To determine zinc oxide particles morphology, scanning electron microscope FEI Helios NanoLab 660 (U.S.) was used. The apparatus was equipped with secondary electron detectors: the Everhart-Thornley Detector (ETD) and Through-Lens Detector (TLD). Before measurements, samples were dispersed in ethanol via sonication and then transferred onto carbon films fixed on an aluminum sample holder, followed by drying in air. The measurements were carried out in the high-vacuum mode (7 × 10−4 Pa; RT), in field-free (FF) and high-resolution (HR) modes. The acceleration voltage was 10 kV and the beam current was 0.2 nA.
Helios nanolab 660
Manufactured by Thermo Fisher Scientific
Sourced in United States
The Helios NanoLab 660 is a high-resolution scanning electron microscope (SEM) designed for advanced nanoscale imaging and analysis. It features a field emission electron source and a high-performance electron optical column to deliver exceptional image quality and resolution at the nanometer scale.
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Lab products found in correlation
Amira software, by Thermo Fisher Scientific (2 mentions)
Jem 1200 exii, by JEOL (2 mentions)
Spectrum 1000, by PerkinElmer (2 mentions)
Sem pin stub, by Ted Pella (2 mentions)
K alpha, by Thermo Fisher Scientific (2 mentions)
Bz x710 fluorescence microscope, by Keyence (1 mentions)
Uc6 ultramicrotome, by Leica Microsystems (1 mentions)
Ht7700, by Hitachi (1 mentions)
Jem 2800, by JEOL (1 mentions)
Leap 4000x hr, by Cameca (1 mentions)
Atomic force microscope, by Agilent Technologies (1 mentions)
Quartz cell, by Agilent Technologies (1 mentions)
Cary e 5000, by Agilent Technologies (1 mentions)
Kbr pellets, by PerkinElmer (1 mentions)
X maxn 80 detector, by Oxford Instruments (1 mentions)
Nova nanosem 450, by Thermo Fisher Scientific (1 mentions)
Scios 2, by Thermo Fisher Scientific (1 mentions)
Leo 435 vp, by Zeiss (1 mentions)
Ultra plus, by Zeiss (1 mentions)
Nova 600 nanolab, by Thermo Fisher Scientific (1 mentions)
19 protocols using helios nanolab 660
1
Zinc Oxide Particle Morphology Analysis
2
CLEM Analysis of Neurosphere Cells
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For CLEM analysis, dissociated neurospheres were reseeded on gridded glass-bottom µ-dishes (ibidi) or gridded coverslips (Matsunami) after coating them with poly-l -ornithine and fibronectin. On day 7–10 of culture, cells were fixed in 2% paraformaldehyde, 0.5% glutaraldehyde, and 50 mM sucrose in 0.1 M phosphate buffer. Brightfield and fluorescent images were then taken using a BZ-X710 fluorescence microscope (Keyence). Next, cells were fixed in 2% glutaraldehyde and 50 mM sucrose in 0.1 M phosphate buffer, followed by post fixation with 1% osmium tetroxide. Fixed cells were dehydrated and embedded in Epon812 (Oken Shoji). Ultrathin sections were cut with an ultramicrotome UC6 (Leica) and mounted on glass coverslips. Sections were stained with uranyl acetate and lead citrate, and these coverslips were then coated with carbon using a carbon coater CADE-4T (Meiwa Fosis). Specimens were examined with a scanning electron microscope Helios NanoLab 660 (FEI).
3
Characterizing PET Plastic Degradation
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UV-pretreated, amorphous PET (Goodfellow Corporation) was inspected for degradation after culturing with the full consortium incubated at 30°C in LCFBM for 40 days. The PET plastic samples were removed from media and rinsed twice in a 0.1% saponin solution followed by sterile molecular biology-grade water via vortexing. After rinsing, a 70% ethanol rinse was used to sterilize all surfaces of plastic. Samples were dried for 24 h before imaging. Half of the samples were immediately imaged after drying, while half were treated with a 100-μg/ml proteinase K treatment to remove tightly adherent bacteria and then sterilized again in 70% ethanol prior to imaging. Samples were submerged in 2% osmium tetraoxide in an ice bath for 3 h. The samples were then dehydrated in graded EtOH (50, 75, and 100%) baths for 15 min each before undergoing critical point drying with CO2. Dried samples were sputter coated with gold using a Leica ACE600 coater prior to imaging with an FEI Helios Nanolab 660 DualBeam focused ion beam (FIB)-SEM and thermoluminescent dosimeter (TLD) detector operating at an accelerating voltage of 2 kV with 1 μs dwell time. SEM was performed at the Multi-Scale Microscopy Core (MMC) with technical support from the Oregon Health and Science University (OHSU)/FEI Living Lab and the OHSU Center for Spatial Systems Biomedicine (OCSSB).
