Cells in logarithmic growth phase were made into suspension in media to maintain activity prior to Raman measurement. Then the suspension was deposited on a rectangle-aluminum plate. Raman spectra of single living cells were recorded using a Renishaw InVia Micro-Raman system with a 50 × objective with a numerical aperture of 0.75. Laser beam from a 785 nm multimode high power diode (about 20 mW of power) was used for excitation. The diameter of focal area for collecting spectra was approximately 5 μm which was smaller than a cell, thus spectra were collected at three points of a triangle inside the cell, resulting in full coverage of focal area on the cells. The spectra were recorded with 20 s of integration time in the range of 300 to 1800 cm−1. All measurements were finished in a few minutes and the sample was subsequently replaced by a new one to restart Raman measurement. Finally, three spectra of a single cell were averaged to obtain mean spectra which would be gathered according to corresponding cell types, resulting in spectral quantity of 30 for every cell line.
Invia micro raman system
Manufactured by Renishaw
Sourced in United Kingdom
The InVia micro-Raman system is a laboratory instrument designed for Raman spectroscopy analysis. It provides high-resolution, confocal Raman imaging capabilities for a wide range of sample types.
Automatically generated - may contain errors
7 protocols using invia micro raman system
1
Raman Spectroscopy of Single Living Cells
2
Nanowire Characterization via Multi-Technique Analysis
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
FEI Tecnai F20 TEM was used for high-resolution TEM. SEM imaging utilizes a FEI Quanta FEG 400 Scanning Electron Microscope. XPS analysis is performed using a Physical Electronics 5600ci XPS system with an Al Kα radiation source. All XPS spectra are calibrated by the position of the C 1s peak. The carbon signal used for calibration results from surface absorbed hydrocarbons, which have a characteristic peak location of 284.5 eV. The Raman spectroscopic analysis of the nanowire arrays is performed using a Renishaw Invia Micro Raman system with a 633 nm HeNe laser. Raman system is calibrated using single crystal Si wafer, with characteristic peak at 520.0 cm−1.
3
SERS Experiment Protocol with 785 nm Laser
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The protocol for SERS experiment was previously described.8 The SERS spectra were recorded using an InVia Micro‐Raman system (Renishaw Corporation, Gloucestershire, London, England) under 785‐nm diode laser excitation with the Raman shift range from 300 cm−1 to 1800 cm−1. The spectra were collected in the backscattering geometry by a microscope equipped with a 20× objective lens, with a spectral resolution of 1 cm−1 and an exposure time of 10 sec.
4
Comprehensive Material Characterization via Advanced Microscopy and Spectroscopy
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The material morphologies were observed by scanning electron microscopy (FE-SEM, S-4800, Hitachi) and transmission electron microscope (TEM, Hitachi-2100, 200 kV), combined with energy dispersive X-ray spectrometry (EDS) for elemental mappings. The sample for TEM characterization was obtained by scraping the black powders from the substrate with a knife. The phase structure of samples was determined with X-ray diffraction (XRD, Bruker D8 advance with Cu Kα, λ = 1.5418 Å). X-ray photoelectron spectra (XPS) were recorded on a Thermo Fisher X-ray photoelectron spectrometer system. Raman spectra were collected on a Renishaw InVia micro-Raman system with an excitation wavelength of 633 nm (Renishaw, UK).
5
Optical and Spectroscopic Characterization of Flakes
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Optical characterization was done using Olympus microscope (BX53M) and their proprietary software Stream Essentials. Since the contrast of the flakes on glass is not good in bright field, we use dark-field mode to see and capture the images. Raman and PL spectroscopy are performed in a Renishaw inVia micro-Raman system. Excitation wavelength of 532 nm with an incident beam power of ~1 mW and exposure time of 10 s is used for Raman. A 3000 l/mm grating is used for < 5 cm−1 resolution. For photoluminescence spectroscopy, excitation wavelength of 532 nm with incident power <1 mW and exposure time ~10 s is used. A 1200 l/mm grating is used for PL measurements.
6
Comprehensive Physicochemical Characterization of Materials
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The morphology of the samples was observed using a transmission electron microscope (TEM) (FEI, Tecnai G2 F20) and a scanning electron microscope (SEM) (Hitachi, S4800) equipped with an Energy Dispersive X–Ray (EDX) spectroscopy detector for elemental analysis. Pore distribution and SSA were analyzed by N2 adsorption-desorption tests by an accelerated surface area and porosimeter system (3H–2000PS2 unit, Beishide Instrument S&T Co., Ltd). X–ray diffraction (XRD) analysis was implemented on a Bruker D8 Advance TXS XRD instrument with Cu Kα (target) radiation (λ = 1.5418 Å) at a scan rate (2θ) of 4° min−1 and a scan range from 5 to 90°. Raman spectra were recorded using a Renishaw InVia micro-Raman system with an excitation wavelength of 514 nm. X–ray photoelectron spectroscopy (XPS) was performed on a Thermo Escalab 250Xi system using a spectrometer with a dual Al Ka X–ray source.
7
High-Resolution Raman Mapping
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Raman measurements were performed with a Renishaw inVia microRaman system. Samples were excited by a 632.8 nm He–Ne laser through a ×100 (NA = 1.25) objective. The Raman band of a silicon wafer at 520 cm−1 was used to calibrate the spectrometer. For 2D Raman mapping, an automatic XY stage allowed the samples to be moved in small steps of 0.2 μm.
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!