Transmission Electron Microscopy (TEM) analysis was performed by using a Philips CM200 microscope operating at 200 kV and equipped with a LaB6 filament. Samples for TEM observations were prepared by depositing the polycorannulene film on a commercial TEM grid covered with a thin carbon film following the procedures as reported in the ESI.
Supra 40 field
The Supra 40 field is a high-resolution scanning electron microscope (SEM) developed by Zeiss. It is designed to provide detailed imaging and analysis of a wide range of samples at the nanoscale level. The Supra 40 field features a field emission electron gun, advanced optics, and a range of detectors to capture high-quality images and data.
Lab products found in correlation
4 protocols using supra 40 field
Scanning and Transmission Electron Microscopy
Transmission Electron Microscopy (TEM) analysis was performed by using a Philips CM200 microscope operating at 200 kV and equipped with a LaB6 filament. Samples for TEM observations were prepared by depositing the polycorannulene film on a commercial TEM grid covered with a thin carbon film following the procedures as reported in the ESI.
Scanning Electron Microscopy Analysis of Biofilm on Ti Disks
SEM Analysis of Mechanically Aged Specimens
Pulsed Laser Deposition of Carbon Foams
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