalytical (1 mentions)
Spm 9700, by Shimadzu (1 mentions)
Jsm 7500f, by JEOL (1 mentions)
Citric acid, by Merck Group (1 mentions)
Ethylenediamine, by Merck Group (1 mentions)
Polyethylenimine (pei), by Merck Group (1 mentions)
Solidspec 3700, by Shimadzu (1 mentions)
Spm 9700 instrument, by Shimadzu (1 mentions)
29 protocols using libra 200
1
Characterization of ZnO Nanoparticles by TEM
2
Comprehensive Characterization of Composite Materials
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The structure and morphology were investigated by field-emission scanning electron microscopy (FE-SEM, INSPECT F50) and transmission electron microscopy (TEM, ZEISS Libra 200). Powder X-ray diffraction (XRD) measurements were conducted to determine the phase of the as-synthesized composites with Cu Kα radiation operated at 40 kV and 30 mA. X-ray photoelectron spectroscopy (XPS) analysis was performed on a Kratos AXIS Ultra DLD instrument using monochromated Al Kα X-rays as the excitation source. Raman spectra were collected using a Witec alpha 300M+ instrument with an excitation laser wavelength of 488 nm. Nitrogen adsorption–desorption isotherm measurements were conducted at 77 K using a micromeritics system (JW-BK132F). The contents of amorphous carbon, rGO and sulfur in the samples were analyzed by thermogravimetric (TGA) on a Netzsch STA 449C analyzer in air for the amorphous carbon and rGO or in N2 atmosphere for the sulfur at a temperature ramp rate of 10 °C·min−1.
3
Characterization of Microcapsules and Microreactors
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The morphology of the prepared microcapsules was observed by an optical microscope (DM 2000, Leica, Bonn, Germany), scanning electron microscope (SEM, Ultra 55, Zeiss, Berlin, German), and transmission electron microscope (TEM, Libra 200, Zeiss, Berlin, Germany). The microreactors were also characterized by Fourier transform infrared (FT-IR) spectroscopy using a Spectrum One (American PE, Cincinnati, OH, USA) spectrometer. The UV-Vis absorption spectra were recorded on an ultraviolet solid diffuse reflectometer (UV-DRS, UV-3150, Shimadzu, Kyoto, Japan). The particle size distribution of the tourmaline particles was characterized by a particle size analyzer (Plus 90, Brookhaven, Holtsville, NY, USA). The mineral phase of tourmaline was characterized by an X-ray diffractometer (X’pert Pro, PANalytical, Eindhoven, The Netherlands). Confocal laser scanning microscopy (CLSM) images of the distributions of FITC-labeled ADH within the microcapsules were obtained on an inverted CLSM (TCS SP8, Leica, Mannheim, Germany).
4
Characterization of tFNAs and TACs
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Dynamic light scattering and laser Doppler velocimetry were used to determine the average size and zeta potential of the tFNAs and TACs (Malvern Instruments, England). Four ssDNA and tFNAs samples were examined at a ratio of 5:1 in a 6× buffer solution, and 8% polyacrylamide gel electrophoresis (PAGE) was conducted using vertical electrophoresis at 60 V for 120 min. Special double-sided adhesive with clean samples (tFNAs and TACs) was pasted to an atomic force microscope (AFM, SPM-9700, Shimadzu, Kyoto, Japan) to scan and obtain images. Samples were also analyzed using transmission electron microscopy (TEM, Libra200, Zeiss, Germany).
5
Structural Characterization of Prepared Samples
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The crystal structure of the as-prepared samples was examined using X-ray diffraction (XRD, DX-2700, Cu Kα radiation, λ = 1.542 Å). The morphologies and the structural characterization of the products were observed using field emission scanning electron microscopy (FESEM, JEOL, JSM-7500F) and transmission electron microscopy (TEM, Zeiss, Libra200). N2 adsorption–desorption measurements were carried out using a NOVA1000e analyzer at 77 K. The pore size distributions of the samples were analyzed using the Barrett Joyner Halenda (BJH) method.
6
Citric acid-based carbon dots synthesis
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Citric acid was used as a carbon sources for carbon dots preparation using hydro-thermal method28 (link) (Fig. 1 ). Citric acid (1.0507 g, Sigma Aldrich) and ethylenediamine (335 μL, Sigma Aldrich) was dissolved in DI-water (10 mL). Then the solution was transferred to a flask (50 mL) and heated at 200 °C overnight. After the reaction, the reactors were cooled to room temperature naturally. The production yield was ca. 50%. 1 mL of 10% polyacrylic acid (PAA, Sigma Aldrich) and polyethylenimine (PEI, Sigma Aldrich) solution were added into the CDs solution respectively and heated at 80 °C for 4 hour to obtain CD-PAA and CD-PEI. All the products were subjected to dialysis in a dialysis bag and dried by a vacuum freeze dryer.
The fluorescence performances of all three CDs were measured by fluorescence spectrometer (Eclipse 80i). The particle size, zeta potential, and structure of carbon dots nanoparticles were characterized by a dynamic light scattering (DLS, Zetasizer Nano ZS90) and a high resolution Transmission Electron Microscopy (HRTEM, Zeiss Libra 200). The chemical groups on the surface of each CDs were characterized by an infrared Spectroscopy (IR, PE Spectrum 100).
