Opus reference library version 7

Encrustations deposited on the polymer samples were dried before the analysis and were ground in an agate mortar. The analysis was done by the Urinary Stone Analyzer ALPHA FTIR spectrometer system (Bruker, Billerica, MA, USA) with the ATR (attenuated total reflection) measurement interface. Spectra were recorded between 4000 and 400 cm⁻¹ (resolution 2 cm⁻¹) for 120 scans and compared to the OPUS™ reference library, Version 7.5 (Bruker, Billerica, MA, USA). Semi-quantitative results were recorded in percentages. The qualitative analysis was based on the comparison of the “spectral fingerprint” of a sample with the spectrum of the reference material (synthetic urine).

Encrustations deposited on silicon wafer samples were dried before the analysis and were ground in an agate mortar. The analysis of the implants was done by polarized light microscopy (BX43 Olympus, Hamburg, Germany) and the Urinary Stone Analyzer Fourier transform infrared spectrometry system FTIR ALPHA (Bruker, Billerica, MA, USA). Spectra were recorded between 2000 and 400 cm⁻¹ (resolution 2 cm⁻¹) for 120 scans and compared to the OPUS™ reference library, Version 7.5 (Bruker, Billerica, MA, USA). Semi-quantitative results were recorded in percentages. The qualitative analysis was based on the comparison of the spectrum of a sample with the spectrum of the reference material.