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218 protocols using alpha 300r

1

Raman Spectroscopy Analysis of Graphene

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Raman spectroscopy was conducted using a 532 nm laser (WITec Alpha 300R) on both as-grown and transferred graphene samples. Unless otherwise stated, the synthesized graphene was analyzed along the length (every 75 mm) and width (3 points, both edges and middle) of the substrate using Raman spectroscopy directly on the Cu foil. Spectroscopy measurements were collected using a 1 sec integration time, and background values were subtracted from the resulting data using a polynomial fit function. A Lorentzian peak-fitting algorithm was used along with a low-pass filter to generate spectra for further analysis. Two-dimensional Raman scans were conducted using the WITec Alpha 300 R and a 35 μm × 35 μm area of interest, 45 × 45 pixels, and an integration time of 0.5 sec for each data point. Optical microscopy was also performed on the WITec Alpha 300R system. FE-SEM secondary electron images were acquired using a Zeiss Supra55VP FESEM operated at 2–5 kV.
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2

Characterization of CdI2 and CdS Crystals

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The surface morphology, domain size and thickness of CdI2 and CdS crystals were characterized by optical microscope (OM) (OLYMPUS, BX51) and atomic force microscopy (AFM) (Bruker, Dimension Icon). The crystal structure, phase, and composition were analyzed using X-ray powder diffraction (XRD) (Bruker, D2 phaser), X-ray photoelectron spectroscopy (XPS) (Kratos, AXIS-ULTRA DLD-600 W), microscope-based Raman spectrometer (WITec, Alpha 300RS+, 532 nm excitation laser) equipped with a 100X objective lens, and transmission electron microscopy (TEM) (FEI, Tecnai G2 F30) equipped with an energy-dispersive X-ray spectroscopy (EDS) system.
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3

Multimodal Characterization of Novel Materials

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Raman spectra were conducted using a Renishaw-inVia Plus with an excitation wavelength of 532 nm. SEM images were taken by Zeiss Sigma. XPS was performed on a Thermo Scientific, ESCALAB 250Xi. The binding energies were calibrated by referencing the C 1s peak (284.8 eV). The AFM image was measured on a confocal laser microscope system (Alpha 300RS+, WITec). The XRD pattern was measured on a Rigaku Miniflex600 powder diffractometer. The TEM images in Fig. 2 were obtained with JEOL COM operated at 80 kV. The low-loss electron EELS spectra were obtained by FEI Tecnai operated at 80 kV. The TEM images in Fig. S18 were obtained by a probe-corrected high-resolution TEM system (FEI Tecnai) operated at 300 kV. All magnetic measurements were carried out in a magnetic property measurement system (MPMS–XL, Quantum Design).
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4

Raman Spectroscopy of Activated Metal-Organic Material

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Raman spectrum was collected using an alpha300 RS from WITec with activated sample sealed in a glove box under N2 atmosphere. The excitation wavelength was 532 nm, integration time was 120 s with 4 times of accumulations, the grating is G3 1200 g mm−1 (BLZ = 500 nm). Two equivalent batches of as-synthesised 1·[CuCl] were transferred to two different Raman sample cells (see Fig. S9) within a globe box. The former (Cell#1) was left undisturbed, while the latter (Cell#2) was activated under temperature and vacuum for 8 hours to ensure a complete conformational change. The Raman spectra of both cells were then collected before running an in situ N2 adsorption isotherm at 77 K on the activated sample. A final Raman spectrum, post-isotherm, was then collected to spot any potential conformational change during the desorption step.
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5

Raman Spectroscopy Analysis of Parental and Radio-Resistant Breast Cancer Cells

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Fresh cell pellets of parental MCF7 and MCF7-RR were fixed using 1% Paraformaldehyde (PFA) at 4 °C for 10 min followed by two washes of saline at 5000 rpm for 5 min at 4 °C. A total of 30 spectra were analyzed for both parental and radio-resistant MCF7. Raman spectra were recorded using a commercial Raman micro spectroscope (WITec alpha300RS, λX-532 nm, 10 mW, 600 grooves/mm). Preprocessed Raman spectra (smoothening, fifth point, baseline, fifth order, and vector normalization) in 650–1750 cm− 1 were subjected to PCA and PCA-LDA using commercial Unscrambler® X software.
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6

