an Agilent 1100 series HPLC instrument equipped with a reversed-phase
column (Phenomenex Luna C-18, 250 × 4.6 (i.d.) mm) and photodiode
array detector. FT-IR spectroscopy was performed using a NEXUS FT-IR
spectrometer (Thermo Electron Corporation, Dreieich, Germany) equipped
with an attenuated total reflection (ATR) accessory unit and ITR diamond
(smart ITR) experimental setup. Scanning electron microscopy was conducted
using an EVOLS 10 instrument from Zeiss in the high-vacuum mode and
a secondary electron detector. The accelerating voltage was 15 kV,
and the probe current was 50 pA. The working distance was 6.5–9
mm. The samples were glued to the sample stubs using Leit-C carbon
cement and covered with gold using an Agar Scientific automatic sputter
coater.