Ultra 60
The Zeiss Ultra 60 is a high-performance scanning electron microscope (SEM) designed for advanced materials analysis and characterization. It features a field emission electron source, a high-resolution electron optical column, and sophisticated imaging and analytical capabilities.
Lab products found in correlation
17 protocols using ultra 60
Characterizing Laser-Induced Morphological Changes
Characterizing Fly Ash Composition via SEM, XPS, and ICP-MS
microscopy (SEM) (Zeiss Ultra 60, Carl Zeiss NTS, LLC North America)
was used for imaging the surface morphologies of different fly ashes.
The fly ashes were fixed on stubs with carbon dots and then sputter-coated
with a 2 nm gold layer. Coated samples were examined under an accelerating
voltage of 5 kV at different magnifications. Energy-dispersive X-ray
spectra (EDS) of different fly ashes were also obtained using an energy
dispersive spectroscopy analyzer (XF lash 5060FQ Annular EDX detector,
Bruker, Germany). The binding energies of Na 1s, Mg 1s, Al 2p, K 2p,
Ca 2p, Fe 2p, and Zn 2p in different fly ashes were analyzed by using
X-ray photoelectron spectroscopy (XPS) (ESCALAB250 spectrometer with
an Al Kα source (1486.6 eV)). The detection conditions are 10
kV voltage with a base pressure of 2 × 10–9 Mbar. The XPS characterization was conducted after drying and grinding
the fly ashes. The contents of the metals in the six fly ashes were
measured using an inductively coupled plasma source mass spectrometer
(ICP–MS, 7700, Agilent Technology Co., USA).
Surface and Cross-Section Analysis of PVDF Membranes
Nanofiber Scaffold Mineral Characterization
Characterization of rGO/Fe3O4 Nanocomposites
Characterization of Fabricated Composite Materials
Multimodal Characterization of Fe3O4@NCQDs Nanocomposites
Comprehensive Characterization of Nanomaterials
Bacteria Imaging via Scanning Electron Microscopy
Characterization of PEDOT-PSS Nanocomposite Sensors
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