AFM was used to complement the particle size analysis performed by DLS. A total of 10 μL of the sample was pipetted onto silica wafers, which were glued onto glass slides. The samples were allowed to settle onto the wafers before being gently washed with water, followed by nitrogen gas. AFM was performed under ambient conditions using a Nanowizard® 3 Nanoscience AFM (JPK Instruments, Berlin, Germany) in intermittent contact mode with an aluminum coated silicon nitride probe (HQ:NSC14/Al BS; Mikromasch, Tallinn, Estonia) at scan rates between 0.5 and 1 Hz, as described previously.
Hq nsc14 al bs
Manufactured by MikroMasch
Sourced in Estonia, Hungary
The HQ:NSC14/Al BS is a laboratory equipment product. It serves as a core function, without further interpretation or extrapolation on its intended use.
Automatically generated - may contain errors
Lab products found in correlation
Asylum research cypher vrs instrument, by Oxford Instruments (2 mentions)
Nanowizard 3 nanoscience afm, by Bruker (1 mentions)
Mfp 3d atomic force microscope, by Oxford Instruments (1 mentions)
Highest grade v1 afm mica discs, by Ted Pella (1 mentions)
Q150t plus, by Quorum Technologies (1 mentions)
Geminisem 300, by Zeiss (1 mentions)
Sca20, by Dataphysics (1 mentions)
Multimode 8, by Bruker (1 mentions)
Nanowizard 3, by Bruker (1 mentions)
Jpkspm data processing software, by Bruker (1 mentions)
Femto oxygenplasma system, by Diener Electronic (1 mentions)
7 protocols using hq nsc14 al bs
1
Nanoparticle Size Characterization by AFM and DLS
2
Atomic Force Microscopy of Surfaces
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Atomic force microscopy was performed using an Omegascope SPM (HORIBA) in tapping mode with an aluminum-coated silicon tip, an 8 nm tip radius, and a 40° tip cone (HQ:NSC14/AL BS, Mikromasch, Sofia, Bulgaria).
3
Atomic Force Microscopy Sample Preparation
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The sample preparation for AFM was performed on mica (Highest Grade V1 AFM Mica Discs, 10 mm, Ted Pella). The protein samples were diluted to a 1 to 2 μg/ml, and 50 μl was deposited onto freshly cleaved mica. After a 30-s incubation, the excess of unbound proteins was washed off with the ultrapure water for ∼10 s, and the mica was immediately dried under filtered air. All proteins were imaged under dry conditions, and the solution conditions of the samples refer to the conditions in which they were deposited onto mica. AFM imaging was performed on Asylum Research MFP-3D atomic force microscope using the AC tapping mode in air. AFM tips with a 160-kHz resonance frequency and 5 N/m force constant (MikroMasch, HQ: NSC14/AL BS) were used.
4
Characterization of Lignin Coatings via SEM, AFM, and Contact Angle
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For scanning electron
microscopy (SEM) analysis, lignin coatings on silicon wafers were
coated with a 7 nm protective layer of gold using a Q150T Plus, Quorum
Technologies instrument. Images were captured using a Zeiss GeminiSEM
300 at 3.00 kV.
Atomic force microscopy (AFM) images were recorded
using an Asylum Research Cypher VRS instrument (Oxford Instruments,
United Kingdom). Measurements were done in tapping mode using a trihedral
aluminum coated silicon cantilever (HQ/NSC14/Al BS, MikroMasch, Hungary)
with 5 N/m spring constant and ∼160 kHz resonance frequency.
The roughness average (Ra) was calculated
using Gwyddion software.
Water contact angle measurements were
performed using a DataPhysics
OCA 35 contact angle measurement instrument in ambient conditions.
A 15 μL Milli-Q water droplet was used for each measurement.
The contact angle was determined using software SCA 20 from DataPhysics.
The reported values are given as the average value of at least 3 measurements
± standard deviation.
microscopy (SEM) analysis, lignin coatings on silicon wafers were
coated with a 7 nm protective layer of gold using a Q150T Plus, Quorum
Technologies instrument. Images were captured using a Zeiss GeminiSEM
300 at 3.00 kV.
Atomic force microscopy (AFM) images were recorded
using an Asylum Research Cypher VRS instrument (Oxford Instruments,
United Kingdom). Measurements were done in tapping mode using a trihedral
aluminum coated silicon cantilever (HQ/NSC14/Al BS, MikroMasch, Hungary)
with 5 N/m spring constant and ∼160 kHz resonance frequency.
The roughness average (Ra) was calculated
using Gwyddion software.
Water contact angle measurements were
performed using a DataPhysics
OCA 35 contact angle measurement instrument in ambient conditions.
A 15 μL Milli-Q water droplet was used for each measurement.
The contact angle was determined using software SCA 20 from DataPhysics.
The reported values are given as the average value of at least 3 measurements
± standard deviation.
