Digital images were acquired with TIA software (TEM Imaging & Analysis, version 4.7 SP3; FEI). Alternatively, sets of serial digital images with 10% overlap (at an original magnification of ×30,000) were acquired with the automated EM data acquisition software package SerialEM133 (link) (
Ultra 45
The Ultra 45° is a high-performance electron microscope designed for advanced imaging and analysis. It features a 45-degree inclined optical column that allows for enhanced sample observation and characterization. The Ultra 45° delivers high-resolution imaging capabilities and supports a range of analytical techniques for materials science, nanotechnology, and other research applications.
4 protocols using ultra 45
Transmission Electron Microscopy Protocol
Transmission Electron Microscopy Protocol
Digital images were acquired with TIA software (TEM Imaging & Analysis, version 4.7 SP3; FEI). Alternatively, sets of serial digital images with 10% overlap (at an original magnification of ×30,000) were acquired with the automated EM data acquisition software package SerialEM133 (link) (
Transmission Electron Microscopy of Resin-Embedded Tissues
Sample Preparation for TEM and SEM
For SEM, 60 nm sections were cut using a diamond knife (Ultra 45º, Diatome) and collected using an automated tape-collecting ultramicrotome. The tape was transferred to silicon wafers and carbon coated (Baena et al., 2019) .
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