The acidity (pH) reading was directly examined by a digital pH meter (MP 220, Metler Toledo, Greifensee, Switzerland) of film solutions [40 (link)]. The turbidity of the films was diluted 50 times in PBS (0.01 M, pH 7.0) as a reference and evaluated at 600 nm with a UV-2550 ultraviolet-visible spectrophotometer (Shimadzu Co., Shanghai, China) [39 (link)].
Uv 2550 ultraviolet visible spectrophotometer
Manufactured by Shimadzu
Sourced in China, Japan
The UV-2550 is an ultraviolet-visible spectrophotometer manufactured by Shimadzu. It is designed to measure the absorbance or transmittance of light in the ultraviolet and visible regions of the electromagnetic spectrum.
Automatically generated - may contain errors
Lab products found in correlation
Xsam800, by Shimadzu (1 mentions)
D max 2500, by Rigaku (1 mentions)
Jem 2100f system, by JEOL (1 mentions)
F 2500 fluorescence spectrophotometer, by Hitachi (1 mentions)
Smartlab x ray diffractometer, by Rigaku (1 mentions)
Axis ultra dld x ray photoelectron spectrometer, by Shimadzu (1 mentions)
Avance 3 500, by Bruker (1 mentions)
4 protocols using uv 2550 ultraviolet visible spectrophotometer
1
Evaluating Film Solution Acidity and Turbidity
2
Structural Characterization of Al-TiO2 Nanoparticles
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The crystalline phases of the samples were identified using X-ray diffractometer (XRD, Rigaku D/max-2500) with Cu Kα radiation at a wavelength of 1.5406 Å operated at 40 kV and 30 mA. To determine the bonding state of the Al-TiO2 nanoparticles calcined at 450 °C, X-ray photoelectron spectroscopy (XPS) measurements were performed by using a KRATOS X SAM 800 X-ray photoelectron spectrometer. Raman spectra of powdered samples were recorded at room temperature with a LabRAM HR 800 high-resolution Raman spectrometer (Horiba-Jobin Yvon) using a He-Ne laser (λ = 532 nm). The particles morphology and structure were investigated by field-emission scanning electron microscope (FE-SEM, Inspect F50, USA) with the operation voltage of 5 kV and scanning transmission electron microscopy (STEM) mode (JEOL JEM 2100 F 200 kV, equipped with a CEOS GmbH probe corrector) through high angle annual dark-field (HAADF) and bright-field (BF) imaging. The ultraviolet (UV)-visible spectra of samples were measured on a Shimadzu UV-2550 ultraviolet visible spectrophotometer.
3
Characterization of Carboxylated Graphene Oxide
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Transmission electron microscopic images were obtained on a JEM-2100F system (JEOL, Tokyo, Japan) at an operating voltage of 200 kV. Specimens were prepared for transmission electron microscopic imaging by spreading a drop of sample on copper grids, followed by evaporation under vacuum. The topography and thickness of carboxylated graphene oxide was investigated using an atomic force microscope in contact mode. X-ray diffraction was carried out with a SmartLab X-ray diffractometer (Rigaku, Tokyo, Japan; Cu Kα radiation λ=1.54056 Å) operating at 45 kV and 200 mA. Fourier transform infrared (FTIR) spectra were recorded on an Avatar 300 FTIR spectrometer (Thermo Nicolet Instrument Corporation, Waltham, MA, USA). Pristine graphene oxide or CTX-GO (2 mg) was mixed with KBr (98 mg) and then pressed into a pellet with minimum pressure. One hundred scans were accumulated, with a resolution of 4 cm−1 for each spectrum. Ultraviolet-visible spectra were collected on a UV2550 ultraviolet-visible spectrophotometer (Shimadzu, Kyoto, Japan). The fluorescence spectra were recorded using an F-2500 fluorescence spectrophotometer (Hitachi, Tokyo, Japan) equipped with a 1 cm quartz cell (excitation 485 nm, emission 585 nm).
4
Comprehensive Physicochemical Characterization
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UV−Vis absorption spectra of the powder samples were performed using a Shimadzu UV-2550 ultraviolet-visible spectrophotometer. PL spectra were measured using a Hitachi FL7000 fluorescence spectrophotometer instrument apparatus. The XRD pattern was collected using a XD-2×/M4600. The HR-TEM images were recorded using a JEOL-2010 electron microscope. FT-IR spectra were taken on a Nicolet Avatar 360 FT-IR spectrophotometer. X-ray photoelectron spectroscopy (XPS) experiments were performed using a Kratos AXIS Ultra DLD X-ray photoelectron spectrometer with a monochromatic Al Kα X-ray source. Raman spectra were obtained by a Renishaw via a microspectrometer with an excitation wavelength of 785 nm laser. Particle size analysis is achieved from a Malvern Nano 2SE laser particle size analyzer. NMR measurements were taken by AVANCEIII500 (Bruker). The absolute quantum yield and lifetime are respectively measured by a Hamamatsu C11347 and a Quantaurus Tau C11367.
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