Micro Raman Analysis of iPP Fibers

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The samples were examined with Micro Raman spectroscopy using a WITec Alpha 300 RS scanning confocal Raman microscope in backscattered geometry with a polarized Nd:YAG laser operating at the wavelength of 532 nm. The laser beam was focused through a 20x/0.4 microscope objective. The power of the laser at the sample was approximately 12 mW. Raman spectra were recorded on multiple iPP fibres on different layers.
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7

Characterization of Ta3FeS6 Crystals

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Ta3FeS6 crystals were characterized by an OM (BX53M, OLYMPUS), XRD (D2 PHASER, Bruker), a Raman spectrometer (Alpha 300RS+, WITec) equipped with a cryo console, and an AFM (Dimension Icon, Burke). The TEM, SAED, and EDS were performed in a field emission TEM (Tecnai G2 F20, FEI). The Au film was deposition in a high‐vacuum deposition system (Angstrom Engineering, Nexdep). MOKE measurements were carried out by using a home‐made microscopic polar MOKE system. The samples were placed in a superconducting magnet with a temperature range from 4.2 to 300 K and an out‐of‐plane magnetic field up to 5 T. The wavelength of laser source range from 500 to 900 nm with an excitation power of 3 µW. Incident light is normally incident on the sample surface through an aspheric lens. Mechanical chopper can change the incident light intensity and photoelastic modulator (PEM) can modulate the polarization of incident light. The combination of mechanical chopper and PEM can extract the MOKE signal of the sample. The detail of the optical setup is shown in Figure S3 (Supporting Information).
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8

AFM Imaging of Surface Topography

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AFM measurements
took place using the AFM function of the WITec alpha 300 RS in AC
mode configuration using 285 KHz 42 N/m reflex-coated acoustic AC
mode cantilevers (purchased at WITec Wissenschaftliche Instrumente
und Technologie GmbH, Germany) at a scan speed of 1 line/s with a
scan dimension of 20 × 20 μm and 512 points/line, 512 lines/image.
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9

Characterizing MWCNT Distribution in Nanopillar Composites

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We conducted Raman spectroscopy measurements to characterize the distribution of MWCNTs in the fabricated conducting nanopillar-arrays made of MWCNT/polymer composites. A confocal Raman microscope (Alpha 300RS, WITec, Germany) was used to collect Raman signals from 25 × 25 pixels over a 25 × 25 μm2 area using a 20× objective lens under 785 nm laser excitation (2 mW) with an integration time of 1 s per pixel. The backscattered photons were detected by a spectrometer (UHTS300, WItec, Germany) equipped with a CCD camera (DU401A, Oxford Instruments, UK). After the signal acquisition, cosmic ray removal and baseline correction were performed using the software Project v4.1 (WITec, Germany).
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10

Raman Spectroscopy Imaging of Plastics

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Raman spectra were recorded in air using
a WITec confocal Raman microscope (Alpha 300RS, Germany) equipped
with a 532 nm laser diode (<30 mW), as reported previously.11 (link),22 (link),24 (link) A charge-coupled device (CCD)
detector was cooled at −60 °C to collect Stokes Raman
signals under a 20× or 100× objective lens at room temperature
(∼24 °C).
To map an image, the stage-moving speed
(controlled by a piezo-driven scanning stage) for each Raman signal
collection at each pixel was varied, from 1 × 1 μm to scan
an area of 88 × 88 μm with 88 × 88 pixels, to 0.33
× 0.33 μm to scan an area of 10 × 10 μm with
30 × 30 pixels, as indicated below. The Raman scanning duration
was changed accordingly. In the former case, it was 7744 s (88 ×
88); in the latter case, it was 900 s (30 × 30), where each pixel
takes 1 s to collect the Raman signal.
For Raman image mapping,
the sample was scanned using a 20×
or 100× objective lens. The different plastics exhibit different
Raman activities and emit different intensities of Raman spectra,
as suggested previously.22 (link) For image mapping,
we select the characteristic peak that should be strong and not overlapped
with the peaks of the other plastic. For example, the Raman signal
at 1059 cm–1 was picked up to image the PE, along
with other characteristic peaks (1130, 1300, and 1450 cm–1). The intensities at different peaks were mapped as different colors
of images.
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