8101m ft ir

Proton nuclear magnetic resonance (¹HNMR) spectra were tested at 25°C via ¹HNMR (400 mHz) Bruker spectrometer (Bruker, Ettlingen, Germany). Fourier transform infrared (FT-IR) spectra of the samples were recorded by Shimadzu 8101M FT-IR (Shimadzu, Kyoto, Japan) at the wavenumber ranges of 400 to 4000 cm^–1. Laser-scattering technique (Zetasizer Nano ZS90; Malvern Instruments, Malvern, UK) were used to measure the average diameter at 25°C. A vibrating sample magnetometer (VSM; AGFM, Kashan, Iran) was used to probe the magnetic properties of nanoparticles at ambient temperature. The surface morphology and size of nanocarriers were observed by a field emission scanning electron microscope-energy dispersive X-ray (FESEM-EDX; S4160 Hitachi, Japan).

The scanning electron microscope (SEM) images were obtained using an FEI Quanta 450 (USA). Dynamic light scattering (DLS) experiments were performed utilizing a Zetasizer Quinta Nano ZS90 (Malvern Instruments, Malvern, UK) at room temperature. Samples were prepared as 0.5% (w/v) solutions in DDW.
The Fourier transform infrared (FTIR) spectrum of the Fe₃O₄ NPs was obtained with a Shimadzu 8101 M FTIR (Kyoto, Japan) using the potassium bromide (KBr) pellet technique. The powder X-ray diffraction (XRD) pattern of the Fe₃O₄ NPs was obtained using a Siemens D5000 diffractometer (Aubrey, TX, USA) and an X-ray generator (CuKα radiation with λ = 1.5406 Å) at room temperature [31 (link)].

The FTIR spectrum of samples was obtained using Shimadzu 8101M FTIR (Kyoto, Japan) at ambient conditions. The samples were mixed with potassium bromide (KBr) and pressed to form a pellet. SEM (Jeol JSM-6390 SEM) and EDX detector (Oxford Link SATW ultrathin window) equipped SEM were applied to obtain SEM micrographs and semi-quantitative elemental analysis. The samples were coated with conductive elements to avoid any interferences with the imaging and analyzing process. A TEM microscopy (Zeiss Leo q06) was used to provide proper TEM images from the NPs at 200 kV accelerating voltage. The NPs were dispersed in solution with low concertation and a small amount of the dispersed NPs (10 µL) was poured on the TEM grid and allowed to dry. A Zetasizer Nano ZS90 was applied to measure the hydrodynamic size and zeta potential of NPs at RT. The UV-vis spectrum of the synthesized NPs was recorded using a spectrophotometer (Shimadzu 1650 PC UV-vis spectrophotometer. Kyoto, Japan). Siemens D5000 diffractometer (Aubrey, Texas, United States) was applied to record the X-ray diffraction (XRD) pattern of the synthesized NPs.