Axs d2 diffractometer

The structural changes were evaluated by x-ray diffraction (XRD) patterns. The patterns were collected using a Bruker AXS D2 diffractometer equipped with a Cu tube, using Cu Kα radiation (λ = 1.54 Å); in the range of 5–50°, with steps of 0.05°, with 0,5 s for each step (Fig. 3).Figure 3

X-ray diffraction pattern of silver vanadate nanostructure.

All the chemicals are of analytical reagent grade and used without further purification. Citric acid monohydrate, ethylenediamine, dimethylsulfoxide (DMSO), copper chlorophyllin, 1-ethyl-3-(3-dimethylaminopropyl) carbodiimide hydrochloride (EDC), N-hydroxysulfosuccinimide sodium salt (S-NHS), ethanol and silver nitrate (AgNO₃) were purchased from Sinopharm Chemical Reagent Co. Ltd.
The UV-Vis absorptions were measured with a Cary-60 UV-Vis spectrophotometer (Agilent, USA). The FL spectra of the samples in quartz cells were measured on a Cary Eclipse fluorescence spectrophotometer (Agilent, USA) using a Xe lamp as the excitation source in the same condition of measurements. The transmission electron microscope (TEM) images were captured on a Tecnai F30 instrument (FEI, USA). The X-ray powder diffraction (XRD) analysis was performed on an AXS-D2 diffractometer (Bruker, Germany) with Cu Kα radiation (λ = 1.5406 Å). The Cu²⁺ content in CCPh-CDs was measured by an Agilent-7900cx inductively coupled plasma mass spectrometer (ICP-MS). The decay lifetimes of the samples were measured at room temperature using an FLS920 lifetime spectrofluorophotometer.