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2100 tem instrument

Manufactured by JEOL
Sourced in Japan

The JEOL 2100 TEM is a transmission electron microscope (TEM) designed for high-resolution imaging and analysis of samples. It provides a core function of magnifying and projecting an image of the internal structure of thin specimens onto a fluorescent screen or camera. The JEOL 2100 TEM operates at an accelerating voltage of up to 200 kV, enabling the examination of a wide range of materials at the nanoscale level.

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3 protocols using 2100 tem instrument

1

Negative Staining and Transmission Electron Microscopy

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A small portion
(ca. 1 mg) of the lyophilized solid was suspended in a 50% (v/v) ethanol/water
mixture. Negative staining was done by adapting standard procedures36 as follows. A 5 μL drop of the sample
suspension was placed on a 300-mesh nickel-covered carbon film TEM
grid (FCF300-Ni Formvar Carbon Film) from Electron Microscopy Sciences
(Hatfield, PA), allowed to evaporate for 30 s, and then blotted with
filter paper. A 5 μL drop of 1% uranyl acetate dye was then
placed on the grid and blotted immediately. A JEOL 2100 TEM instrument
(JEOL Ltd., Tokyo, Japan) was used with a LaB6 beam source,
a beam strength of 200 kV, and a current density of 30–60 pA/cm3. Images were captured with an Ultrascan 1000 camera (Gatan
Inc., Pleasanton, CA) and processed to derive lamellar spacings with
Digital Micrograph software (ver. 2.11.14.04.0, Gatan Inc.). At least
eight spacing measurements were made at different locations for each
of the self-assemblies and plant phellem tissues, allowing us to determine
mean values and standard errors for each value.
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2

Characterization of Nanoparticle Size

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The MS NPs and IO@MS NPs were deposited on carbon-coated copper grids. TEM images were acquired with a JEOL 2100 TEM instrument (JEOL Ltd, Tokyo, Japan) operating at 200 kV. The software Image J (NIH, Bethesda, MD, USA, public domain) was used to determine the size distribution of the NPs.
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3

Transmission Electron Microscopy for IONP Characterization

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For the morphological studies, transmission electron microscopy (TEM) images of the IONPs in the organic medium were recorded with a JEOL 2100 TEM instrument (JEOL, Tokyo, Japan), operating at 200 kV, with a point-to-point resolution of 0.5 nm.
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