For scanning electron microscope (SEM) images of dry powder, after osmium metal coating using a neo-osmium coater (Neoc-STB; Meiwafosis Co., Ltd., Tokyo, Japan), the surface structure of each dry powder was observed with SEM images of a field-resolved scanning electron microscope (JSM-6340F; JEOL Ltd., Tokyo, Japan). For cryo-SEM, samples were frozen in liquid nitrogen, then knife-cut and observed in JEOL JSM 7100F SEM (JEOL Ltd., Tokyo, Japan) under vacuum conditions at minus 90 degrees. The accelerating voltage was 10 KV, and the detection signal was a backscattered electron image.
Jsm 7100f sem
The JEOL JSM-7100F is a Scanning Electron Microscope (SEM) designed for high-resolution imaging and analysis of a wide range of samples. It features a thermal field emission electron gun, high-resolution electron optics, and advanced imaging and analytical capabilities.
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13 protocols using jsm 7100f sem
Evaluating Phosphate Suspensions Produced from Calcium-Based Materials
For scanning electron microscope (SEM) images of dry powder, after osmium metal coating using a neo-osmium coater (Neoc-STB; Meiwafosis Co., Ltd., Tokyo, Japan), the surface structure of each dry powder was observed with SEM images of a field-resolved scanning electron microscope (JSM-6340F; JEOL Ltd., Tokyo, Japan). For cryo-SEM, samples were frozen in liquid nitrogen, then knife-cut and observed in JEOL JSM 7100F SEM (JEOL Ltd., Tokyo, Japan) under vacuum conditions at minus 90 degrees. The accelerating voltage was 10 KV, and the detection signal was a backscattered electron image.
Microstructure Analysis of Materials
Microstructure Analysis of Emulsions
Wax Crystal Microstructure Visualization
Cryo-SEM Visualization of Carrot Serum Pectin
and transferred into the cryo-stage at -140 °C in the cryo-preparation chamber (PP3010T cryo-SEM preparation system, Quorom Technologies, UK). The sample was freeze-fractured, sublimated at -90 °C for 25-30 min under controlled vacuum conditions and then sputter coated with platinum using argon gas to prevent charging during electron beam targeting (Kyomugasho et al., 2016) . Finally, the sample was transferred onto the SEM stage and examined using a JEOL JSM 7100F SEM (JEOL Ltd, Tokyo, Japan) for their microstructure in solution.
Cryo-SEM Visualization of Ca2+-Enriched Pectin
Scanning Electron Microscopy of Dry Powders
Characterization of Graphene Oxide Flakes
Microstructural Analysis of Dried and Cooked Beans
Cryogenic SEM (Cryo-SEM) was employed for the evaluation of cooked and rehydrated beans. A section of the cotyledon was attached to the specimen holder of a CT-1000C cryo transfer system (Oxford Instruments, Oxford, UK) and frozen in slush nitrogen. The sample was sublimed and coated with tungsten before being transferred to the microscopic stage of JSM-7100F SEM (JEOL, Tokyo, Japan) and viewed at an accelerating voltage of 10 kV at × 100 magnification.
Characterization of SBC and MSBC Materials
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