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Multimode nanoscope 8 instrument

Manufactured by Bruker
Sourced in United States

The Multimode Nanoscope VIII instrument is a versatile atomic force microscope (AFM) designed for high-resolution imaging and analysis of surfaces at the nanoscale. It provides precise control and measurement of surface topography, mechanical properties, and other characteristics of a wide range of materials and samples.

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4 protocols using multimode nanoscope 8 instrument

1

Nanomechanical Characterization of Origami and Metal Patterns

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All atomic force microscopy (AFM) images were obtained using a Multimode Nanoscope VIII instrument (Bruker) under tapping mode in fluid with SNL-10 tips (Bruker).
The nanomechanical properties were measured with the Multimode Nanoscope VIII instrument (Bruker) in the “PeakForce QNM in Fluid” mode. “SCANASYST-FLUID+” model cantilever with nominal spring constants of ~0.7 N m−1 and tip radius of ~2 nm was chosen (Bruker) for the measurements. In FD-based AFM, the AFM probe was made to approach to and retract from samples to record a series of FD curves. The “NanoScope Analysis” software was used to process the FD curves. The statistical analysis of the Young’s modulus distribution was evaluated with about 25 FD curves of origami and Cu metallization pattern, and fitted with a Gaussian model.
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2

Characterization of GO-AgNPs Morphology

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The morphology of the GO-AgNPs was characterized by transmission electron microscopy (TEM, JEM-2100F, JEOL, Japan). The structure of the GO-AgNPs and GO was measured by Uv-vis spectrophotometer (Evolution 220, Thermofisher, United States), FTIR spectrophotometer (Nicolet iS10, Thermofisher, United States) and X-ray diffraction spectra (XRD, Bruker D8 Advance, Germany). The thickness and size of GO were characterized by atomic force microscopy (AFM, Multimode Nanoscope VIII Instrument Bruker, United States). The Zeta potential and average particle size of the GO-AgNPs was measured by Dynamic Light Scattering (DLS, ZS-90, Malvern, United Kingdom).
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3

Nanoscale Characterization of BSA/MWCNTs/GA Layer

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The BSA/MWCNTs/GA layer was characterized using an atomic force microscope (AFM, Multimode Nanoscope VIII Instrument, Bruker, Billerica, MA, USA) and scanning electron microscope (SEM, LEO 1530 VP, Zeiss, Oberkochen, Germany). AFM images were obtained under tapping mode in air by using a RTESPA tip (Bruker).
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4

DNA Origami Ruler Imaging Protocol

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The DNA origami ruler sample was deposited onto a new cleaved mica substrate. Then the surface was rinsed using deionized water and dried by air. All AFM images were obtained using a Multimode Nanoscope VIII instrument (Bruker) under tapping mode in air with NSC11 tips (μMasch).
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