Magnets were ground in a disc mill (DM 200, Retsch, Germany) and ball mill (Pulverisette Premium 7, Fritsch, Germany). X-ray powder diffraction (XRD) patterns of the magnet powders were collected on a Bruker D2 PHASER X-ray. The procedure on characterisation of magnets is described in more detail in the ESI.† Leaching experiments were performed using Thermo Fisher shaker (Type 462-0355). UV-VIS absorption spectra of the leachates of magnets were measured on an Agilent Cary 6000i spectrophotometer and analyzed with Cary WinUV software. The sample preparation for the UV-VIS analysis can be found in the ESI.† A fraction collector CF-2 (Spectrum Laboratories, Inc.) equipped with a drop sensor and the IPC 8-channel peristaltic pump (ISMATEC) was used for sampling during the chromatography studies. Concentrations of elements in solutions were measured by an inductively coupled plasma-optical emission spectrometer (ICP-OES) (PerkinElmer Avio 500) equipped with an axial/radial dual plasma view and a GemCone High Solids nebulizer, which is suitable for analysis of samples with high content of organic matter. The standard solutions and all samples were prepared by dilution with 2 wt% HNO3. Holmium (5 ppm) was used as an internal standard.
D2 phaser x ray
Manufactured by Bruker
The D2 Phaser is an X-ray diffractometer designed for phase analysis and material characterization. It utilizes copper K-alpha radiation to generate X-rays and measures the diffraction patterns of crystalline materials. The core function of the D2 Phaser is to provide qualitative and quantitative phase analysis of powder, thin film, and bulk samples.
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4 protocols using d2 phaser x ray
1
Characterization and Leaching of Magnets
2
X-ray Diffraction Analysis of Materials
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XRD patterns were obtained with a Bruker D2 Phaser X-ray diffractometer using Cu Kα radiation and a LYNXEYE XE-T detector.
3
Characterization of Synthesized Materials
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The structure and phase purity of the synthesized materials were characterized using a Bruker D2 Phaser X-ray diffractometer with a Å copper tube. Using the DIFRACC.EVA V4.3.1.2 software, a semi-quantitative analysis of the diffraction pattern was performed to identify secondary phases. The morphological analysis of the sample was performed using scanning electron microscopy and energy-dispersive X-ray spectroscopy. A field emission electron microscope MIRA 3, TESCAN equipped with a Bruker X-Flash 6–30 detector with a resolution of 123 eV in Mn K was used. The diffuse reflectance spectrum was measured by UV-Vis spectroscopy (Perkin Elmer, Waltham, MA, USA) with 200–1000 nm with an integrating sphere. These spectra were transformed by a Kubelka–Munk model in order to estimate the band gap value.
4
Thin Film X-ray Diffraction Analysis
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Multiple layers of QD solution were drop-cast on a glass substrate,
left to dry, and analyzed in a Bruker D2 Phaser X-ray diffractometer
with Cu Kα radiation (λ = 1.541 Å).
left to dry, and analyzed in a Bruker D2 Phaser X-ray diffractometer
with Cu Kα radiation (λ = 1.541 Å).
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