The largest database of trusted experimental protocols

Atomic force microscope

Manufactured by Bruker
Sourced in United States, Germany

The Atomic Force Microscope (AFM) is a high-resolution scanning probe microscope used to analyze the surface topography and properties of materials at the nanoscale. The AFM uses a sharp, micro-sized probe that scans across the sample surface, detecting minute changes in force, which are then used to construct a detailed 3D image of the surface.

Automatically generated - may contain errors

26 protocols using atomic force microscope

1

Aloe Vera Impact on Hydrogel Topography

Check if the same lab product or an alternative is used in the 5 most similar protocols
The surface topography of samples was characterized using atomic force microscopy (AFM). Analysis was performed using Bruker Atomic Force Microscope (Billerica, MA, USA), FastScan head type. Measurement range: XY: 30 μm, Z: 3 μm. Measurement mode: PEAKFORCE QNM SCM using tube T (f: 75 kHz, k: 2.8 N/m, length: 225 μm). A study was also conducted to determine the impact of Aloe vera addition on the topography of the hydrogel materials. Images presented in the article are representative of the whole surface of the hydrogels.
+ Open protocol
+ Expand
2

Measuring Ultrasmall MoS2 Quantum Dots

Check if the same lab product or an alternative is used in the 5 most similar protocols
A droplet of 20 μL of ultrasmall MoS2 QDs was deposited on freshly cleaved mica and incubated for 2 min, rinsed with Milli-Q water, and then dried with air. An atomic force microscope (Bruker, Germany) was operated in air at a scan rate of 1 Hz. AFM cantilevers were calibrated on the calibration samples prior to measurements. Selected areas were analyzed for the thickness measurement of the ultrasmall MoS2 QDs.
+ Open protocol
+ Expand
3

Atomic Force Microscopy of PNF Samples

Check if the same lab product or an alternative is used in the 5 most similar protocols
PNF samples with or without
metal ions were diluted in 10 mM HCl (1:1000), applied onto freshly
cleaved mica surfaces and allowed to dry in air. These samples were
then investigated by an atomic force microscope (Bruker Corp., USA)
in the Scanasyst-air mode, and tapping mode. The images were analyzed
using Nanoscope 1.5 software (Bruker).
+ Open protocol
+ Expand
4

Characterization of MoSx thin films

Check if the same lab product or an alternative is used in the 5 most similar protocols
X-ray photoelectron spectrometer (ThermoFisher ESCALAB250X) was used to analyze the composition and valence states of the films under room temperature. The laser Raman spectrometer (HORIBA Jobin Yvon LabRAM HR Evolution) was used for measurement, and the wavelength and raster of the laser were 532 nm and 1800 gr·nm−1, respectively. The scanning image of MoSx was obtained using an atomic force microscope (Bruker). The spectral response curve of the solar cells was tested using the IPCE testing system (CROWNTECH) of the solar cells. The current density–voltage (JV) was measured using the semiconductor device parameter analyzer (Agilent B1500A).
+ Open protocol
+ Expand
5

PEGylation of Pristine Nanographene Oxide

Check if the same lab product or an alternative is used in the 5 most similar protocols
PEGylation of pristine nGO (single layered, with ∼200 nm lateral size), as well as other carbon-based nanomaterials, was performed based on previously established methods47 (link). In brief, 1-Ethyl-3-(3-dimethylaminopropyl)carbodiimide (EDC) (20 mM) was introduced into a pristine nGO suspension (∼500 μg ml−1) and sonicated for 15 min, after which mPEG-NH2 was added and allowed to react overnight. The final products were harvested by centrifugation at 70,000g after repeated washing with deionised water. Nanomaterial morphologies were imaged using an atomic force microscope (Bruker), a scanning electron microscope and a transmission electron microscope (JEOL). More detailed characterizations of nGO and nGO-PEG are included in Supplementary Figs 23 and 24; Supplementary Tables 2 and 3 and our previous study13 (link).
+ Open protocol
+ Expand
6

