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Ultima 4 x ray diffraction

Manufactured by Rigaku
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Sourced in Japan

The Ultima IV X-ray diffraction system is a versatile analytical instrument designed for materials characterization. It utilizes X-ray diffraction techniques to provide structural and compositional information about a wide range of solid materials. The Ultima IV is capable of performing various X-ray diffraction measurements, including phase identification, lattice parameter determination, and texture analysis.

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Lab products found in correlation

Jsm 7600f, by JEOL (1 mentions) Quanta 650, by Thermo Fisher Scientific (1 mentions) Nicolet 10, by Thermo Fisher Scientific (1 mentions) K alpha x ray photoelectron spectrometer, by Thermo Fisher Scientific (1 mentions)

Close spelling variants of this product

Ultima IV X-ray diffraction meter Ultima IV multipurpose X-ray diffraction system Ultima IV X-ray diffraction system X-ray diffraction Ultima IV X Ultima IV

3 protocols using ultima 4 x ray diffraction

1

Structural Characterization of Materials

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Scanning electron microscopy (SEM), X-ray diffraction (XRD), and Fourier-transform infrared (FTIR) spectroscopy were used to examine the morphology, crystal phase, and nature of the surface molecular groups of the materials, respectively. X-ray diffraction (XRD, Rigaku – Ultima IV X-ray diffraction, scan speed 4.00=min, scan range 3–90) was used to investigate crystallinity and was performed using monochromatic Cu K radiation and a positional sensitive detector. FTIR spectra were recorded using KBr transparent discs at 64 scans between 4000 and 400 cm−1 with a resolution of 4 cm−1. The 105 N vacuumed-dried samples were pressed into a transparent disk with a diameter of 14 mm by applying force. The absorbance of KBr-sample discs was measured.
Pete K.Y., Kabuba J., Otieno B, & Ochieng A. (2023). Modeling adsorption and photocatalytic treatment of recalcitrant contaminant on multi-walled carbon/TiO2 nanocomposite. Environmental Science and Pollution Research International, 30(41), 94154-94165.
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2

Characterization of GO/g-C3N4/ZnO Composite

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The GO/g-C3N4/ZnO structure was examined using a Rigaku Ultima IV X-ray diffraction
(XRD). Versa PobeII X-ray photoelectron spectroscopy (XPS) was used
to investigate the surface characteristics and chemical composition.
Surface morphology was examined using a scanning electron microscope
(JEOL, JSM7600-F). The absorption spectra for the degradation of methylene
blue (MB) were obtained through a spectrophotometer (DR 6000, Hach
Lang).
Shakoor M.H., Shakoor M.B., Jilani A., Ahmed T., Rizwan M., Dustgeer M.R., Iqbal J., Zahid M, & Yong J.W. (2024). Enhancing the Photocatalytic Degradation of Methylene Blue with Graphene Oxide-Encapsulated g-C3N4/ZnO Ternary Composites. ACS Omega, 9(14), 16187-16195.
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3

Comprehensive Physicochemical Characterization of Composites

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The crystal phase of composites was studied by Rigaku Ultima IV X-ray diffraction (Rigaku, Japan). The surface morphologies were characterized by scanning electron microscope (FEI Quanta 650, Netherlands). Fourier transform infrared spectroscopy (FTIR, 4000–600 cm−1) was recorded on Thermo Scientific Nicolet 10 (Thermo, USA) using ATR model. X-ray photoelectron spectroscopy (XPS) was performed with a Thermo Scientific K-Alpha X-ray photoelectron spectrometer (Thermo, USA) using mono AlKa radiation (hv=1486.6 eV) to investigate elemental compositions of composites. Thermogravimetric analysis (TGA) was carried out for composites under nitrogen atmosphere by using a Discovery TGA 5500 instruments (TA, USA) with a heating rate of 5.0 °C min−1 from 30 °C to 790 °C. SHA-B constant temperature water bath oscillator (Suzhou NINENBO Technology Co., Ltd.). DZF-6032 vacuum drying ovens (Shanghai yiheng scientific instrument co., Ltd.). MC-3020 laser engraving machine was used for cutting filter paper (Shandong mingchuang laser equipment co., Ltd.).
Song J., He K., Xing B., Pei Y., Wang D., Wang Y., Li S., Li J., Huan W., Zhang Y, & Hammock B.D. (2022). Rapid measurement of residual kanamycin using highly specific biomimetic recognition paper-based chip. Analytical chemistry, 94(50), 17567-17576.
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