S 4000 scanning electron microscope
The S-4000 scanning electron microscope is a high-performance instrument designed for advanced materials analysis. It utilizes a focused electron beam to scan the surface of a sample, providing detailed images with high magnification and resolution. The S-4000 is capable of resolving features down to the nanometer scale, making it a valuable tool for researchers and scientists in various fields of study.
Lab products found in correlation
4 protocols using s 4000 scanning electron microscope
SEM Imaging of Calu-3 and S. aureus
SEM Analysis of BMSC Morphology on Acellular Dermal Matrix
Nanoparticle Characterization via DLS and SEM
SEM Characterization of SWCNTs
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