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Labram hr evolution raman spectroscope

Manufactured by Horiba

The LabRAM HR Evolution is a Raman spectroscope designed and manufactured by Horiba. It is a high-resolution instrument used for analyzing the molecular composition and structure of materials through Raman spectroscopy.

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2 protocols using labram hr evolution raman spectroscope

1

Photothermal Characterization of PtBA-GNPE Bilayer

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Optical transmittance of the PtBA film (thickness: ~100 µm) and light-absorption spectra of the GNPEs (thickness: ~100 µm) were measured by a Shimadzu UV-2600 spectrometer (Fig. 2c, f). Raman spectrum of GNPs was obtained from a HORIBA LabRAM HR Evolution Raman spectroscope using a Laser (wavelength: 532 nm) (Fig. 2e). Cross-sectional image of the PtBA-GNPE bilayer was taken by a Sirion 600 field emission scanning electron microscope (Fig. 4b). Wettability of the PtBA and GNPEs was evaluated by measuring contact angle via a KRÜSS DSA 25 S drop shape analyzer. Deionized water and diiodomethane were used as test liquids. A customized multi-channel current controller, which is connected to a metal PCB where NIR-LEDs were mounted, was used to adjust the operating current and duration of each LED. Temperature distribution on the surface of the bilayer during photothermal heating in response to light irradiation using NIR-LEDs was measured by a FLIR A6781 MWIR thermal camera (50 frames per second) (Figs. 4e–g and 6b). Relative light intensity of the NIR-LED light was measured at the exposed area (diameter: 4 mm), which is 4 mm distant from the NIR-LED, using a Spiricon SP620U beam profiling camera (Fig. 4e).
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2

Comprehensive Characterization of Thin Films

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The obtained thin films were characterized on a LabRAM HR Evolution Raman spectroscope (HORIBA) at a laser wavelength of 532 nm. Scanning electron microscopy (SEM) images were taken by using a Crossbeam 540 (ZEISS). The thin film thickness measurement was performed by using atomic force microscopy (AFM) on a C3M SmartSPM™‐1000 (AIST‐HT) in tapping mode with an Al reflective side cantilever (NSG30 SS by TipsNano) measuring 125 μm in length and with a resonant frequency of 200–440 kHz. The samples for AFM were prepared on polished glass with the marker line drawn on its surface prior to sputtering, which was then easily removed with ethanol.
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