The fluorescence performances of all three CDs were measured by fluorescence spectrometer (Eclipse 80i). The particle size, zeta potential, and structure of carbon dots nanoparticles were characterized by a dynamic light scattering (DLS, Zetasizer Nano ZS90) and a high resolution Transmission Electron Microscopy (HRTEM, Zeiss Libra 200). The chemical groups on the surface of each CDs were characterized by an infrared Spectroscopy (IR, PE Spectrum 100).
7
Characterization of MoS2@TiO2 Nanocomposite
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The morphology of
MoS2@TiO2 was investigated by scanning electron
microscopy (SEM, Carl Zeiss, Ultra 55) and transmission electron microscopy
(TEM, Carl Zeiss, Libra 200). The elemental mapping was recorded on
a TEM equipped with an energy dispersive spectrometer. Powder X-ray
diffraction (XRD) patterns were performed on a Cu Kα radiation
PAN analytical X-ray diffractometer. A laser Raman spectrometer (inVia)
was used to analyze the samples by Raman spectroscopy. X-ray photoelectron
spectroscopy (XPS, Thermo Fisher Scientific) was used to analyze the
elemental composition and valence of the materials. The light absorption
characteristics of the samples were carried out on a solid ultraviolet
absorption spectrometer (UV–vis, Shimadzu Enterprise Management
(China) Co., Ltd.) with the equipment model Solidspec-3700. UV–vis
absorbance spectra were detected on a UV2600 UV–vis spectrophotometer
(Unico Instruments Co., Ltd.). The Mott–Schottky curve (Mott–Schottky)
and AC impedance (EIS) of the cell with the as-prepared sample as
an electrolyte are examined on an electrochemical analyzer of CHI
instruments (Shanghai Chenhua Instrument Company, CHI660C) and the
details are shown in theSupporting information .
MoS2@TiO2 was investigated by scanning electron
microscopy (SEM, Carl Zeiss, Ultra 55) and transmission electron microscopy
(TEM, Carl Zeiss, Libra 200). The elemental mapping was recorded on
a TEM equipped with an energy dispersive spectrometer. Powder X-ray
diffraction (XRD) patterns were performed on a Cu Kα radiation
PAN analytical X-ray diffractometer. A laser Raman spectrometer (inVia)
was used to analyze the samples by Raman spectroscopy. X-ray photoelectron
spectroscopy (XPS, Thermo Fisher Scientific) was used to analyze the
elemental composition and valence of the materials. The light absorption
characteristics of the samples were carried out on a solid ultraviolet
absorption spectrometer (UV–vis, Shimadzu Enterprise Management
(China) Co., Ltd.) with the equipment model Solidspec-3700. UV–vis
absorbance spectra were detected on a UV2600 UV–vis spectrophotometer
(Unico Instruments Co., Ltd.). The Mott–Schottky curve (Mott–Schottky)
and AC impedance (EIS) of the cell with the as-prepared sample as
an electrolyte are examined on an electrochemical analyzer of CHI
instruments (Shanghai Chenhua Instrument Company, CHI660C) and the
details are shown in the
8
Characterizing Therapeutic Nucleic Acid Nanoparticles
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For verification of tFNAs, 8% polyacrylamide gel electrophoresis (PAGE) was used to measure the molecular weights of four ssDNAs and tFNAs, Transmission electron microscopy (TEM, Libra200, Zeiss, German) and Atomic force microscopy (AFM, SPM-9700 instrument, Shimadzu, Kyoto, Japan) was performed for morphological structural observation of tFNAs and tFNAs-Ery. The hydrodynamic sizes and zeta potentials of tFNAs, erythromycin and tFNAs-Ery were measured using a Zeta sizer Nano-ZS (Malvern Instruments, England).
9
Titanium Alloy Characterization Methods
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The FTIR measurements were carried out with ALPHA's Platinum ATR from Bruker. The samples were measured in solid state, without previous preparation. Parameters were: 32 scans, 4 cm−1 resolution; wavelength range 4000–400 cm−1.
SEM measurements for topological characterization were performed with a Carl Zeiss 1500STES Gemini SEM. All titanium alloy samples with and without immobilized DND were first sputtered with carbon before observation under microscope.
For STEM investigation a Carl Zeiss LIBRA® 200 was used. Focused ion beam lamella was cut every time to observe the layer structure of the titanium alloy. Sample preparation includes carbon coating followed by platinum deposition for sample protection.
SEM measurements for topological characterization were performed with a Carl Zeiss 1500STES Gemini SEM. All titanium alloy samples with and without immobilized DND were first sputtered with carbon before observation under microscope.
For STEM investigation a Carl Zeiss LIBRA® 200 was used. Focused ion beam lamella was cut every time to observe the layer structure of the titanium alloy. Sample preparation includes carbon coating followed by platinum deposition for sample protection.
10
Electrical and Microscopic Characterization
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Transistor characteristics are measured by using two Keithley 236 together with a Keithley 2400 SMU in a glovebox. For the impedance spectroscopy, an HP 4284 A LCR-Meter is used. For all the electrical characterizations, the measurement software SweepMe! (sweep-me.net) is used. The optical image is taken by optical microscopy. The scanning electron microscope (SEM) images are captured using a Zeiss Gemini SEM 500. TEM measurements are carried out with a Libra200 (Carl Zeiss Microscopy GmbH, Germany) operated at an acceleration voltage of 200 kV. The lamella for TEM is prepared by lift-out focused ion beam (FIB) technique in NEON40 FIB/SEM (Carl Zeiss Microscopy GmbH, Germany).
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