X-ray diffraction patterns were obtained with a Shimazu XRD-6100 diffractometer with Cu Kα radiation (40 kV, 30 mA) of wavelength 0.154 nm (Kyoto Japan). Scanning electron microscopy (SEM) images were collected on GeminiSEM 300 from Carl Zeiss Microscopy GmbH (Oberkochen, Germany). Energy-dispersive X-ray spectroscopy (EDS) was recorded on a Gemini SEM 300 scanning electron microscope (ZEISS; Oberkochen, Germany) at an accelerating voltage of 5 kV. Transmission electron microscopy (TEM) images were obtained using an H-800 electron microscope and an H-8010 scanning system (Hitachi, Japan). X-ray photoelectron spectroscopy (XPS) data were measured on Thermo Scientific K-Alpha with Al Kα radiation. The zeta potential was conducted on a Malvern Nano ZS90 Zetasizer Nano instrument (Worcestershire, UK). The ultraviolet–visible (UV–Vis) absorption spectra were received on a UV-2900 spectrophotometer.
Nano zs90 zetasizer nano instrument
Manufactured by Malvern Panalytical
Sourced in United Kingdom
The Nano ZS90 Zetasizer Nano instrument is a lab equipment designed to measure the size, size distribution, and zeta potential of particles and molecules in a sample. It utilizes dynamic light scattering (DLS) and electrophoretic light scattering (ELS) techniques to provide these measurements.
Automatically generated - may contain errors
Lab products found in correlation
H 800 electron microscope, by Hitachi (1 mentions)
Geminisem 300, by Zeiss (1 mentions)
S 4800 microscope, by Hitachi (1 mentions)
Ppd 850, by Horiba (1 mentions)
F 7000 spectrophotometer, by Hitachi (1 mentions)
Fluorolog 3 spectrofluorometer, by Horiba (1 mentions)
U 2900 spectrophotometer, by Hitachi (1 mentions)
2 protocols using nano zs90 zetasizer nano instrument
1
Characterization of Novel Materials
2
Comprehensive Materials Characterization Protocol
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UV-visible spectra were measured on Hitachi U-2900 spectrophotometer equipped with a 1 cm quartz cell. Phosphorescence spectra were measured on Hitachi F-7000 spectrophotometer equipped with a 1 cm quartz cell. Scanning electron microscopy (SEM) images were recorded on a field emission Hitachi S4800 microscope (Japan) equipped with a Oxford energy-dispersive X-ray (EDX) detector (UK) to perform the elemental mapping. X-ray diffraction (XRD) measurement was acquired on a Tongda TD-3500 X-ray powder diffractometer (Liaoning, China) with Cu Kα radiation. Phosphorescence lifetime was measured on a Fluorolog-3 spectrofluorometer (Horiba JobinYvon) with a Spectra LED (280 nm, S-280, Horiba Scientific) as the excitation source and a picosecond photon detection module (PPD-850, Horiba Scientific) as the detector. The Particle size were measured on a Malvern Nano ZS90 Zetasizer Nano instrument (Worcestershire, UK).
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