Panalytical x ray diffractometer

The absorption spectrum of Ag–GO was examined over the range of 200–700 nm using UV/Vis/NIR Spectrophotometer (PerkinElmer LAMBDA 750). Fourier transform infrared (FTIR) spectra were obtained on a Nicolet 6700 spectrometer (Thermoscientific, USA) in the range of 4000 to 500 cm⁻¹. X-ray diffraction (XRD) was carried out using Philips PANalytical—X-ray diffractometer using $Cu-k\alpha (\lambda =1.54\mathrm{\AA })$ . The Raman spectra was obtained on In Via RAMAN Microscope, Renishaw, UK (Raman & PL set up), with a 514 nm green (Argon) laser light by applying $1\%$ intensity of the full laser power (20 mW) to avoid the sample damage.

The X-ray powder diffraction data was collected using a Panalytical X-ray diffractometer (Philips X’Pert PRO, Eindhoven, The Netherlands), equipped with Cu−Kα radiation (λ = 1.5406 Å, 40 kV, 40 mA). A sample was evenly packed in a custom-made aluminum holder with a 2 mm depth and scanned from 2θ interval of 5–35° at 0.04° step size with 4° per minute scanning speed. The crystallinity index of different spray-dried cocrystal formulations prepared by the DoE method was calculated using the OriginPro (OriginLab Corporation, Northampton, MA, USA) as previously reported [67 (link)].

The X-ray powder diffraction data were collected using a Panalytical X-ray diffractometer (Philips X’Pert PRO, Eindhoven, The Netherlands), equipped with Cu−Kα radiation (λ = 1.5406 Å, 40 kV, 40 mA). The sample was evenly packed in a custom-made aluminum holder with a 2 mm depth and scanned with a 2θ interval from 2 to 40° at a 0.04° step size with a 4° per minute scanning speed. The amplitude (A) and full width at half maximum (FWHM) of the XRD characteristic peaks were obtained by Gaussian fit using OriginPro software (2020, OriginLab Corporation, Northampton, MA, USA), in order to calculate the peak area.