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Ganesha 300xl

Manufactured by Dectris

The GANESHA 300XL is a high-performance X-ray detector designed for advanced research applications. It features a large active area, high dynamic range, and fast readout capabilities, making it suitable for a wide range of X-ray-based techniques. The core function of the GANESHA 300XL is to accurately detect and record X-ray signals for scientific analysis and measurement.

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2 protocols using ganesha 300xl

1

Nanocrystalline Domain Characterization

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X-ray scattering measurements were conducted using the SAXSLAB GANESHA 300XL instrument, equipped with a Dectris Pilatus 300K 2D CMOS photon counting detector (size: 83.8 × 106.5 mm2). A small-angle 2 mm beamstop was utilized for SAXS measurements, while a wide-angle 2 mm beamstop was employed for WAXS measurements. The exposure time was set at 600 s. The average size of the nanocrystalline domain was determined using Scherrer’s equation, which is expressed as D=kλβcosθ , where k is a dimensionless shape factor that varies based on the actual shape of the nanocrystalline domain (k = 1, approximating the spherical shape of the nanocrystalline domains), λ is the wavelength of X-ray diffraction (λ = 1.54 Å), θ is the peak of the Bragg angle, and β is the full width at half maximum (FWHM) of the WAXS peaks. The d-spacing between nanocrystalline domains was calculated using d=2πqmax , where qmax is the q value at its maximum intensity from SAXS patterns. The FWHM (β) and qmax were obtained by curve fitting of the WAXS and SAXS patterns, respectively, in Origin software (OriginLab Corporation). For representative WAXS and SAXS 2D patterns, each hydrogel fiber was repeated three times with similar results.
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2

Nanocrystalline Domain Characterization by SAXS/WAXS

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X-ray scattering measurements were conducted using the SAXSLAB GANESHA 300XL instrument, equipped with a Dectris Pilatus 300K 2D CMOS photon counting detector (size: 83.8 x 106.5 mm2). A small-angle 2 mm beamstop was utilized for SAXS measurements, while a wide-angle 2 mm beamstop was employed for WAXS measurements. The exposure time was set at 600 seconds. The average size of the nanocrystalline domain was determined using Scherrer’s equation, which is expressed as D=kλβcos,θ , where k is a dimensionless shape factor that varies based on the actual shape of the nanocrystalline domain ( k=1 , approximating the spherical shape of the nanocrystalline domains), λ is the wavelength of X-ray diffraction ( λ=1.54 Å), θ is the peak of the Bragg angle, and β is the full width at half maximum (FWHM) of the WAXS peaks. The d-spacing between nanocrystalline domains was calculated using d=2πqmax , where qmax is the q value at its maximum intensity from SAXS patterns. The FWHM ( β ) and qmax were obtained by curve fitting of the WAXS and SAXS patterns, respectively, in Origin software (OriginLab Corporation).
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