5
Nanomechanical Mapping of B-doped Diamond Films
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Specific surface properties of the B-doped polycrystalline diamond films on GaN epilayers were examined using an AFM (Multimode 8, Bruker, Billerica, MA, USA) working in the specific tapping mode called PeakForce Tapping that enables direct control of the tip-sample force at the level of piconewtons. In this mode, the tip periodically approaches the surface with the sub-resonant frequency and monitoring maximum contact force set at 500 pN, while the probe continues the raster scan. Real-time data is processed on the fly in order to determine the local topography and mechanical properties of the surface, which is known as quantitative nanomechanical mapping (QNM). Each image consists of samples taken from a 2 × 2 µm2 scan area probed in 256 × 256 steps (the lateral resolution is 7.81 nm). The scanning probes were made of silicon and had a nominal spring constant of 5 N/m, a resonance frequency of 160 kHz, and a tip radius of 8 nm (HQ:NSC14/Al-BS, Mikro-Masch, Tallinn, Estonia).
6
Liposomal Formulation Characterization using AFM
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The morphological characteristics of the liposomal formulations were studied with atomic force microscopy (AFM) using a NanoWizard® 3 (JPK Instruments AG, Berlin, Germany) with silicon cantilevers (HQ:NSC14/AL BS, Mikromasch Europe, Wetzlar, Germany). The measurements were carried out using intermittent contact mode at scan rates between 0.5 to 1 Hz to avoid damaging the lipid membrane [33 (link)]. A resonance frequency of 120 kHz and the force constant 5 N/m was used. Different formulations of nebulised liposomes were diluted 1:10 with ultrapure water, 10 µL of the mixture was placed onto glass slides and left to dry at room temperature. To gain the final images, the amplitude signal of the cantilever in the trace direction and the height signal in retrace direction were used and the images were processed using JPKSPM data processing software (JPK Instruments AG).
In addition, AFM images were analysed for size confirmation. For this purpose, the average liposomal size was determined by analysing a representative number of height images using ImageJ software (v1.52a, National Institutes of Health, Bethesda, MD, USA) [33 (link),34 (link)].
In addition, AFM images were analysed for size confirmation. For this purpose, the average liposomal size was determined by analysing a representative number of height images using ImageJ software (v1.52a, National Institutes of Health, Bethesda, MD, USA) [33 (link),34 (link)].
7
Atomic Force Microscopy Characterization
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Samples for AFM were
prepared on silicon wafers (10 mm × 8 mm size) cleaned via sonication
in methanol, deionized water, and acetone for 10 min each. The substrates
were then placed in a Femto Oxygen Plasma system (200 W, Diener Electronic)
under 5 mL/min oxygen flow for 15 min. AFM images were recorded using
an Asylum Research Cypher VRS instrument (Oxford Instruments, United
Kingdom). Measurements were done in tapping mode using a trihedral
aluminum-coated silicon cantilever (HQ:NSC14/Al BS, MikroMasch, Hungary)
with a spring constant of 5 N/m and a resonance frequency of ∼160
kHz. To determine nanoparticle sizes and size distributions, 4 μL
of a nanoparticle dispersion in CHCl3 (concentration 0.1
mg/mL) was deposited on a silicon wafer. The wafers were dried overnight
at room temperature and then imaged. Images were processed with the
Gwyddion software. The reported particle sizes are the average of
50 nanoparticle heights. To study the morphology of polymer blend
films, 10 μL of polymer solution in CHCl3 (polymer
concentration 10 wt %) was spin-coated on the surface of a silicon
wafer by a Convac ST 146 spin-coater (2000 rpm, 100 s) and then dried
overnight at room temperature.
prepared on silicon wafers (10 mm × 8 mm size) cleaned via sonication
in methanol, deionized water, and acetone for 10 min each. The substrates
were then placed in a Femto Oxygen Plasma system (200 W, Diener Electronic)
under 5 mL/min oxygen flow for 15 min. AFM images were recorded using
an Asylum Research Cypher VRS instrument (Oxford Instruments, United
Kingdom). Measurements were done in tapping mode using a trihedral
aluminum-coated silicon cantilever (HQ:NSC14/Al BS, MikroMasch, Hungary)
with a spring constant of 5 N/m and a resonance frequency of ∼160
kHz. To determine nanoparticle sizes and size distributions, 4 μL
of a nanoparticle dispersion in CHCl3 (concentration 0.1
mg/mL) was deposited on a silicon wafer. The wafers were dried overnight
at room temperature and then imaged. Images were processed with the
Gwyddion software. The reported particle sizes are the average of
50 nanoparticle heights. To study the morphology of polymer blend
films, 10 μL of polymer solution in CHCl3 (polymer
concentration 10 wt %) was spin-coated on the surface of a silicon
wafer by a Convac ST 146 spin-coater (2000 rpm, 100 s) and then dried
overnight at room temperature.
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