X-ray powder diffractograms in the 3–40° 2θ range were collected for L-His·Ag on a PANalytical X’Pert Pro automated diffractometer (was PHILIPS, now Malvern PANalytical-Spectris, London, UK) equipped with an X’Celerator detector and an Anton Paar TTK 450 system (Graz, Austria) for measurements at controlled temperature. Data were collected in open air in Bragg–Brentano geometry using Cu Kα radiation without a monochromator.
Ttk 450 system
Manufactured by Anton Paar
Sourced in Austria
The TTK 450 system is a compact and automated total organic carbon (TOC) analyzer designed for the determination of organic carbon content in liquid samples. It measures the total carbon (TC) and inorganic carbon (IC) content, and calculates the total organic carbon (TOC) by subtracting the IC from the TC. The system is equipped with a high-temperature combustion method and a non-dispersive infrared (NDIR) detector for accurate and reliable TOC measurements.
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Lab products found in correlation
2 protocols using ttk 450 system
1
X-ray Powder Diffraction Analysis of L-His·Ag
2
Temperature-Dependent XRPD Analysis of NDI-C6
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VT-XRPD in transmission mode was performed at the Paul Scherrer Institute (PSI) synchrotron radiation facility (Switzerland) at MS-X04SA beamline using a well lled and compacted capillary with NDI-C6 powder. The MS powder diffractometer used works in Debye-Scherrer geometry and is equipped with a solid-state silicon microstrip detector, called MYTHEN (Microstrip sYstem for Time-rEsolved experimeNts). 32 (link) The data were collected with a beam energy of 12.4 keV (1.0 Å). The characterization was executed in a temperature range from 20 C to 195 C, to observe the several transitions that occur during temperature variation.
VT-XRPD in reection mode were performed on a PANalytical X'Pert Pro automated diffractometer with an X'Celerator detector in Bragg-Brentano geometry, using Cu Ka radiation (l ¼ 1.5418 Å) without a monochromator in the 2q range of 3-30.0 under continuous scan mode, step size of 0.0167 , counting time of 24.765 s, Soller slit of 0.04 rad, 40 mA and 40 kV equipped with an Anton Paar TTK 450 system for measurements at a controlled temperature.
VT-XRPD in reection mode were performed on a PANalytical X'Pert Pro automated diffractometer with an X'Celerator detector in Bragg-Brentano geometry, using Cu Ka radiation (l ¼ 1.5418 Å) without a monochromator in the 2q range of 3-30.0 under continuous scan mode, step size of 0.0167 , counting time of 24.765 s, Soller slit of 0.04 rad, 40 mA and 40 kV equipped with an Anton Paar TTK 450 system for measurements at a controlled temperature.
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