For SEM observations, C. albicans were incubated on sterile polyvinyl chloride coverslips (with a thickness of 0.13–17 mm and a diameter of 22 mm) in 12-well microtiter plates (Corning Costar; Sigma-Aldrich) with FEN (MIC value), fluconazol (MIC value) and untreated cells for 24 hr at 37℃. Thereafter, the coverslip were washed twice with sterile PBS (0.1M and pH 7.2) and placed in a primary fixative solution (glutaraldehyde 0.15 M 2.5% [vol/vol] in PBS) for 12 hr at 4℃. The samples were then washed with sterile PBS, then treated with the secondary fixative (osmium tetroxide [OsO4 1% w/v]) for 1 hr. The samples were subsequently washed with distilled water, dehydrated in an ethanol series (70% for 10 min, 95% for 10 min, and 100% for 20 min) and air dried overnight in a desiccator [20 (link)21 (link)]. The coverslip was coated twice with platinum vanadium using a sputter ion (Bal-Tec SCD 005; BAL-TEC, Balzers, Liechtenstein), followed by bonding to carbon double-side tape for examination by SEM (JEOL JED-2300; JEOL, Tokyo, Japan).
Jed 2300
Manufactured by JEOL
Sourced in Japan
The JED-2300 is an energy-dispersive X-ray (EDX) detector system designed for use with scanning electron microscopes (SEMs). The core function of the JED-2300 is to analyze the elemental composition of samples by detecting and measuring the characteristic X-rays emitted from the sample surface during electron beam bombardment.
Automatically generated - may contain errors
Lab products found in correlation
Jem 2100f, by JEOL (6 mentions)
Jem 2100, by JEOL (4 mentions)
Jsm 7900f, by JEOL (4 mentions)
Jem arm200f, by JEOL (4 mentions)
Jcm 6000, by JEOL (3 mentions)
Axs system, by Bruker (3 mentions)
Lambda 950, by PerkinElmer (2 mentions)
Spectrum 400, by PerkinElmer (2 mentions)
3600 uv vis nir spectrophotometer, by Shimadzu (2 mentions)
Jcm 6610, by JEOL (2 mentions)
Jsm 6510la, by JEOL (2 mentions)
Jsm 7600f, by JEOL (2 mentions)
Jsm 6335f, by JEOL (2 mentions)
Tristar 2 3020, by Micromeritics (2 mentions)
Smartlab, by Rigaku (2 mentions)
Jsm 6610a, by JEOL (1 mentions)
Jsm 5600lv, by JEOL (1 mentions)
Nicolet is50, by Thermo Fisher Scientific (1 mentions)
Genesys 10s uv vis, by Thermo Fisher Scientific (1 mentions)
Miniflex 2, by Rigaku (1 mentions)
70 protocols using jed 2300
1
Scanning Electron Microscopy of Candida albicans
2
Microstructural and Chemical Characterization of Materials
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Microstructure investigations were carried out using the JSM-6610A (JEOL, Tokyo, Japan) Scanning Electron Microscope (SEM) equipped with a conventional tungsten filament. The microstructure of the samples was observed in the material contrast mode using back-scattered electrons (BSE) detector. An accelerating voltage of 20 kV, a beam current of 38 nA, and a working distance of 10 mm were utilized.
The analysis of chemical elements composition was performed using an energy-dispersed X-ray spectrometer (EDX, EDS) JEOL JED-2300 (JEOL, Tokyo, Japan). The count rate was set to approximately 4500 cps, and the dead time of the detector did not exceed 10. Quantitative analyses of measured chemical composition were determined using JEOL software (JEOL JED-2300 Analysis Station, Tokyo, Japan) with consideration of the ZAF method. Elementary mappings were determined in order to the relative chemical composition distribution visualization of the tested samples. The data acquisition time of elementary mapping was about 1 h for each investigated area. The intensity maps of the chemical elements were characterized by a resolution of 512 × 384 points with the observation field size of 370 μm × 277 μm.
The analysis of chemical elements composition was performed using an energy-dispersed X-ray spectrometer (EDX, EDS) JEOL JED-2300 (JEOL, Tokyo, Japan). The count rate was set to approximately 4500 cps, and the dead time of the detector did not exceed 10. Quantitative analyses of measured chemical composition were determined using JEOL software (JEOL JED-2300 Analysis Station, Tokyo, Japan) with consideration of the ZAF method. Elementary mappings were determined in order to the relative chemical composition distribution visualization of the tested samples. The data acquisition time of elementary mapping was about 1 h for each investigated area. The intensity maps of the chemical elements were characterized by a resolution of 512 × 384 points with the observation field size of 370 μm × 277 μm.
3
Comprehensive Nanoparticle Characterization
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The biosynthesized nanoparticles were characterized to confirm their successful synthesis using a UV-visible spectrophotometer (GENESYS 10S UV/VIS, Thermo Fisher Scientific, United States), Scanning electron microscope (SEM; JSM-5600LV, JEOL, Japan), Transmission electron microscope (JEM-2100, JEOL, Japan), X-ray diffractometer (Miniflex II, Rigaku, Japan) equipped with CuKα radiation source (λ = 1.5406 nm), Fourier transform infrared spectrometer (Nicolet iS50, Thermo Fisher Scientific, United States), and Energy-dispersive X-ray spectrometer (JED-2300, JEOL, Japan) following the standard protocols.