Tapping Mode AFM Imaging of Hydrogel Samples

Check if the same lab product or an alternative is used in the 5 most similar protocols
Tapping mode AFM images were collected using an Innova Atomic Force Microscope (Bruker, Camarillo, CA) under ambient conditions. The 2 wt% h9e hydrogel solution was diluted with DI water to a final concentration of 0.004 wt%. Samples were prepared by spotting 20 μl solution with and without PGworks solution on 12-mm mica discs that were then settled at room temperature for at least 3 hours until the solution dried completely. Drive frequency of the silicon tip was tuned and fixed at 200–250 kHz before engagement. Amplitude profiles were obtained using Nanoscope Analysis software V1.40. All collected images were flattened before further analysis.
+ Open protocol
+ Expand
7

Microrobots Swimming Behavior Analysis

Check if the same lab product or an alternative is used in the 5 most similar protocols
SEM images of the swimming microrobots were acquired with a double-beam electron microscopy (Scios2, Thermo Fisher Scientific, USA) at an operating voltage of 10 keV. The samples were coated with a 5-nm carbon layer to improve the conductivity (Leica EM ACE600 Carbon Evaporator). The bright-field and fluorescence microscopic images of swimming microrobots were captured at 25 frame·s−1 by an inverted optical microscope (Olympus, IX73, Japan) coupled with a Point Grey CCD camera (FLIR, GS3-U3-51S5C/M-C, USA). These video data were analyzed using ImageJ to obtain the trajectories of swimming microrobots. The magnetic hysteresis curve of samples was obtained using a vibrating sample magnetometer (Lake Shore Cryotronics 7404, USA). The viscous force between swimming microrobots and the inner wall of vein was measured by an atomic force microscope (Bruker Instruments, Innova, USA).
+ Open protocol
+ Expand
8

Atomic Force Microscopy of Asphalt Surfaces

Check if the same lab product or an alternative is used in the 5 most similar protocols
The atomic force microscope (Bruker, Nasdaq, Ettlingen, Germany) uses a microprobe to approach the asphalt surface and generate an interaction force with the asphalt surface. The computer captures the micro force and draws an atomic resolution image of the asphalt surface so that the microsurface morphology and microstructure of the asphalt surface can be observed. The smoothness of the AFM specimen has a large influence on the test results. Therefore, we make the asphalt drops on the silicon sheet, and then the oven is heated for a moment to ensure the smooth surface of the specimen. The atomic force test was carried out at an ambient temperature of 25 °C. The instrument used in this study is Bruker Dimension Icon. This research observes and analyzes SBS, SBS-PAV, 5%bio, 6%SBR, 6%SBR + 5%bio.
+ Open protocol
+ Expand
9

Comprehensive Characterization of Thin Films

Check if the same lab product or an alternative is used in the 5 most similar protocols
The topography images and the height profiles were obtained by a Bruker atomic force microscope with tapping mode. Raman spectroscopy was carried out at room temperature by a LabRAM HR Evolution (Horiba). The adsorption coefficient was calculated with a light source provided by QuantX 300 which was monitored by a laser power meter PM110D (THORLABS GmbH). A monochromatic Al Kα source with an energy of 1486.6 eV was used to collect the surface information of the samples about the core-levels and valence levels. During photoelectron spectroscopy acquisition, samples were under a bias of 5 V to obtain the correct secondary electron cut-off. The current-voltage (I-V) characteristics were measured at room temperature, using a Keithley 2636 A connected to a probe station, with the tube electrode grounded.
+ Open protocol
+ Expand
10

Morphological Characterization of Gels

Check if the same lab product or an alternative is used in the 5 most similar protocols
Morphological
analysis was
conducted using a Bruker atomic force microscope operating in the
Peak Force mode with a probe. A thin layer (∼1 mm) of a gel
was sliced using a razor blade and was then placed on a clean microscope
cover glass. The sample was then allowed to dry in a desiccator at
RT for at least 1–2 h. AFM scans were performed with a scan
rate of 0.5 Hz, at 512 × 512 pixels resolution, and also first-order
flattened.
+ Open protocol
+ Expand

About PubCompare

Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.

We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.

However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.

Ready to get started?

Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required

Sign up now

Revolutionizing how scientists
search and build protocols!