Scanning electron microscopy of shells coated with gold/palladium (Au:Pd 80:20) using a Quorum 150 TES sputter coater was undertaken by a Tescan MAIA 3 scanning electron microscope (15 kV). For SEM-EDS analysis, the specimens were coated with an automatic SEM carbon coater (Agar Scientific, Stansted, UK). Then the samples were imaged by an EVO MA10 SEM (Carl Zeiss, Cambridge, UK) fitted with a LaB6 electron source. Elemental composition was determined by X-ray spectroscopy maps (20 kV) collected using an Oxford Instrument X-Max 80 detector.
X max 80 detector
Manufactured by Oxford Instruments
Sourced in United Kingdom
The X-Max 80 detector is a compact and high-performance energy-dispersive X-ray (EDX) detector designed for elemental analysis in a range of analytical applications. It features an active area of 80 mm² and provides efficient X-ray detection and resolution. The X-Max 80 is a core component of analytical instrumentation and can be integrated into various systems for material characterization.
Automatically generated - may contain errors
3 protocols using x max 80 detector
1
Scanning Electron Microscopy of Coated Shells
2
Characterization of Silver Nanoparticles
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Silver nanoparticles were characterized by applying transmission electron microscopy (TEM). Samples were deposited onto Graphene Oxide on holey carbon TEM grids (EM Resolutions Ltd, Sheffield, UK) and analyzed in a JEOL 2100F TEM (JEOL, Tokyo, Japan) operating at 200 kV. Images were acquired with a GATAN Orius CCD camera (GATAN, Pleasanton, USA), EDX data were acquired with an Oxford Instruments XMax80 detector (Oxford Instruments, Abingdon, UK). Samples from A. niger culture supernatants (ammonium‐containing mineral medium) and A. niger, A. terreus, and A. oryzae (nitrate‐containing mineral medium) were analyzed.
3
Elemental Analysis of Organic Compounds
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The mass percentages
of carbon, hydrogen, oxygen, nitrogen, phosphorus, and sulfur were
determined at the Iowa State Materials Analysis & Research Laboratory
(see Figures S5 through S10 in theSupporting Information ). Carbon, oxygen, hydrogen, sulfur, and nitrogen
were quantified through elemental analysis. Sulfur and phosphorus
were quantified through energy-dispersive X-ray spectroscopy (FEI
Quanta-250 SEM/EDS equipped with an Oxford Instruments X-Max 80 detector).
of carbon, hydrogen, oxygen, nitrogen, phosphorus, and sulfur were
determined at the Iowa State Materials Analysis & Research Laboratory
(see Figures S5 through S10 in the
were quantified through elemental analysis. Sulfur and phosphorus
were quantified through energy-dispersive X-ray spectroscopy (FEI
Quanta-250 SEM/EDS equipped with an Oxford Instruments X-Max 80 detector).
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