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Pe 1600 ftir spectrometer

Manufactured by PerkinElmer

The PE-1600-FTIR spectrometer is a Fourier Transform Infrared (FTIR) spectrometer manufactured by PerkinElmer. It is designed to analyze the infrared absorption spectrum of a sample, providing information about the molecular composition and structure of the material.

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7 protocols using pe 1600 ftir spectrometer

1

Polymer Surface Characterization and Enzyme Immobilization

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The changes in the structure of the polymers, and the effect of photo crosslinking and the immobilization of the enzyme were identified from the Fourier Transform Infrared (FTIR) spectra recorded in the frequency range of 500–4000 cm-1 using a Perkin-Elmer PE 1600 FTIR spectrometer. The elemental composition of the polymers’ surfaces after the immobilization were determined using a scanning electron microscope (SEM) equipped with a energy dispersive x-ray spectroscope (EDAX) (JEOL JSM 5600 LSV model, supplied by JEOL, Tokyo, Japan).
Contact angle of these polymers were measured using a Goniometer (Kruss germany) with Milli-Q water (Millipore grade). The images obtained were analyzed with a Digital Scrapbook Artist 2 Software (DSA2) to determine the static and dynamic contact angles (SW4001), with an accuracy of ±0.1°.
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2

Characterization of Immobilized Lipase Activity

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LIP was placed in a vial containing 25 mM of phosphate buffer, and incubated at different temperatures (25, 40, 60, 80 and 100°C) for one hour. The FTIR spectrum were recorded in the frequency range of 400–4000 cm−1 by ATR mode using Perkin Elmer PE 1600 FTIR spectrometer.
The activity of LIP of size 1×1 cm was measured at different pH values (ranging from 5 to 10 in steps) of one and at different temperatures, (ranging from 30 to 100°C in steps of 10°C). The activity of the free lipase in solution was also measured at the above mentioned pH and temperature conditions. The free lipase and LIP were stored at 4°C and the activity of the enzyme was monitored once in every 5 days for a total period of 40 days to check the storage stability.
The surface topography and the roughness of the UP and LIP surfaces mounted on a piezo electric scanner were measured with a nanoscope III atomic force microscope (3100 Controller, di Digital Instruments, Veeco, California) equipped with an ADCS control, in contact mode with a silicon nitride cantilever.
Sessile drop technique [19] (link) was employed to measure the contact angle of these polymers with a Goniometer (Kruss, Germany) using Millipore grade distilled water.
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3

Comprehensive Characterization of Activated Carbon Quantum Dots

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All reagents and chemicals were purchased either from Fluka company (Switzerland) or Merck company (Germany). Both A-CQDs and A-CQDs/W samples were characterized by following methods; Fourier-transform infrared (FT-IR) spectroscopy of samples recorded using KBr pellets which were performed by PerkinElmer PE-1600-FTIR spectrometer. X-ray diffraction (XRD) patterns obtained using X′PretPro diffractometer, Panalytical-Holland, with Cu Kα radiation (λ = 1.54 A). Thermogravimetric analysis (TGA) performed by a TGA Q 600 analyzer, TA-America, under Ar flow at a heating rate of 20 ºCmin−1. UV–vis’s spectrophotometry of samples measured using Shimadzu UV 2100 151PC UV–Visible spectrophotometer at room temperature. Field emission scanning electron microscope (FE-SEM) imaging was carried out using a MIRA III, TESCAN-Czech Republic. Transmission electron microscopy (TEM) imaging technique was performed by an EM 208S electron microscope and conducted at 100 kV. energy-dispersive X-ray spectroscopy (EDX) analysis was carried out on a SIGMA VP 500 (Zeiss) microscope equipped with an EDX measurement system. 1HNMR and 13CNMR evaluations were carried out with a BRUKER DRX-250 AVANCE spectrometer at 250.0 MHz and 62.5 MHz.
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4

