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3600 uv vis near infrared spectrophotometer

Manufactured by Shimadzu

The Shimadzu 3600 UV-vis near-infrared spectrophotometer is a versatile instrument designed for precise absorbance and transmittance measurements across a wide range of wavelengths, from the ultraviolet to the near-infrared region. It features a high-performance optical system and advanced electronic components to deliver accurate and reliable spectroscopic data.

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2 protocols using 3600 uv vis near infrared spectrophotometer

1

Comprehensive Characterization of Nanocomposites

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The surface and composition study of the synthesized nanocomposites were carried using different spectroscopic methods. The XPS analysis with a binding energy of 284.8 eV for the C 1s level as an internal reference was performed with a Kratos Axis Ultra DLD spectrometer employing an Al Kα monochromatized radiation as an X-ray source. The microstructural morphologies of the samples were examined by HRTEM (JEOL JEM2100). Raman scattering spectra were collected using a Renishaw confocal Raman spectroscope (Renishaw inVia, Gloucestershire GL12 7DW, United Kingdom) with a laser operating at 514.5 nm wavelength and 10 mW power output. The studied area on the sample surface was 2 μm in diameter.
To study the optical properties, the N-CDs and CdTe/N-CDs on the Cu substrate were immersed in ethanol and sonicated for 20 min. The UV-vis absorption spectrum of the resulting solution was recorded with a Shimadzu 3600 UV-vis near-infrared spectrophotometer. The fluorescence emission was measured by a Shimadzu RF-6000 spectrofluorimeter, and the lifetime spectrum was obtained in a FM-4P-TCSPC spectrofluorimeter. The excitation wavelength was 370 nm and the emission wavelength was 428 nm. All measurements were performed at room temperature.
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2

Characterization of Quantum Dot Properties

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UV–vis absorption spectra were recorded with a Shimadzu 3600 UV–vis near-infrared spectrophotometer. PL measurements were performed with a Shimadzu RF-5301 PC spectrofluorimeter. The excitation wavelength was 350 nm with a 3/3 nm slit. PL decay results were measured by an Edinburgh FLS 920 spectrofluorimeter or Femtosecond Laser as excitation resource and oscilloscope as signal receiver. All optical measurements were performed at room temperature under ambient conditions. TEM images were recorded by a Tecnai F20 electron microscope with an acceleration voltage of 200 kV. XRD result was carried out by using the D/max-2500/PC. ICP results were measured by a PE5300DV ICP equipment. Purified QDs powder was used in ICP and XRD measurements. QD powder was obtained by precipitating QD from solution with equal volume of isopropanol and followed by drying in vacuum. We utilized a commercial Ti:sapphire regenerative amplifier (Libra, Coherent) at 800 nm (1.55 eV) with a repetition rate of 1 kHz and pulse duration of ~90 fs to carry out the TA experiments. For broadband measurements, a second-harmonic light source at 3.1 eV was used as the pump beam and an optical parametric amplifier (OperA solo, Coherent) was used to provide a probe beam with tunable wavelength. The relative polarizations of the pump and probe beams were set to be at the magic angle (54.7°).
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