Axis supra
The Axis Supra is a high-performance X-ray photoelectron spectroscopy (XPS) system manufactured by Shimadzu. It is designed to provide accurate surface analysis and chemical composition data for a wide range of materials.
Lab products found in correlation
145 protocols using axis supra
Synthesis and Characterization of CDs
Comprehensive Characterization of PLA Films
(GY) was determined gravimetrically using
PLA films, respectively.
FTIR measurements were carried out
using a Bruker Tensor 27 spectrometer within the wavenumber range
of 500–4000 cm–1. A total of 32 scans/sample
were taken, with a resolution of 4 cm–1. The surface
morphology of PLA films was observed by a SEM (JEOL JSM-7500F, Japan)
and an energy-dispersive X-ray spectrometer (OXFORD INCAx-sight).
The sample was coated with platinum before observation. The instrument
was operated at an accelerating voltage of 5 kV and 10 μA. The
chemical composition of the surface of PLA films was semiquantitatively
examined by X-ray photoelectron spectrometry (Kratos AXIS Supra).
Thermogravimetric analysis (TGA) of the samples was carried out with
a TGA Q-500 series analyzer (TA Instruments) with a temperature range
of 35–500 °C. The heating rate was 10 K/min with a continuous
flow of nitrogen at 50 mL/min.
To determine the surface properties
of samples, the water contact
angles were measured on an OCA 20 contact-angle system (Dataphysics,
Stuttgart, Germany) at 25 °C. The average contact angle values
were calculated by measuring at least five different positions of
each film. The antibacterial activities of the PLA films against E. coli and S. aureus were evaluated according to the standard procedure (ISO22196-2011).
X-ray Photoelectron Spectroscopy of ECM-Coated Surfaces
XPS Measurements of PLGA Surfaces
with an AXIS Supra by Kratos Analytical Inc. using monochromatized
Al Ka radiation (hv = 1486.6 eV, 225 W) as an X-ray
source with a base pressure of 10–9 Torr. Survey
scan spectra were acquired using a pass energy of 160 eV and a 1 eV
step size. Narrow region scans were acquired using a pass energy of
40 eV and a 0.1 eV step size. The hybrid lens mode was used in both
cases. The analyzed area of all XPS spectra was 300 × 700 μm2. A charge neutralizer was used throughout as the samples
were mounted such that they were electrically isolated from the sample
bar. All spectra were calibrated by C 1s (284.8 eV). This surface
was sputtered using the Ar-GCIS beam (n = 1000, 10
keV beam energy); the sputtering area is 3 × 3 mm2. The etch rate was ∼30 nm/min for poly(lactic-co-glycolic
acid (PLGA, standard).
Characterization of Amorphous Vanadium Oxide Thin Films
XPS Analysis of Zirconia Surface
Characterization of Synthesized Carbon Nanomaterials
Comprehensive Chemical Characterization
X-ray Photoelectron Spectroscopy Characterization
Multimodal Characterization of Nanostructured Materials
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!