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Rise magna

Manufactured by TESCAN
Sourced in Czechia

RISE-MAGNA is an electron microscope system designed for high-resolution imaging and analysis. It combines a scanning electron microscope (SEM) with a focused ion beam (FIB) to enable advanced materials characterization and sample preparation. The system provides high-quality imaging, elemental analysis, and sample modification capabilities.

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6 protocols using rise magna

1

Tendon-Bone Interface Microstructure Analysis

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Fixed rat RC-humeral complex specimens were placed in decalcifying fluid for 1 month until they were suitable for sectioning. After dehydration, embedding, sectioning (5 μm), and staining with SO/Fast Green, the tendon-to-bone interface was observed under a light microscope. For XRM, after fixation using 4% polyformaldehyde, the RC–humeral complex was immersed in Lugol's iodine solution for 48 h. Subsequently, the complex was transferred to 70% ethanol for 12 h and stored in 100% ethanol. Then, the 3-dimensional microstructure of the tendon-to-bone interface was observed using a Zeiss 520 Versa microscope, with exposure for 3 s at 7 W and 80 kV. Dragonfly (Object Research Systems, Canada) was used for remodeling. For SEM evaluation, after frozen sectioning, the sections were observed using RISE-MAGNA (TESCAN, Czech Republic). For immunofluorescence staining, sections were stained with the corresponding antibody and observed under an inverted fluorescence microscope. After the harvest of the rat RC–humeral complex, 1 mm3 tendon tissue was collected and fixed using 2.5% glutaraldehyde. After dehydration and embedding in resin, the tissue was cut into thin slices (5 μm) and observed using a Tecnai G2 microscope (Thermofisher, USA).
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2

Cytoskeleton Morphology Analysis

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To observe the morphology of the cytoskeleton, the LMPCCs were immersed in 100 mM sucrose solution until they sank to the bottom and then washed with water for several times. The black-violet precipitates in the lower layer were collected with a pipette and transferred to a clean silicon wafer or a mica sheet. After drying at room temperature, the samples were observed with a transmission electron microscope (RISE-MAGNA, TESCAN, Czech Republic) and AFM (MFP-3D, Oxford Instrument, UK).
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3

Raman Characterization of SWCNT Films

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A Raman system (TESCAN RISE-MAGNA, Czech) was used to measure the Raman spectrum of the SWCNT film. A 532 nm laser was used as the excitation light whose spot size was 0.46 μm under 100× objective. A laser power of 0.507 mW, a numerical aperture of 0.75, and an exposure time of 15 s per spot were used in the Raman measurements.
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4

Morphological Analysis of CS-SeNPs

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For the morphological analysis of CS-SeNPs, a drop of nanoparticle solution was loaded on the carbon-coated copper grid for air-drying, then the samples were observed using transmission electron microscopy (JEM-1200EX, JEOL; Japan) at an accelerating voltage of 80 kV. The surface morphology of Se nanoparticles and elemental composition were studied under Raman Imaging and Scanning Electron Microscopes (RISE-Magna, TESCAN, Czech). The concentration of Se nanoparticles was determined by inductively coupled plasma mass spectrometry (i CAP Q ICP-MS, Thermo Scientific, USA). The size distribution and zeta potential of Se nanoparticles were measured by dynamic light scattering (DLS) using the Zetasizer Nano analyzer (Zetasizer NanoZS, Malvern Panalytical, Malvern, UK) as previously described by Awet et al.27 (link)
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5

Comprehensive Materials Characterization Protocol

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Observation of morphology was achieved with scanning electron microscopy (SEM, RISE-MAGNA, TESCAN, Brno, Czech Republic). The analysis of element composition and features for the synthesized samples was implemented via transmission scanning electron microscopy (TEM, TALOS F200X G2, Thermo Scientific, Waltham, MA, USA) and high-resolution TEM (HRTEM, Thermo Scientific, USA). The component and crystalline phase of samples was characterized by utilizing X-ray diffraction (XRD, D8 ADVANCE DA Vinci, Bruker, Germany) with Cu Kα radiation source. To obtain element and valence state information about the surface of samples, X-ray photoelectron spectroscopy (XPS, AXIS UltraDLD, Shimadzu, China) was utilized.
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6

Morphological Analysis of Selenium Nanoparticles

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For the morphological analysis of CS-SeNPs, a drop of nanoparticles solution was loaded on the carboncoated copper grid for air-drying, then the samples were observed using transmission electron microscopy (JEM-1200EX, JEOL; Japan) at an accelerating voltage of 80 kV. The surface morphology of Se nanoparticles and elemental composition analysis were studied by Raman Imaging and Scanning Electron Microscopes (RISE-Magna, TESCAN, Czech). The concentration of Se nanoparticles was determined by inductively coupled plasma mass spectrometry (i CAP Q ICP-MS, Thermo Scienti c, USA).
The size distribution and zeta potential of Se nanoparticles were measured by dynamic light scattering (DLS) using Zetasizer Nano analyzer (Zetasizer NanoZS, Malvern Panalytical, Malvern, UK) as previously described by Awet et al. [27] .
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