Raman spectra of MWCNT and their derivatives were recorded in a Raman spectrometer (Renishaw, Wotton-under-Edge, UK) in the spectral range 100–3200 cm−1 using a He-Ne laser with a wavelength of 633 nm and power of 17 mW, with the time of exposure to the sample 10 s. The spectra were generated at 5% laser power. Leica confocal microscope resolution was below 2 µm, diffraction grating 1800 lines/mm, 50× magnification.
Raman spectrometer
Manufactured by Renishaw
Sourced in United Kingdom, United States
The Renishaw Raman spectrometer is a laboratory instrument used for molecular characterization. It measures the inelastic scattering of monochromatic light, providing information about the chemical composition and structure of the sample.
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Lab products found in correlation
Escalab 250xi, by Thermo Fisher Scientific (10 mentions)
Escalab 250, by Thermo Fisher Scientific (10 mentions)
S 4800, by Hitachi (8 mentions)
D8 advance, by Bruker (7 mentions)
Dimension icon, by Bruker (4 mentions)
Jem 2100, by JEOL (4 mentions)
Tecnai 12, by Philips (3 mentions)
Asap 2020, by Micromeritics (3 mentions)
Nicolet 6700, by Thermo Fisher Scientific (3 mentions)
Jem 2100f, by JEOL (2 mentions)
Smartlab, by Rigaku (2 mentions)
Ultra 55, by Zeiss (2 mentions)
Nicolet is10, by Thermo Fisher Scientific (2 mentions)
Su8010, by Hitachi (2 mentions)
X pert pro, by Malvern Panalytical (2 mentions)
Tecnai g2 f30 s twin, by Thermo Fisher Scientific (2 mentions)
Geminisem 300, by Zeiss (2 mentions)
Xrd 6000, by Shimadzu (2 mentions)
Cary 5000, by Agilent Technologies (2 mentions)
Lsm 700, by Zeiss (2 mentions)
103 protocols using raman spectrometer
1
Raman Spectra Analysis of MWCNT
2
Raman Spectroscopy of Solid Samples
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The samples (5 mg) were measured by a Raman spectrometer (Renishaw, Gloucestershire, UK) using 785 nm laser excitation (Coherent, Santa Clara, CA, USA) at an intensity of 2 mW and an exposure time of 10 seconds, aimed directly at the sample. The spectrum of the samples was performed at 300–1,800 cm−1 with a resolution of 16×16 µm.
3
Characterization of HSIL Coated ITO Surfaces
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The transmittance spectra of HSILs coated on ITO were recorded using an ultraviolet-visible (UV-vis) spectrophotometer (Cary 5000, Agilent Technologies, Inc., Santa Clara, CA, USA). The Raman scattering spectra of HSILs was carried our using a Raman spectrometer (Model inVia, Renishaw, London, UK) with a 532-nm excitation laser line. Fourier-transform infrared (FTIR) spectra were obtained from FTIR spectroscopy (Frontier, PerkinElmer, Inc., Shanghai, China). The morphological modification of HSILs were taken using atomic force microscope (AFM, Model 5500, Agilent Technologies, Inc., Santa Clara, CA, USA). The X-ray photoelectron spectroscopy (XPS) data were evaluated by a PHI Quantera SXM scanning photoelectron spectrometer microprobe (ULVAC, Kanagawa, Japan). A contact angle analyzer (Kruss, Hamburg, Germany) was utilized to take the surface properties (water contact angle) of samples. The WFs of PEDOT:PSS and PEDOT:PSS-ET (v/v, 1:0.5) films deposited on ITO glass were determined using photoelectron yield spectroscopy (PYS) (Riken-Keiki CO., LTD, Tokyo, Japan). The acidic nature of aqueous solutions were taken by pH meter (Mettler Toledo, Shanghai, China). Field emission scanning electron microscopy (Model Hitachi SU8220, Tokyo, Japan) was used to evaluate the thickness of HSIL and photoactive layer (Figure S1 ).
4
Comprehensive Characterization of Synthesized Materials
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Crystallographic study of the synthesized samples was undertaken through the X-Ray diffraction (XRD) technique using a Bruker D8 ADVANCE system with a Cu tube source and a linear detector (LYNXEYE XE) (kalsruhe, Germany). Raman spectra were recorded on a Raman spectrometer (Renishaw InVia, Gloucestershire, UK), using 514.5 nm laser excitation. A TESCAN environmental scanning electron microscope (VEGA3 XMU, Brno, Czech Republic) with a LaB6 source and Oxford Aztec X-Max 50 EDS detector (High Wycombe, UK), were used for imaging and elemental mapping of the materials. The optical features of all prepared samples were studied using a UV-Vis spectrophotometer UV-2600i (Shimadzu corp., Kyoto, Japan). Current-voltage measurements were performed using an electrochemical workstation (Bio-Logic SAS SP-300, Seyssinet-Pariset, France) under solar illumination (100 mW cm−2), calibrated by a standard silicon solar cell (Model 15159, Abet Technologies, Inc. Milford, CT, USA). The applied electrochemical workstation was composed of an electrochemical cell with a varying applied voltage between the working electrode (synthesized films) and a reference electrode (Hg/HgO) in an aqueous 1.0M NaOH with a Pt wire as counterelectrode.
