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Evo ls 15 electronmicroscope

Manufactured by Zeiss

The EVO LS 15 is a scanning electron microscope (SEM) manufactured by Zeiss. It is designed for high-resolution imaging and analysis of a wide range of samples. The EVO LS 15 uses an electron beam to scan the surface of a sample, generating detailed images with high magnification and resolution. This instrument is suitable for various applications, including material science, life science, and nanotechnology research.

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2 protocols using evo ls 15 electronmicroscope

1

Comprehensive Characterization of Material Samples

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FTIR spectra were recorded
by a Bruker Alpha II spectrometer (4000–500 cm–1). A Bruker D8 advanced diffractometer using Cu Kα radiation
was used for phase identification. Samples were mounted on a flat
steel and scanned from 5 to 70°. A JEOL HRTEM-2100 electron microscope
was used to get HRTEM images and selected area electron diffraction
(SAED) patterns. SEM images were obtained by a ZEISS EVO LS 15 electron
microscope. A Perkin Elmer Lambda 25 spectrometer (200–700
nm) was used to record the absorption spectra. Emission spectra were
recorded using a Perkin Elmer LS 45 fluorescence spectrometer.
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2

Characterization of [MPPyr][DCA]/MIL-101(Cr) Composite

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The IL
loading in the composite was determined by a measurement for which
the IL/MOF composite was washed with acetone solvent to extract all
the IL present in the composite. The infrared (IR) analysis of the
composite was performed before and after washing the sample with acetone.
The washed [MPPyr][DCA]/MIL-101(Cr) composite was then dried in an
oven at 65 °C and weighed, and IL loading was determined. X-ray
diffraction (XRD) analysis of the as-received MIL-101(Cr) and its
composite with [MPPyr][DCA] was performed on a Bruker D2 Phaser instrument.
IR spectra of the samples were collected in transmittance mode at
a spectral resolution of 2 cm–1 in the range of
400 to 4000 cm–1 using a Bruker Vertex 80v spectrometer.
IR peaks were deconvoluted by employing Fityk software using the Voigt
function.37 (link) N2 adsorption isotherms
were measured at −196 °C, from 10–6 to
1 bar, by using a Micromeritics ASAP 2020 accelerated surface area
and porosity analyzer. Prior to these measurements, the as-received
MIL-101(Cr) and its composite with [MPPyr][DCA] were degassed at 150
°C under vacuum for 12 h. Scanning electron microscopy (SEM)
images of the samples were obtained by using a Zeiss Evo LS 15 electron
microscope. Thermogravimetric analysis (TGA) was done on a TA Instruments
Q500 analyzer. The details of these measurements can be found in our
previous report.38 (link)
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