Smart apex 2 diffractometer
The SMART APEX II is a single-crystal X-ray diffractometer manufactured by Bruker. It is designed for the collection and analysis of X-ray diffraction data from single-crystal samples. The instrument features advanced optics, high-precision goniometry, and state-of-the-art detectors to provide accurate and reliable data for a wide range of crystallographic applications.
Lab products found in correlation
20 protocols using smart apex 2 diffractometer
Single-Crystal X-ray Diffraction of Compounds 1-4
Single Crystal X-ray Diffraction Analysis
Single-Crystal X-Ray Diffraction Analysis
Single-crystal X-ray Diffraction Analysis
X-ray Diffraction Structural Analysis
all complexes were collected on single crystals mounted on a glass
fiber using Paratone oil. Data was acquired with a Bruker SMART APEX
II diffractometer equipped with a charge-coupled device detector cooled
to 88 K and using Mo Kα radiation (λ = 0.71073 Å).
The SMART program package was used to determine unit-cell parameters
and for data collection. Raw frame data were processed using SAINT
and SADABS to yield the reflection data file. Subsequent calculations
were carried out using the SHELXTL program suite. The structures were
solved by direct methods and refined on F2 using full-matrix least-squares techniques. Analytical scattering
factors for neutral atoms were used throughout the analyses. Hydrogen
atoms were generated at calculated positions and refined using a riding
model. ORTEPs were generated using ORTEP-3 for Windows.
High-Pressure Single-Crystal Diffraction of 1
X-ray Crystallographic Structural Analysis
collect all data. The APEX28 program package
was used to determine the unit-cell parameters and for data collections.
The raw frame data was processed using SAINT9 and SADABS10 to yield the reflection
data file. Subsequent calculations were carried out using the SHELXTL11 program. Structures were solved by direct methods
and refined on F2 by full-matrix least-squares
techniques. Analytical scattering factors12 for neutral atoms were used throughout the analysis. Hydrogen atoms
were included using a riding model. Hydrogen atoms H(1) of NMe4[FeIIITST(OH)] and H(1) and H(2) NMe4[FeIIMST(OH2)] were located from a difference-Fourier
map and refined (x, y, z, and Uiso). Data sets of both NMe4[FeIIITST(OH)] and NMe4[FeIII–O–MST] contained several high residuals in the final
difference-Fourier map. It was not possible to determine the nature
of the residuals, although it is probable that a pentane or DCM solvent
molecule was present. The SQUEEZE routine in the PLATON13 program package was used to account for the
electrons in the solvent-accessible voids. In the NMe4[FeIIMST(OH2)] structure, the (NMe4)+ counterion was disordered. Carbon atoms C(35)–C(40)
were included using multiple components with partial site-occupancy
factors.
Comprehensive Characterization of Novel Materials
Single Crystal Diffraction Analysis of Compound 1
Molecular Structure Determination by XRD
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