4
Ultrastructural Analysis of Cerebellar Neurons
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Mice were fixed by cardiac perfusion with 4% paraformaldehyde in 0.1 M phosphate buffer (pH 7.4). Cerebellar sections were post fixed with 2% paraformaldehyde and 2% glutaraldehyde in 0.1 M phosphate buffer (pH 7.4) overnight followed by post fixation with 1% OsO4, dehydration with a graded series of ethanol and embedding in Epon812 (Oken Shoji). Ultrathin sections were cut with an ultramicrotome UC6 (Leica Microsystems), stained with uranyl acetate and lead citrate and examined with a transmission EM HT7700 (Hitachi). For volume EM, images were taken with a focused ion beam scanning EM (FIB-SEM) Helios Nanolab 660 (FEI Company). Epon blocks were milled by a focused ion beam and a serial block-face for every 20 nm was imaged using a backscattered electron detector (MD detector) at an acceleration voltage of 2.0 kV and a current of 0.4 nA. 3D reconstruction was performed using Amira software (FEI Company).
5
Microstructural Analysis of Ga- and N-faced GaN
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Microstructural characteristics of the surface and subsurface layers of Ga- and N-faced GaN samples were detected by cross-sectional transmission electron microscopy (XTEM, Jeol JEM-2800, Tokyo, Japan) analysis. The XTEM lamellae of the observation areas were cut along the (10−10) crystal plane by using a focused ion beam system (FIB, Helios NanoLab 660, FEI, Hillsboro, OR, USA). Before FIB cutting, an epoxy polymer protective layer with a thickness of at least 100 nm was deposited onto the GaN sample surface to protect the surface from the possible structural damage results of the subsequent attack of the high-energy ion beam. The HRTEM lattice images were obtained from the surface and subsurface of the GaN samples within 10 nm × 10 nm areas. XPS analysis was performed on the surfaces of Ga- and N-faced GaN samples employing an XPS system (Thermo Scientific K-Alpha+, East Grinstead, UK) with an Al Kα x-ray excitation source (1486.6 eV).
6
Atom Probe Tomography Sample Preparation and Analysis
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Atom probe specimens were prepared from the above-specified samples by focused ion beam (FIB) techniques using a Helios Nanolab 660 (FEI, Hillsboro, OR, USA) dual-beam microscope. The preparation was carried out according to a standard protocol [30 (link)] and the final cleaning step was carried out with 5 kV and 40 pA. Laser-assisted APT measurements were conducted using a LEAP 4000X HR (Cameca, Madison, WI, USA). The field evaporation parameters for the different sample materials are summarized in Table 1 . The IVAS 3.8.0 software (Cameca, Madison, WI, USA) was used for reconstruction, employing the shank angle reconstruction protocol. An overview of the individual measurements is provided in Table 2 . Pearson correlation coefficients were calculated as a first measure of potential clustering with 50 ion bins.
7
Characterization of Cu@Pt Nanoparticles
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In this work, the UV–VIS absorption spectra of the synthesized Cu@Pt nanoparticles were obtained from a spectrophotometer Cary E 5000 in the range of 300–800 nm using a quartz cell with 10 mm of optical path length (Agilent, USA). FTIR spectra of the samples were measured using Perkin-Elmer Spectrum 1000, in attenuated total reflection mode, and using the spectral range of 4000–380 cm−1. The study also used one instrument in the diffuse reflectance mode at the resolution of 4 cm−1 in KBr pellets (Perkin Elmer, USA). The obtained Cu@Pt nanoparticles were characterized using an Atomic Force Microscope (Agilent, USA). The size and morphology of the synthesized Cu@Pt nanoparticles were characterized using a Transmission Electron Microscope JEOL JEM 1200 EXII, operating at 200 kV. Moreover, we used a Scanning Electron Microscope (HR SEM) Helios NanoLab 660 (FEI). SEM imaging was performed in the immersion mode (Thermo Fisher Scientific, USA).
8
Characterization of Biosynthesized Metal Oxide Nanoparticles
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In this work, the UV–VIS absorption spectra of the biosynthesized Au-CuO and CuO-ZnO nanoparticles were obtained from a spectrophotometer Cary E 500 in the range of 300–800 nm using a quartz cell with 10 mm of optical path length. The chemical structure of biosynthesized Au-CuO and CuO-ZnO nanoparticles was investigated using Perkin-Elmer Spectrum 1000. Spectra were recorded in KBr pellets in th range of 380–4000 cm−1. The spectrum was adjusted at a resolution of 4 cm−1. The biosynthesized Au-CuO and CuO-ZnO nanoparticles were characterized using an Atomic Force Microscope (Agilent 5500). The morphology and size of the biosynthesized Au-CuO and CuO-ZnO nanoparticles were characterized using a Transmission Electron Microscope JEOL JEM 1200 EXII, operating at 200 kV and Scanning Electron Microscope (HR SEM) Helios NanoLab 660 (FEI).
9
Membrane Cross-Section Analysis by FIB-SEM
10
Particle Morphological Analysis via SEM
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