Characterization of Drug-Loaded Polymeric Nanoparticles

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Size distribution of the nanoparticles was determined by Zetatrac Particle size analyzer (Microtrac Inc., USA) at 780 nm with a back-scattering angle of 180°. 1 mg/ml of drug loaded polymeric nanoparticles was suspended in distilled water to reach a final concentration of 100 μg/ml and used for the analysis. Morphology of the nanoparticles was visualized under a transmission electron microscope (Philips/FeiCM-20). Nanoparticles (P1–P5) were mixed with KBr pellets (at a ratio of 1:20) and the infra-red spectrum was recorded from 4000–400 cm1 with Perkin-Elmer PE1600 FTIR spectrometer. Thermal stability of the nanoparticles was determined by differential scanning calorimeter (Netzsch DSC 204) and thermo gravimetric analyzer (TGA Q500V20.10 Universal TA instrument) in a nitrogen atmosphere from 10 to 140 °C and 30–930 °C respectively at a heating rate of 10 °C/min. 1H NMR (Nuclear magnetic resonance spectroscopy) spectrum of the material was measured (Bruker 500 MHz spectrometer) with 10 mg of sample dissolved in D2O and a drop of TFA. Molecular weight of the polymer was determined by using gel permeation chromatography with tetrahydrofuran as the mobile phase (flow rate of 1 mL/min at 35 °C), and polystyrene (Easical, Polymer laboratories, UK) as internal standard.
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5

Comprehensive Characterization of Nanomaterials

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All chemicals and solvents were purchased from Merck (Germany) or Fluka (Switzerland). The fourier-transform infrared spectroscopy (FT-IR) spectra of the samples were recorded with the KBr pellet method by PerkinElmer PE-1600-FTIR spectrometer. A SIGMA VP 500 (Zeiss) microscope equipped with an EDX measurement system was used to record field emission scanning electron microscope (FESEM) imaging and energy-dispersive X-ray spectroscopy (EDX) analysis. Transmission electron microscopy (TEM) images were obtained using a SIGMA VP 500 (Zeiss) microscope. X-ray diffraction (XRD) spectra were carried out using an X-ray diffractometer (PANalytical X'Pert PRO, Netherlands) with Cu Kα radiation (λ = 1.54 Å). An ESCALab MKII (Thermo Fisher Scientific, USA) spectrometer with Al Kα (1.4866 keV) as the X-ray source was used to record X-ray photoelectron spectroscopy (XPS). Zeta potential was measured using a Zetasizer Nano-ZS, Model ZEN3600 (Malvern Instruments Ltd, Malvern, UK).
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6

Characterization of Tungsten Catalysts

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All chemicals and solvents were supplied from Fluka (Switzerland) or Merck (Germany). We used an ESCALab MKII (Thermo Fisher Scientific, USA) spectrometer with Al Kα (1.4866 keV) as the X-ray source to determine X-ray photoelectron spectroscopy (XPS). The 1H NMR and 13CNMR analyses were carried out with a BRUKER DRX-250 AVANCE spectrometer at 250.0 MHz. The optical emission spectrometer inductively coupled plasma (Varian Vista MPX ICP-OES Axial) was used to measure content of W in the catalysts. X-ray diffraction (XRD) spectra were obtained on a Siefert XRD 3003 PTS diffractometer with Cu Kα radiation (λ = 1.54 Å). Thermogravimetric analysis (TGA) was recorded using a TGA Q 50 analyzer under N2 flow at a heating rate of 10 °C min−1. The optical characteristics of samples were measured by Shimadzu UV 2100 151PC UV–Visible spectrophotometer at room temperature. Field emission scanning electron microscope (FE-SEM) imaging and energy-dispersive X-ray spectroscopy (EDX) analysis were carried out on a SIGMA VP 500 (Zeiss) microscope equipped with an EDX measurement system. A Philips EM10C 200 kV microscope was used to record transmission electron microscopy (TEM) images. The fourier-transform infrared spectroscopy (FT-IR) spectra of the samples were recorded with the KBr pellet method by PerkinElmer PE-1600-FTIR spectrometer.
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7

Characterization of Nanomaterials: Comprehensive Protocols

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Used solvents and chemicals were supplied from Fluka (Switzerland) or Merck (Germany), and used without any further purification. Deionized (DI) water was applied in all tests. The Fourier-Transform Infrared Spectroscopy (FT-IR) spectra of the samples were recorded with the KBr pellet method by PerkinElmer PE-1600-FTIR spectrometer. Transmission electron microscopy (TEM) was investigated on an EM 208S (PHILIPS) 100 kV microscope with tungsten filament and Zeiss‐EM10C (Germany) operating at 100 kV with samples on formvar carbon coated grid Cu mesh 300. The prepared samples were investigated by field emission scanning electron microscope (FESEM) (FESEM TESCAN MIRA 3, Czech). The 1H NMR analysis was carried out with a BRUKER DRX-250 AVANCE spectrometer at 250.0 MHz. The optical characteristics of samples were measured by Shimadzu UV 2100 151PC UV–visible spectrophotometer at room temperature. Energy-dispersive X-ray spectroscopy (EDX) analysis were carried out on a SIGMA VP 500 (Zeiss) microscope equipped with an EDX measurement system.
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