4
Sealers' Surface Ultrastructure Analysis
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The sealers were filled into polytetrafluoroethylene molds (2 mm inner diameter, 5 mm height) and placed either in a 37 °C incubator or in an oven at 100 °C for 30 or 60 s, followed by being transferred to the incubator at 37 °C. Following storage for 48 h, the specimen’s surface was polished using SiC papers to #1200 and osmium-coated. The surface ultrastructure was examined using scanning electron microscopy (SEM; model JSM-7900F, JEOL, Tokyo, Japan), and elemental compositions were analyzed using energy-dispersive X-ray spectroscopy (EDS; model JED-2300, JEOL).
5
Characterizing HA-PLLA Membrane Structure
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A wet HA-PLLA composite membrane was fractured after freezing in liquid nitrogen. The membrane was coated with carbon using a carbon coater (CC-50, Shimadzu). The cross-section of the membrane was observed by scanning electron microscopy with energy dispersive X-ray spectroscopy (EDS; JCM-6000 with JED-2300, JEOL).
6
Characterization of Ni-Based Catalysts
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The acidity of the catalysts was tested by the gravimetric method using NH3 gas as a basic adsorbate. The amount of nickel present in the catalyst was determined by using an atomic absorption spectrophotometer (Perkin Elmer PinAAcle 900 T). The amorphous structure of SBA-15 was analyzed by an X-ray Diffractometer (Rigaku Miniflex 600) using Cu Kα radiation (0.154060 Å). The measurement conditions were in the range of 2θ = 20–80°. The particle sizes of Ni and NiO can be calculated by using the Scherrer equation. The morphology of catalyst surface was characterized by using Scanning Electron Microscope-Energy Dispersive Spectroscopy (JEOL JED 2300) with an electron beam of 15.0 kV. TEM images were determined by a JEOL-JEM-1400 microscope with an electron beam of 120 kV. The pore characteristics (Brunauer–Emmett–Teller) of the catalysts were tested by using a gas adsorption analyzer (Quantachrome NovaWin version 11.0). The pore analysis was conducted using N2 gas at 77.3 K.
7
Characterization of Cellulose Nanofibers and 3D BC-BTF Composites
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Cellulose nanofibers and a 3D network of BC and BTF materials were studied by scanning electron microscopy (SEM; JSM-IT100, JEOL Ltd, Japan) at an accelerated voltage of 10 kV. The surface functional groups of BC and BTF materials were analyzed using Fourier-transform infrared spectroscopy (FTIR; FTIR-4600; JASCO; Japan), energy dispersive spectroscopy (EDS; JED-2300, JEOL Ltd, Japan) and X-ray diffraction technique (XRD Mini Flex 600, Rigaku, Japan). The scattering, transmittance and reflectance spectra of the material were measured from 300 nm to 2500 nm using an infrared spectrometer (LAMBDA 950; PerkinElmer, Inc.; USA) attached to an integrating sphere. The absorbance A was calculated according to the formula A = 1 − R − T. The hydrophilic properties of BTF material were evaluated using water contact angle measurements. The mechanical properties of the materials were measured using a servo control system universal testing machine (Gotech Al 7000M; Gotech, Taiwan).
8
Comprehensive Materials Characterization
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Nanolayered structures and crystalline structures of the prepared samples were identified by a Bruker-AXS system with Cu-Ka radiation (Bruker Company, Karlsruhe, Germany) for X-ray diffraction analysis (XRD). An electrons probe microanalyser JED2300 (JEOLCompany, Tokyo, Japan) was used for detecting the different metals in the products through energy dispersive X-ray spectroscopy (EDX). For studying the thermal behavior of the prepared samples, a thermogravimetric analyzer TA series Q500 and TA series Q600 for differential scanning calorimetry (DSC) (T-A company, New Castle, PA, USA) were used under the flow of nitrogen. FTIR spectroscopy was performed by using a Perkin–Elmer Spectrum 400 instrument starting from 425 cm−1 to 4000 cm−1. For determining the morphology and nanosize of the products, scanning electron microscopy (SEM) and transmission electron microscopy (TEM) JEM 2100F (JEOL Company, Tokyo, Japan) was used with different magnifications. The optical properties were measured for the prepared samples through the diffuse reflectance technique. UV/VIS/NIR Shimadzu 3600 spectrophotometer (Shimadzu, Columbia, MD, USA) was used for measuring the absorbance of liquid and solid samples.
9
Morphological Analysis of Dye-ESM Composites
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To observe the morphology of the dye-ESM composites, SEM was performed using a JCM-6610 (JEOL, voltage: 15 kV) under high vacuum. The dye-ESM composites on the carbon tape were sputtered with gold in vacuo for 2 min and three times. The EDX elemental mapping measurements were performed with an SDD (JED-2300; JEOL, Tokyo, Japan) energy dispersive spectrometer equipped with SEM with a magnification of 1600× g. The homogeneity of erythrosine on the ESM was investigated because iodine was easily detected.
10
Scanning Electron Microscopy Analysis of Cyanobacterial Cell Surface Morphology
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Morphological changes in the cell surface can be identified by scanning electron microscope (SEM) observation. To corroborate the surface attachment of HMs to the cyanobacterial cells, SEM (JEOL, JSM-6510LA) and EDS (energy-dispersive X-ray spectroscopy) (JEOL, JED-2300) analysis were conducted between 2000–5000× magnification. The image was acquired by a secondary electron detector with an accelerating voltage of the electrons of 10–20 kV. After HM adsorption at specific concentrations (Table S1† ), the cyanobacterial cell surface morphology was analyzed by SEM analysis and compared with the surface morphology of the cells without HM adsorption. To obtain an SEM image, the cultures were harvested and lyophilized, and then the dried cells were coated (JEOL JFC-1600, AUTO FINE COATER) with a thin layer of platinum and examined using SEM-EDS. Quantitative analysis and the elemental percentage of HMs were determined by EDS.
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