5
Nucleic Acid Raman Spectroscopy on Silver Films
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For the experimental nucleic acid Raman data, silver films are fabricated by depositing 300 Å of silver using an e-beam evaporator (Temescal BJD, UCSD Nano3 Cleanroom) on a silicon wafer. The scanning electron beam (SEM) image of the surface films can be found in supplementary section 2 . Nucleic acids are deposited at a concentration of 1 mM and are incubated on the silver films overnight. Before measuring the Raman spectra, the samples are rinsed with H2O to remove any large particles. The Raman measurements are acquired using a Renishaw Raman spectrometer at a wavelength of 785 nm. The sample is imaged using a 40x objective and the spectra are recorded with the hyperSpec program. A 60 s acquisition time is used with a Raman spectral range of 550–2000 cm−1. Baseline subtraction is performed to ensure all spectra are aligned with the x-axis.
6
Raman Spectroscopy Protocol for Material Analysis
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A Renishaw Invia Raman spectrometer, equipped with a laser with excitation wavelength of 514.5 nm and 2 mW laser power, a 100Â NA, 0.85 objective lens and a 2400 grooves mm À1 grating was used. The Raman spectra were collected on 10 different spots for each sample to check for sample uniformity.
7
Raman Spectroscopy of Laser-Processed Paper
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The chemical structure of the laser-processed paper was investigated using a Raman spectrometer (inVia Renishaw, Gloucestershire, UK), equipped with a 785 nm laser arranged in backscattering geometry. The investigated wavenumber ranged from 100 to 3200 cm−1. The spectra were collected at selected points and along a line crossing the borders between the functionalized and non-functionalized zones of the sample. The distance between the points during profile measurements was 10 µm. All the measurements were carried out in the air at room temperature.
8
Comprehensive Characterization of 3D-RGO@MWCNT Composite
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X-ray diffraction (XRD) patterns of the as-prepared 3D-RGO@MWCNT composite were obtained using XRD (SmartLab, Rigaku Corporation) with Cu Ka radiation. X-ray photoelectron spectroscopy (XPS, Shimadzy Axis Ultra) was applied to investigate the chemical valence states and compositions of the sample. Scanning electron microscopy (SEM, Hitachi S4800) and high-resolution transmission electron microscopy (HRTEM, JEOL JEM-2100F) images were used for investigating surface topology. The content of sulfur in the S-3D-RGO@MWCNT composite was confirmed using thermogravimetric analysis (TGA, SHIMADZU DTG-60) in Ar atmosphere. Raman spectra were recorded on Raman spectrometer (Raman, Renishaw) using 532 nm radiation.
9
Characterization of Graphene and Perovskite Nanomaterials
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The exfoliated graphene and the lead halide perovskite were characterized by several techniques such as XPS, HRTEM, FESEM and Raman spectroscopy.
The chemical composition of the nanomaterials obtained was studied via XPS, using a SPECS spectrometer (Berlin, Germany) equipped with a Phoibos 150 MCD detector, using a non-monochromatic X-ray source (Al) operating at 200 W. The intensity ratios of the different components were calculated from the area peak after a correction by the transition function of the spectrometer and a non-linear Shirley-type background subtraction. Additionally, graphene crystallinity was evaluated employing a Raman spectrometer from Renishaw, plc. (Wotton-under-Edge, UK), coupled to a confocal Leica DM2500 microscope. The laser used had a wavelength of 514 nm.
The morphology was studied employing a JEOL JEM 2100F (Tokio, Japan) HRTEM, at an operating voltage of 200 kV. Nanomaterials were ultrasonically dispersed in toluene and a drop of dispersion was deposited onto a carbon-coated copper grid, drying it at room temperature. Graphene porosity and perovskites NCs distribution were analyzed by Carl Zeiss AG - ULTRA 55 (Oberkochen, Germany) Field Emission Scanning Electron Microscope.
The chemical composition of the nanomaterials obtained was studied via XPS, using a SPECS spectrometer (Berlin, Germany) equipped with a Phoibos 150 MCD detector, using a non-monochromatic X-ray source (Al) operating at 200 W. The intensity ratios of the different components were calculated from the area peak after a correction by the transition function of the spectrometer and a non-linear Shirley-type background subtraction. Additionally, graphene crystallinity was evaluated employing a Raman spectrometer from Renishaw, plc. (Wotton-under-Edge, UK), coupled to a confocal Leica DM2500 microscope. The laser used had a wavelength of 514 nm.
The morphology was studied employing a JEOL JEM 2100F (Tokio, Japan) HRTEM, at an operating voltage of 200 kV. Nanomaterials were ultrasonically dispersed in toluene and a drop of dispersion was deposited onto a carbon-coated copper grid, drying it at room temperature. Graphene porosity and perovskites NCs distribution were analyzed by Carl Zeiss AG - ULTRA 55 (Oberkochen, Germany) Field Emission Scanning Electron Microscope.
10
Raman Analysis of Plant-Based Meat
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RB-SPI plant-based simulated meat samples were determined by a Raman spectrometer (inVia, Renishaw, London, UK). The method was slightly modified from the research method by Lancelot et al. (2021) [21 (link)]. The spectral conditions are as follows: the excitation wavelength is set at 852 nm, the laser power is 300 mW, the scanning range is 400–2000 cm−1, and each scanning time is 60 s. The Raman spectra of the measured samples are plotted and output after signal accumulation and mean calculation. Raman spectrum processing: Labspec5 software was used for baseline correction and peak search. Phenylalanine (1003 cm−1) was used as the normalization factor to obtain the Raman spectra of plant-based simulated meat with different RB addition levels. PeakFit V4.12 was used to calculate the percentage of each configuration of the RB-SPI plant-based simulated meat disulfide bond.
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