D max iiia diffractometer

SEM images were acquired on Nova NanoSEM 450 (10 kV). TEM images were examined by Tecnai G2-F20 (200 kV). X-ray photoelectron spectroscopy (XPS) measurements were carried out on a Perkin-Elmer model PHI 5600 XPS system; all peaks were standardized to C 1s line at 284.6 eV correction. Powder x-ray diffraction (PXRD) was performed on a Rigaku D/max-IIIA diffractometer (Cu Kα, λ = 1.54056 Å) at room temperature. Electrochemical experiments were conducted on a CHI 760E electrochemical workstation (Shanghai CH Instruments Co., China).

The structures of as-synthesized materials were measured by X-ray diffraction (XRD, Cu Kα, λ = 1.54056 Å) with a Rigaku D/max-IIIA diffractometer at 293 K. The morphology and microstructure of the materials were characterized using a field-emission scanning electron microscope (FESEM, Quanta 200 FEG), and their detailed microstructure was further evaluated by transmission electron microscopy (TEM, Model JEM-2011, JEOL, Japan) with a Rontec EDX system. XPS spectra were obtained using a Thermo Fisher Scientific ESCALAB 250. All of the XPS spectra were calibrated with the C 1s peak at 284.8 eV as the binding energy reference. The electron paramagnetic resonance (EPR) spectra were obtained using a Bruker A300 spectrometer (microwave frequency = 9.74 GHz; modulation amplitude = 2 G; modulation frequency = 50 KHz; time constant = 10 ms; conversion time = 25 ms). The Fourier transform infrared spectroscopy (FTIR) spectra were collected using KBr as the reference sample on a Spectrum Two FTIR spectrophotometer (PerkinElmer, Waltham, USA). The TG spectra were measured using a Labsys evo TG-DTA/DSC (Setram, Lyon, France). The Raman spectra were obtained using a Raman spectrometer (Renishaw, London, UK). N₂ adsorption–desorption isotherms were performed on an A Micromeritics ASAP 2020 analyzer (Micromeritics, Georgia, USA) at liquid nitrogen temperature (77 K).

The absorbance values of equilibrium solutions were measured using a UV-vis spectrophotometer (T6 New Century) at wavelength of 490 nm.
Powder XRD analyses were performed on a Rigaku D/max-IIIa diffractometer with a Ni-filtered CuKa radiation at 30 kV and 20 mA. Orientated samples were scanned from 3° to 70° at 8°/min with a scan step of 0.02°/step.
Scanning electron micrography (SEM) was recorded using a JEOL-IT300 Scanning electron microscope at an accelerating voltage of 10 kV.
Photoluminescence emission (PL) spectra were acquired on a fluorescence spectrophotometer (HITACHI, F4600) over the range of 500−700 nm with a photomultiplier tube operated at 800 V. A 150 W xenon lamp was used as the excitation source, at an excitation wavelength of 488 nm. The scan speed was set at 240 nm/min.
Molecular simulation was carried out under the module “Forcite” of Materials Studio 6.0 software to study the configuration of AO in the surface of LDH. The unit cell (R-3)^{41 (link)} parameters were set at a = b = 3.046 Å, c = 22.78 Å, a = 90°, γ = 90°, and b = 120°^{42 (link)}. A series of 2 × 2 × 1 supercells were built. Three cycles were reiterated with each cycle made of 106 steps.