Jsm 6500 tfe sem
The JSM-6500 TFE-SEM is a field emission scanning electron microscope (FE-SEM) manufactured by JEOL. It is designed to provide high-resolution imaging and elemental analysis of a wide range of materials. The instrument utilizes a thermal field emission gun as the electron source, which enables high-resolution imaging with minimal sample preparation.
Lab products found in correlation
4 protocols using jsm 6500 tfe sem
MG63 Cell Adhesion on Nanodots
Quantifying Astrocytic Syncytium on Nanodots
Fabrication of Uniform Nanodot Arrays
Ceftraxone-Induced Kidney Cell Damage
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