Jem 3010
The JEM-3010 is a transmission electron microscope (TEM) manufactured by JEOL. It is a high-resolution imaging system designed for advanced materials analysis and research. The JEM-3010 provides a maximum accelerating voltage of 300 kV and offers a wide range of imaging and analysis capabilities for a variety of applications.
Lab products found in correlation
147 protocols using jem 3010
Nanoemulsion Characterization by DLS and TEM
Characterization of PtNPs/MWCNT Nanocomposites
Comprehensive Characterization of CuO Nanoparticles
In Situ Lithiation Dynamics of Sn Nanoparticles
Characterization of AgNP-Encapsulating pNIPAM Nanoparticles
Synthesis of Silver Nanoprisms
Imaging Si nanostructures and bacterial biofilms
Synthesis and Characterization of IONPs
Characterization of Nanomaterials Using Spectroscopy
Characterization of HSA-PEG/PTX Nanoparticles
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