Elan 9000 drc icp ms system

The TEM micrographs and FFT patterns were recorded on a TECNAI G2 high-resolution TEM (FEI Co., USA). X-ray diffraction was performed on a D8 ADVANCE diffractometer (Bruker Co., Germany) using Cu Kα (0.15406, nm) radiation. The DLS and zeta potential of the as-prepared samples were determined on a Zetasizer Nano ZS (Malvern Instruments Ltd, UK). The elemental analysis was performed on an ELAN 9000/DRC ICP-MS system (PerkinElmer, USA). The infrared spectra were captured with a Bruker Vertex 70 FTIR spectrometer. XPS measurements were conducted with a VG ESCALAB MKII spectrometer (VG Scientific Ltd, UK). The morphology and size of Fe-CPNDs were determined on an AFM using the ScanAsyst mode in air (Dimension Icon, Veeco Instruments/Bruker, Germany). Commercially available AFM cantilever tips with a force constant of ∼ 48 N m⁻¹ and resonance vibration frequency of ∼330 kHz were used. The scanning rate was set to 0.4 Hz. The samples for AFM were prepared by dropping an aqueous suspension (0.2 mg ml⁻¹) of Fe-CPNDs on a freshly cleaved mica surface via a spin-coating method.

TEM micrographs were recorded by TECNAI G2 high-resolution TEM (FEI Co., USA). Dynamic light scattering and zeta potential of the as-prepared samples were carried out on a Zetasizer Nano ZS (Malvern Instruments Ltd, UK). The analysis of elements was conducted with an ELAN 9000/DRC ICP-MS system (PerkinElmer, USA). The relaxation times of the samples were carried out on a Siemens Prisma 3.0 T MR scanner (Erlangen, Germany). Energy-dispersive X-ray spectra (EDS) were inspected on an energy dispersive spectroscopy (FEI Co., USA). X-ray diffraction analysis were carried out on a D8 ADVANCE diffractometer (Bruker Co., Germany) using Cu Kα (0.15406 nm) radiation. The infrared spectra were conducted with a Vertex 70 Fourier transform infrared (FTIR) spectrometer (Bruker, Germany). XPS measurements were conducted with a VG ESCALAB MKII X-ray photoelectron spectrometer (VG Scientific Ltd, UK) spectroscopy (XPS). Siemens Prisma 3.0 T MR scanner (Erlangen, Germany) was employed to acquire T₁-weighted MR images.