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11 protocols using σigma

1

Characterization of Functionalized Chitosan Beads

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Fourier transform infrared spectroscopy (FTIR) was carried out using a Perkin Elmer Spectrum 65 and used to confirm both the N-succinylation of the chitosan and its functionalisation with CB; whereas both morphology and structure of NSC and NSC-CB were investigated using a Zeiss Σigma™ field emission gun scanning transmission electron microscope (SEM, FEG-STEM). The size of the beads was evaluated using a dynamic light scattering system (DLS) from Zetasizer ZS90 (Malvern Instruments Ltd., UK).
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2

Comprehensive Material Characterization Protocol

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X-ray diffraction (XRD) patterns were acquired by the PANalytical X’pert PRO diffractometer (PANalytical B.V., Almelo, The Netherlands). The micromorphology of the substrates was observed by FESEM (ΣIGMA, Zeiss, Jena, Germany). The high-resolution transmission electron microscopy was analyzed by TEM (JEM-2100F, Japan Electronics Co., Ltd., Tokyo, Japan). X-ray photoelectron spectroscopy (ESCALAB 250Xi, Waltham, MA, USA) was used to analyze the crystal surface composition of the substrates. SERS measurements were conducted with a commercial micro-Raman spectrometer (Ahalp300, WITec, Ulm, Germany). The laser wavelength was 532 nm, and the power was 0.5 mW. A 100× objective was used, and the integral time of the spectrometer was set at 1 s.
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3

Comprehensive Nanoparticle Characterization Protocol

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The morphology and size of the NPs were recorded by transmission electron microscopy (TEM, Model Tecnai 12, Philips Co., Ltd., Holland) and scanning electron microscopy (SEM, ΣIGMA, Zeiss, Germany). The elemental analysis was detected by sectional energy-dispersive spectroscopy (EDS). The Zeta potential was detected by Brookhaven Zataplus. Particle size and size distribution of these NPs were analyzed by dynamic light scattering (DLS, BI-9000AT, Brookhaven). X-ray diffraction (XRD) (λ = 1.54056 Å, Bruker Co., Ltd., Germany) was utilized to detect the crystalline phases of these samples. The hybrid bonding state of the samples were determined by X-ray photoelectron spectroscopy (XPS, Thermo Fisher K-Alpha, America). The UV-vis absorbance spectra of the products were measured by UV-vis spectrophotometry (UV3100, Shimadzu, Japan). The content of Pt in cells, organs and tumors was detected by inductively coupled plasma-mass spectrometer (ICP-MS; NexION 300 D, PerkinElmer Corporation, America). Hydroxyl radical was investigated with DMPO by spin-trapping EPR technique (Bruker EMXplus-10/12 spectrometer, Germany).
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4

Scanning Electron Microscopy of Decapitated Specimens

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The living specimens were decapitated under a continuous variable times stereomicroscope (Stemi 508, Zeiss, Germany), and the heads were fixed in 2.5% glutaraldehyde for 6 h at 4 °C. After rinsing them thrice for 10 min each time with 0.1 M PBS buffer, they were dehydrated in an ascending series of ethanol (30%, 50%, 70%, 80%, 85%, 90%, and 95%) for 20 min at each concentration. Then, they were completely dehydrated twice in 100% ethanol for 20 min each time. Subsequently, the samples were rinsed twice in 100% acetone. After air drying, the samples were critical-point dried (K850, Quorum, England) and mounted with the dorsal-side, lateral-side, and ventral-side on the surface of aluminous stubs with double-sided sticky tape. The sputter coating with gold/palladium was performed with a sputter coater (SC7620, Quorum, England) and subsequently examined with a scanning electron microscope (ΣIGMA, Carl Zeiss, Germany) at an accelerating voltage of 2–6 kV.
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5

Scanning Electron Microscopy of Acrylic Paint

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Scanning electron microscope (SEM) pictures were acquired using a ΣIGMA (Carl Zeiss Microscopy GmbH, München, Germany) scanning electron microscope with an acceleration potential of 5 kV. Acrylic paint film mock-ups were gold-metalized using an Agar Scientific auto sputter coater.
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6

