Ecx 400
The ECX-400 is a nuclear magnetic resonance (NMR) spectrometer produced by JEOL. It is a compact and versatile instrument designed for the analysis of chemical samples. The ECX-400 features a 400 MHz superconducting magnet and provides high-resolution NMR data for a wide range of applications in chemistry, materials science, and life sciences.
Lab products found in correlation
28 protocols using ecx 400
NMR Spectroscopy and HPLC Analysis Protocol
NMR and Mass Spectrometry Analysis
NMR Analysis of Chemical Compounds
Characterization of Ag Nanoparticles on TiO2
Spectroscopic and Thermal Analysis Methods
Analysis of Purified Hydrolysed Lipids
Characterization of Coordination Complexes
Characterization of Nanomaterial Composites
were recorded on a JEOL (Tokyo, Japan) ECX-400 instrument using tetramethylsilane
as an internal standard (400 MHz). FTIR spectra were recorded on a
JASCO (Tokyo, Japan) FTIR-460 plus spectrometer. Hydrodynamic diameter
and ζ potential were analyzed using DLS on a Malvern Instruments
(Malvern, U.K.) Zetasizer Nano ZS. EDX spectra were recorded on a
JEOL (Tokyo, Japan) JSM-6510A analytical scanning electron microscope.
SEM measurements were conducted on a Hitachi (Tokyo, Japan) SU8000
microscope at an accelerating voltage of 30 kV. TEM measurements were
conducted on a JEOL (Tokyo, Japan) TEM-2100F field emission scanning
electron microscope. The XRD patterns were measured on a Rigaku (Tokyo,
Japan) Ultima IV RINT D/max-kA diffractometer with Cu Kα radiation
(λ = 1.54178 Å) under ambient conditions. TGA was carried
out on a Seiko Instruments (Tokyo, Japan) TG/DTA 6200 (EXSTER6000)
at a heating rate of 10 °C min–1 under N2. The magnetic properties of the composites were analyzed
on a Riken Denshi (Tokyo, Japan) BHV-30 series vibrating sample magnetometer
under ambient conditions. The optical absorbance was measured on an
AS ONE (Osaka, Japan) ASV11D UV–visible spectrophotometer.
Water was deionized on a Nomura Micro Science (Kanagawa, Japan) MINIPURE
TW-300RU.
Characterization of Ga-based Complexes
Comprehensive Polymer Characterization
were recorded on a JEOL (Tokyo, Japan) ECX-400 (400 MHz) and ECX-500
(500 MHz) spectrometer. FTIR spectra were recorded on a JASCO (Tokyo,
Japan) FT/IR-460Plus spectrometer. Samples were molded as KBr disks
using KBr dried under reduced pressure with heating above 200 °C
before use. XRD patterns were recorded on a Rigaku (Tokyo, Japan)
RINT RAPID diffractometer with Cu Kα irradiation. The degree
of crystallization was calculated from the intensities of the diffraction
of the 200 lattice at 2θ = 22.6° and the diffraction at
2θ = 18.5°.31 (link) Thermogravimetric
analysis was conducted using Seiko Instruments (Chiba, Japan) EXSTAR
6000 TG/DTA 6200 instrument under a nitrogen atmosphere. Scanning
electron microscopy measurements were conducted on a Hitachi (Tokyo,
Japan) SU8000 microscope at an accelerating voltage of 30 kV.
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