All samples were measured as prepared using Raman spectroscopy acquired from Renishaw inVia Raman Microscope in a backscattering configuration. All measurements were performed with samples placed inside a Linkam THMS600 stage under continuous nitrogen purging. The calibration of the filter and grating were performed using a Si reference peak at 520 cm−1. A HeNe laser was used to produce the excitation source at 633 nm and 10% of 12 mW laser intensity under 50x magnification. The Raster 2D mapping was measured at each 10 μm step within filled square area of 40 and 60 μm across both axis.
Thms600 stage
Manufactured by Linkam
The THMS600 stage is a laboratory equipment designed for temperature control and measurement. It is capable of maintaining sample temperatures between -196°C and 600°C. The stage allows for precise temperature regulation and monitoring, making it suitable for various applications that require controlled thermal environments.
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Lab products found in correlation
4 protocols using thms600 stage
1
Raman Spectroscopy Mapping Characterization
2
High-Temperature Raman Spectroscopy Protocol
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Micro Raman spectroscopy was performed
using a HORIBA LabRAM HR Raman microscope. Spectra were acquired using
a 660 nm laser (at ∼0.1 mW (1%) power), a 100× objective
and a 200 μm confocal pinhole. To simultaneously scan a range
of Raman shifts, a 600 lines mm–1 rotatable diffraction
grating along a path length of 800 mm was employed. Spectra were detected
using a Synapse CCD detector (1024 pixels) thermoelectrically cooled
to −60 °C. Before spectra collection, the instrument was
calibrated using the zero-order line and a standard Si(100) reference
band at 520.7 cm–1. The spectral resolution is better
than 1.2 cm–1 in this configuration.
Variable-temperature
measurements were performed within a Linkam THMS600 stage. A typical
experiment was as follows: the spectrum was collected at 25 °C,
the temperature was then increased at a rate of 20 °C/min to
50 °C and held for 2.5 min for equilibration, the sample surface
was found by manual refocusing (xy) and depth profiling
(z), and then a further spectrum was collected. This
procedure was repeated in 25 °C steps up to 500 °C.
using a HORIBA LabRAM HR Raman microscope. Spectra were acquired using
a 660 nm laser (at ∼0.1 mW (1%) power), a 100× objective
and a 200 μm confocal pinhole. To simultaneously scan a range
of Raman shifts, a 600 lines mm–1 rotatable diffraction
grating along a path length of 800 mm was employed. Spectra were detected
using a Synapse CCD detector (1024 pixels) thermoelectrically cooled
to −60 °C. Before spectra collection, the instrument was
calibrated using the zero-order line and a standard Si(100) reference
band at 520.7 cm–1. The spectral resolution is better
than 1.2 cm–1 in this configuration.
Variable-temperature
measurements were performed within a Linkam THMS600 stage. A typical
experiment was as follows: the spectrum was collected at 25 °C,
the temperature was then increased at a rate of 20 °C/min to
50 °C and held for 2.5 min for equilibration, the sample surface
was found by manual refocusing (xy) and depth profiling
(z), and then a further spectrum was collected. This
procedure was repeated in 25 °C steps up to 500 °C.
3
Temperature-dependent Raman Spectra of HOTP Crystals
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Temperature-dependent Raman spectra were collected on in-plane (incident laser orthogonal to the c axis)–oriented and out-of-plane (incident laser parallel to the c axis)–oriented La1.5HOTP and Nd1.5HOTP single crystals using a Renishaw Invia Raman microscope equipped with a charge-coupled detector capable of measurements up to 1-cm−1 resolution. In these measurements, the crystals were mounted onto Si/SiO2 (300 nm) substrates with fiduciary markers. A 532-nm laser was employed as the illumination source with a nominal power of 0.22 mW and 10 s of exposure time. The sample temperature was controlled using a Linkam THMS600 stage purged with pure Ar gas. Raw intensities were normalized, and pertinent sections of the Raman spectra were fit with a cubic spline background and Lorentzian peaks with MagicPlotPro 2.9 software. To compare temperature-dependent behavior of specific vibrational modes, the peak amplitude was used as a measure of intensity and the peak center as a measure of position. The out-of-plane (c-axis) crystal orientation was identified from large flat crystal facets, while the in-plane crystal (ab-plane) crystal orientation was identified from domains of hexagonal platelets.
4
Raman Spectroscopy Thermal Mapping Protocol
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Raman spectroscopy was carried out using a Horiba LabRam instrument with a 532-nm laser and 100× long working distance objective with numerical aperture of 0.6 and gratings of 1800 gr/mm. Step sizes in the Raman maps were 0.25 μm, and the acquisition time of device thermal map was ~20 min. The laser spot radius is ~0.3 μm, and with 4-s acquisition time at each point with 5% laser power, the incident laser power is 150 μW (<10-μW absorbed power) to avoid laser heating in excess of the electrical heating. Temperature calibration was done with a Linkam THMS600 stage, following the procedure outlined elsewhere (33 (link)).
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