Morphology Analysis of ZnO/TM/PET Fibers

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Scanning electron microscopy (ΣIGMA, ZEISS, Oberkochen, Germany) was used to observe the longitudinal morphology and cross-sectional morphology of ZnO/TM/PET fiber samples to analyze the dispersion of the ZnO/TM composite powder in the fibers. The samples were processed by gold sputtering with an accelerating voltage of 20 kV.
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7

Comprehensive Materials Characterization

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The surface morphology and chemical composition of the samples were examined on ascanning electron microscope (SEM, Zeiss ΣIGMA, Oberkochen, Germany) with an energy-dispersive X-ray spectroscopy (EDS, OxfordINCA Energy, Oxford, UK) attachment by a secondary electron detector using an accelerating voltage of 20 kV. The constituent-phase structure of the samples was determined by X-ray diffraction (XRD, Shimadzu XRD-6100, Kyoto, Japan) with Cu Kα in a scanning range between 10° and 80°. An X-ray photoelectron spectroscopy (XPS, ESCALAB250, Thermo VG, Waltham, NV, USA) with an Al Kα (λ = 1486.6 eV) was used to determine the chemical states of thesamples after sputtering for 60 s to remove the surface contaminants. The binding energies were referenced to the C 1s line at 284.6 eV.
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8

Extraction and Characterization of Fungal Biomass

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Fungal biomass was filtrated from culture medium, washed for 2 or 3 times using 200 mL of ultrapure water. Afterwards, the fungal mycelium was resuspended in 50 mL of ultrapure water, and centrifuged at 10,000 rpm for 15 min at 4 ℃. The suspension was recognized as the solution of BEPS. The culture medium at different culture period was collected, dialyzed (molecular weight cutoff: 3500 Da) against deionized water for 5 days. The obtained solution was designated as SEPS.
Dry weight of fungal mycelia was measured after the biomass was dried in a vacuum freezing dryer for 24 h to a constant weight. Field emission scanning electron microscopy (SEM, Zeiss Σigma, Germany) and energy dispersive X-ray spectrometer (EDS, Oxford Inca, UK) were used to observe the morphology and element composition of the fungal mycelium before and after BEPS extraction.
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9

Comprehensive Characterization of CA Samples

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X-ray fluorescence (XRF, S8 Tiger, Bruker AXS Corporation, China) was used to analyze the major element compositions in the CA samples. The trace elements in the leachate were measured using inductively coupled plasma mass spectroscopy (ICP-MS, Thermo ICAP RQ, Bremen, German). Before elemental analysis, the solid samples were digested in a microwave instrument using the method described in our previous study [25 (link)]. A scanning electron microscope (FE-SEM, ZEISS ΣIGMA, Oberkochen, German), in conjunction with an energy-dispersive X-ray spectrometer (Oxford X-MaxN 20, Shanghai, China) (collectively, SEM-EDS), was applied to observe the particles of iron and REY. The images were captured through a retractable solid-state backscatter electron detector, which was more easily to find REY/iron-containing minerals in view of the bottom position of the periodic table of elements. The specific surface area of CA samples was measured by an Autosorb-iQ analyzer (Quantachrome, Boynton Beach, FA, USA) followed by the BET method. The pycnometer method was used for the density determination of the samples by reference to distilled water. The particle size distribution of three samples was obtained using a laser diffraction analyzer (Microtract S3500, York, PA, USA).
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10

Surface and Morphological Analysis

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The surface chemical analysis was performed by using a Thermo VG Theta Probe XPS spectrometer with a μ-spot monochromatic Al Kα source. A fixed analyzer transmission mode with a pass energy of 150 eV was used to acquire XPS survey spectra; a pass energy of 100 eV was used for the acquisition of XPS high-resolution spectra.
The morphological analysis was performed by TEM (FEI, TECNAI T12, operated at 120 kV) and SEM (Field Emission, Zeiss ΣIGMA, operated at 5–10 kV, 10 μm aperture).
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