The IR spectra of nanomaterials were recorded using UV-Vis spectrometer (Bruker) to demonstrate the preparation of Ca-Alg2-CH nanocomposite, and the loading of CPT in the two nanomaterials. The spectroscopic analysis for detection of CPT in nanomaterials were performed using PerkinElmer 750 Lambda UV/VIS/NIR spectrophotometer. The XRD result was measured using scanting XDS2000 powder diffractometer equipped with Cu Kα radiation (λ = 1.540 A°) at 40 kV and 40 mA. The surface morphologies of nanomaterials before and after loading with CPT were obtained using a scanning electron microscope (JEOL-JSM6390LA), the samples sputter-coated with gold prior to imaging. The particles size could be calculated using the Debye–Scherrer equation.
Uv vis spectrometer
Manufactured by Bruker
The UV-Vis spectrometer is a laboratory instrument used to measure the absorption or transmission of light in the ultraviolet and visible regions of the electromagnetic spectrum. It is designed to quantify the concentration of specific compounds in a sample by detecting the amount of light absorbed or transmitted at specific wavelengths.
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Lab products found in correlation
3 protocols using uv vis spectrometer
1
Characterization of Ca-Alg2-CH Nanocomposite
2
Characterization of Manganese Oxide Nanoparticles
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The as-prepared Mn3O4 NPs are characterized by several approaches. The XRD characterization is carried out using Bruker diffractometer (Cu Kα, (λ = 1.5406 Å)). The spectral characterization was carried out using PerkinElmer UV–Vis spectrometer and Bruker IFS 66 v/S spectrometer are used for UV–Vis and FT-IR spectral analysis, respectively. The microscopic analysis such as FESEM is carried to understand the surface analysis is analysed out by FESEM (JED-2200, JEOL, Tokyo, Japan) and the FESEM sample was fixed onto a stub with carbon‐built dual‐sided adhesive tape and then sputter coated with nearly 10 nm of platinum. For imaging, the sample is focused on perpendicular to the inward electron beam. FESEM pictures were captured using an operational voltage of 5 kV and a working distance of 4.5 mm over several magnifications. HRTEM was performed on a JEOL JEM 2100 PLUS, (USA). The sample for HRTEM analysis was prepared by placing a drop of primary sample on a holy carbon copper grid, which were dried in oven for 6 h at 80C°. HRTEM images are recorded with operating at 200 kV accelerating voltage. Thermo gravimetric analysis was analyzed using Metler Toledo instrument, TGA/DSC1, Im Langacher, Switzerland.
3
Characterization of Heterostructures by Advanced Techniques
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The as-synthesized heterostructures
are characterized by XRD, UV–vis, FTIR, FESEM, and TEM. The
XRD characterization is carried out using a Bruker diffractometer
[Cu Kα (λ = 1.5406 Å) X-ray source]. The spectral
characterization is carried out using a PerkinElmer UV–vis
spectrometer and a Bruker IFS 66 v/S spectrometer for UV–vis
and FTIR spectral analysis, respectively. The microscopic analysis
such as SEM is carried out to understand the surface morphology, and
particle size analysis is carried out by FESEM. TEM images are recorded
with a transmission electron microscope, JEOL JEM2100 PLUS, operating
at a 200 kV accelerating voltage.
are characterized by XRD, UV–vis, FTIR, FESEM, and TEM. The
XRD characterization is carried out using a Bruker diffractometer
[Cu Kα (λ = 1.5406 Å) X-ray source]. The spectral
characterization is carried out using a PerkinElmer UV–vis
spectrometer and a Bruker IFS 66 v/S spectrometer for UV–vis
and FTIR spectral analysis, respectively. The microscopic analysis
such as SEM is carried out to understand the surface morphology, and
particle size analysis is carried out by FESEM. TEM images are recorded
with a transmission electron microscope, JEOL JEM2100 PLUS, operating
at a 200 kV accelerating voltage.
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