Perkin elmer 240c analyzer

Chemicals were obtained from Sigma-Aldrich (Aldrich chemical Co., Milwaukee, WI, USA). A Griffin melting point apparatus (Griffin, Valdosta, GA, USA) was used to measure melting points (m.p.). A Nicolet IR 300 (Thermo Fisher Scientific, Barrington, RI, USA) was used to measure the infrared spectra. ¹H-NMR and ¹³C-NMR (Varian, Palo Alto, CA, USA) were performed in deuterated dimethyl sulfoxide (DMSO-d₆) using a Varian 300 MHz instrument. Tetramethylsilane (TMS) was used as internal standard. MS spectra were measured using a JEOL-SX-102 electron impact ionization instrument (Joel, Peabody, MA, USA). Evaporation processes were performed under reduced pressure by using a Buchi rotary evaporator (Buchi, Postfach, Flawil, Switzerland). Elemental analyses (C, H, N) were accomplished using a Perkin-Elmer 240C analyzer (Perkin-Elmer, Norwalk, CT, USA). The synthesized compounds were within ±0.4% of the theoretical values. Purity of the newly-synthesized compounds was above 99.6%.

All the reagents and solvents were commercially available and used as received. FT-IR spectra were recorded on a Vector 27 Bruker Spectrophotometer by transmission through KBr pellets containing the ground crystals in the range 4000–400 cm⁻¹. The powder X-ray diffraction patterns (PXRD) were collected at room temperature using a scan speed of 0.1 s/step on a Bruker Advance D8 diffractometer (40 kV, 40 mA) (Bruker, Karlsruhe, Germany) equipped with Cu radiation. Calculated PXRD patterns were generated using Mercury 3.0 [43 ]. Elemental analyses (EA) for C, H, and N were performed on a Perkin-Elmer 240C analyzer (PerkinElmer, Waltham, MA, USA). TGA data were obtained on a STA 449C thermal analysis system at a heating rate of 10 °C min⁻¹ under N₂ atmosphere. Magnetization measurements were performed using a Quantum Design SQUID VSM magnetometer (Quantum Design, Darmstadt, Germany) on polycrystalline samples for all compounds.